Institution · Accretech (Japan)
Most cited papers from Accretech (Japan)
What are the most cited papers from Accretech (Japan)?
The most cited paper from Accretech (Japan) is "A relation between calculated human body exergy consumption rate and subjectively assessed thermal sensation" (Angela Simone, Jakub Kolařík, Toshiya Iwamatsu et al., 2010), with 88 citations. Next come "Sinusoidal phase modulating interferometer using the integrating-bucket method" (71) and "A laser tracking robot-performance calibration system using ball-seated bearing mechanisms and a spherically shaped cat’s-eye retroreflector" (52).
Showing 50 of 66 papers. Every paper is listed.
| # | Paper | ||
|---|---|---|---|
| 1 | A relation between calculated human body exergy consumption rate and subjectively assessed thermal sensation Angela Simone, Jakub Kolařík, Toshiya Iwamatsu et al. · Energy and Buildings | 17 Sep 2010 | 88 |
| 2 | Sinusoidal phase modulating interferometer using the integrating-bucket method Osami Sasaki, Hirokazu Okazaki, Makoto Sakai · Applied Optics | 15 Mar 1987 | 71 |
| 3 | A laser tracking robot-performance calibration system using ball-seated bearing mechanisms and a spherically shaped cat’s-eye retroreflector Osamu Nakamura, Mitsuo Goto, Kouji Toyoda et al. · Review of Scientific Instruments | Apr 1994 | 52 |
| 4 | Development of a Coordinate Measuring System with Tracking Laser Interferometers Osamu Nakamura, Mitsuo Goto, Kouji Toyoda et al. · CIRP Annals | 1991 | 35 |
| 5 | Development Of A High Resolution Sensor For Surface Roughness Kimiyuki Mitsui, Makoto Sakai, Yoshitsugu KIZUKA · Optical Engineering | Jun 1988 | 30 |
| 6 | Ultrafine ductile-mode dicing technology for SiC substrate with metal film using PCD blade Takashi Fujita, Yasuo Izumi, Junji Watanabe · Journal of Advanced Mechanical Design Systems and Manufacturing | 2019 | 16 |
| 7 | Removal of mite allergens from blankets: Comparison of dry cleaning and hot water washing Mika Watanabe, Masahiro Sakaguchi, Sakae Inouye et al. · Journal of Allergy and Clinical Immunology | Dec 1995 | 15 |
| 8 | Pressure Distribution Control on Surface Conformable Polishing in Chemical Mechanical Planarization Takashi Fujita, Junji Watanabe · ECS Journal of Solid State Science and Technology | 2015 | 13 |
| 9 | Development of endpoint detection using optical transmittance and magnetic permeability based on skin effect in chemical mechanical planarization Takashi Fujita, Keita Kitade · Precision Engineering | 18 Mar 2019 | 12 |
| 10 | Simultaneous Five-axis Motion for Identifying Geometric Deviations Through Simulation in Machining Centers with a Double Pivot Head Muditha Dassanayake, Ken Yamamoto, Masaomi Tsutsumi et al. · Journal of Advanced Mechanical Design Systems and Manufacturing | 2008 | 12 |
| 11 | Development of Original End Point Detection System Utilizing Eddy Current Variation Due to Skin Effect in Chemical Mechanical Polishing Takashi Fujita, Keita Kitade, Toshiyuki Yokoyama · Japanese Journal of Applied Physics | May 2011 | 12 |
| 12 | Ultra-fine grooving technology with high aspect ratio for cemented carbide by PCD (poly-crystalline diamond) blade Takashi Fujita, Yasuo Izumi, Junji Watanabe · Precision Engineering | 30 Oct 2018 | 11 |
| 13 | Integration of Damage-less Probe Cards Using Nano-TSV Technology for Microbumped Wafer Testing Takafumi Fukushima, Shinichi Sakuyama, Masatomo Takahashi et al. | Oct 2021 | 10 |
| 14 | RECOGNITION OF DAMAGED BUILDING USING DEEP LEARNING BASED ON AERIAL AND LOCAL PHOTOS TAKEN AFTER THE 1995 KOBE EARTHQUAKE Yuu ISHII, M. Matsuoka, Norio Maki et al. · Journal of Structural and Construction Engineering (Transactions of AIJ) | 2018 | 10 |
| 15 | Verification of Operation Principle on End Point Detection by Skin Effect in Chemical Mechanical Planarization Takashi Fujita, Keita Kitade · ECS Journal of Solid State Science and Technology | 2017 | 10 |
| 16 | The mid-infrared imager, spectrometer, coronagraph (MISC) for the Origins Space telescope (OST) Itsuki Sakon, Thomas L. Roellig, Kimberly Ennico-Smith et al. · Space Telescopes and Instrumentation 2018: Optical, Infrared, and Millimeter Wave | 10 Jul 2018 | 8 |
| 17 | Novel retaining ring to reduce CMP edge exclusion M.M. Touzov, Tsutomu Fujita, Toshiroh Karaki Doy | 13 Nov 2002 | 8 |
| 18 | Thickness measurement of photoresist on water by surface measuring instrument. Minoru NUMOTO · Journal of The Surface Finishing Society of Japan | 1989 | 7 |
| 19 | Two-wavelength interferometer based on sinusoidal phase modulation with an acetylene stabilized laser and a second harmonic generation Yoshiyuki Kawata, Kyohei Hyashi, Tomohiro Aoto · Optics Express | 9 Jun 2015 | 7 |
| 20 | Performances by the electron optical system of low energy electron beam proximity projection lithography tool with a large scanning field H. Kasahara, Tsutomu Shishido, Norihiko Samoto et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena | Nov 2005 | 7 |
| 21 | Smart Control of Axial Flow Pump Performance by Means of Counter-Rotation Toshiaki Kanemoto, Shingo Kimura, Shin Oba et al. · JSME International Journal Series B | 2002 | 7 |
| 22 | Improved Machinability of High Hardened Die Steel by Using Pulsed Laser Surface Treatment Kamonpong Jamkamon, Keiji Yamada, Takuya INOUE et al. · International Journal of Precision Engineering and Manufacturing | 29 Jun 2019 | 6 |
| 23 | Slurry Supply Mechanism Utilizing Capillary Effect in Chemical Mechanical Planarization Takashi Fujita, Junji Watanabe · ECS Journal of Solid State Science and Technology | 2019 | 6 |
| 24 | Fine Adjustment of Pressure Distribution on Surface Conformable Polishing in Chemical Mechanical Planarization Takashi Fujita, Junji Watanabe · ECS Journal of Solid State Science and Technology | 2017 | 6 |
| 25 | Design of FIR filter with small number of coefficients based on compactly supported fluency sampling function K. Nakamura, Kazuo Toraichi, Kazuki Katagishi et al. | 3 Jun 2004 | 5 |
| 26 | Development of Highly Accurate and Robust Roundness Measuring Instrument Hideki Morii, Hikaru Masuta, Hiroaki Kimura et al. · Journal of Physics Conference Series | Aug 2018 | 4 |
| 27 | Surface Conformable Polishing Mechanism for Chemical Mechanical Polishing Takashi Fujita, Junji Watanabe · Journal of The Electrochemical Society | 2009 | 4 |
| 28 | Present Status of Exposure Tool Development for Low Energy Electron-beam Proximity Projection Lithography. Akihiro Endo, Akira Higuchi, H. Kasahara et al. · Journal of Photopolymer Science and Technology | 2002 | 4 |
| 29 | An Approach to Estimate the Inherent Deviations by Means of Simultaneous Five-axis Motion K. M. Muditha Dassanayake, Masaomi Tsutsumi, Kenji HIGASHIYAMA et al. · Proceedings of International Conference on Leading Edge Manufacturing in 21st century LEM21 | 2007 | 3 |
| 30 | EPL stencil mask defect inspection system using transmission electron beam Jiro Yamamoto, Teruo Iwasaki, Masaki Yamabe et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 13 Jun 2003 | 3 |
| 31 | Mechanisms of Local Planarization Improvement Using Solo Pad in Chemical Mechanical Polishing Akira Isobe, Toshiyuki Yokoyama, Takashi Komiyama et al. · Japanese Journal of Applied Physics | 13 Nov 2013 | 3 |
| 32 | Completion of the β tool and the recent progress of low energy e-beam proximity projection lithography Akihiro Endo, Akira Higuchi, Hiroshi Nozue et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena | 2003 | 3 |
| 33 | Stencil mask defect inspection system and advanced application Satoru Maruyama, Nakahiro Harada, Jiro Yamamoto et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 20 Aug 2004 | 3 |
| 34 | Disktron accelerator M. Shoji, Kohske Takahashi, K. Hanamoto et al. · Review of Scientific Instruments | Sep 1993 | 2 |
| 35 | A Methodology for Identifying Inherent Deviations in Universal Spindle Head Type Multi-Axis Machines by Simultaneous Five-Axis Control Motions K. M. Muditha Dassanayake, Ken Yamamot, Masaomi Tsutsumi | 2006 | 2 |
| 36 | Verification of the system of defect inspection on patterned wafers using sub-200nm wavelength light Tomoyuki Takahashi, Yoko Miyazaki, Toshihiko P. Tanaka et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 10 Mar 2006 | 2 |
| 37 | Effectiveness Evaluation of Novel Pad Dressing Method by Flexible Fiber Dresser - Tool Life Evaluation of Flexible Fiber Dresser Michio Uneda, Naoki Takahashi, Yutaro Arai et al. · Advanced materials research | Sep 2014 | 2 |
| 38 | LEEPL production tool: EBPrinter LEEPL-3000 Norihiko Samoto, Hideaki Takano, Akihiro Endo et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 20 May 2004 | 2 |
| 39 | Control of edge polishing profile with air float carrier Takashi Fujita, M.M. Touzov, S. Michiya et al. | 13 Nov 2002 | 2 |
| 40 | Proposing a New Evaluation Method in Si Wafer Rotary Grinding Jumpei Kusuyama, Bima Kawase, Yohichi NAKAO et al. | 3 Sep 2020 | 1 |
| 41 | Development of Flexible Fiber Conditioner in Chemical Mechanical Planarization Takashi Fujita, Toshiro Doi, Yutaro Arai · ECS Journal of Solid State Science and Technology | 2019 | 1 |
| 42 | Improvement of the Position Monitor using White Light Interferometer for Measuring Precise Movement of Compact ERL Superconducting Cavities in Cryomodule Hiroshi Sakai, Tomohiro Aoto, Enrico Cenni et al. · Institutional Repositories DataBase (IRDB) | 2014 | 1 |
| 43 | Micro Fabrication Technology of Ferroelectric Film and its Application to MEMS Masaaki Ichiki, Takeshi Kobayashi, Zhan Jie Wang et al. | 23 Jan 2015 | 1 |
| 44 | Calibration of industrial robots by using tracking laser interferometers Osamu Nakamura, Mitsuo Goto, Kazuhiro Toyoda et al. · Optics & Laser Technology | 1994 | 1 |
| 45 | A Fundamental Study on the Simple Eyes of Industrial Robots Applying the Correlation Technique Kozo MATSUSHIMA, Hidehiro KATAGIRI · Transactions of the Society of Instrument and Control Engineers | 1972 | 1 |
| 46 | Improved Image Resolution for Wafer Inspection Tool Using Sub-200-nm Wavelength Light Optical System Tomoyuki Takahashi, Yoko Miyazaki, Naoya Takeuchi et al. · Japanese Journal of Applied Physics | Jun 2006 | 1 |
| 47 | New Model of Defect Formation Caused by Retainer Ring in Chemical Mechanical Polishing Akira Isobe, Takashi Komiyama, Syuhei KUROKAWA · Japanese Journal of Applied Physics | 14 Nov 2013 | 1 |
| 48 | Measurement technique for depth profiling in time-domain low-coherence interferometer Ribun Onodera, Shuhei Oshida, Yukihiro Ishii · Optical Review | May 2010 | 1 |
| 49 | Defect inspection strategy of LEEPL masks Isao Yonekura, Shinji Kunitani, Takashi Susa et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 28 Jun 2005 | 1 |
| 50 | LEEPL (low-energy electron beam proximity-projection lithography) overlay status Norifumi S. Nakajima, Takuji Atarashi, Hiroyuki Sakai et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 20 May 2004 | 1 |
Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.