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Researcher · Institut d'électronique de microélectronique et de nanotechnologie · France

X. Wallart

X. Wallart publishes mostly in Atomic and Molecular Physics, and Optics and Biomedical Engineering, on topics such as Surface and Thin Film Phenomena, Nanowire Synthesis and Applications and Semiconductor Quantum Structures and Devices.

OpenAlex
World rank
#508,020
of 1,633,909 ranked researchers
Rank in France
#30,639
of 96,116
Works
17
Citations
37
Citations per work
2.2

What does X. Wallart research?

Atomic and Molecular Physics, and Optics: 83.3%Biomedical Engineering: 16.7%83%top field
Atomic and Molecular Physics, and Optics83.3%Biomedical Engineering16.7%

Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.

  1. 1Atomic and Molecular Physics, and Optics83% of their works
  2. 2Biomedical Engineering17% of their works

Research topics

Which keywords describe X. Wallart's research?

The keywords of their largest research topics: Quantum Size Effects, Semiconductor, Superconductivity, Atomic Force Microscopy, Force Spectroscopy, Nanosensors, Nanowire and Quantum Dots.

Size is their works in the topics tagged with each word, from their 5 largest topics. Each links to the topic it comes from most.

All 11 words, with their numbers
  1. Quantum Size Effects21 topic
  2. Semiconductor22 topics
  3. Superconductivity21 topic
  4. Atomic Force Microscopy11 topic
  5. Force Spectroscopy11 topic
  6. Nanosensors11 topic
  7. Nanowire11 topic
  8. Quantum Dots11 topic
  9. Semiconductor Quantum Dots11 topic
  10. Single-Photon Source11 topic
  11. Spintronics11 topic

Where does X. Wallart work?

X. Wallart's main affiliation in the publication record is Institut d'électronique de microélectronique et de nanotechnologie, France.

How many publications and citations does X. Wallart have?

Science Explorer counts 17 works and 37 citations for X. Wallart, ranking #508,020 of 1,633,909 researchers worldwide on the composite score.

Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.

Other researchers named X. Wallart

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