Institution · BlazeTech (United States)
Most cited papers from BlazeTech (United States)
What are the most cited papers from BlazeTech (United States)?
The most cited paper from BlazeTech (United States) is "Layout decomposition for double patterning lithography" (Andrew B. Kahng, Chul‐Hong Park, Xu Xu et al., 2008), with 92 citations. Next come "Failure mode maps for composite sandwich panels subjected to air blast loading" (79) and "Fast dual graph-based hotspot detection" (56).
Showing 50 of 57 papers. Every paper is listed.
| # | Paper | ||
|---|---|---|---|
| 1 | Layout decomposition for double patterning lithography Andrew B. Kahng, Chul‐Hong Park, Xu Xu et al. | Nov 2008 | 92 |
| 2 | Failure mode maps for composite sandwich panels subjected to air blast loading Erik W. Andrews, Najem Moussa · International Journal of Impact Engineering | 14 Sep 2008 | 79 |
| 3 | Fast dual graph-based hotspot detection Andrew B. Kahng, Chul‐Hong Park, Xu Xu · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 6 Oct 2006 | 56 |
| 4 | Modeling of non-uniform device geometries for post-lithography circuit analysis Puneet Gupta, Andrew B. Kahng, Young‐Min Kim et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 10 Mar 2006 | 46 |
| 5 | Dragon2006 Taraneh Taghavi, Xiaojian Yang, Bo-Kyung Choi et al. | 9 Apr 2006 | 35 |
| 6 | Wafer Topography-Aware Optical Proximity Correction Puneet Gupta, Andrew B. Kahng, Chul‐Hong Park et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | Dec 2006 | 33 |
| 7 | Lithography simulation-based full-chip design analyses Puneet Gupta, Andrew B. Kahng, Sam Nakagawa et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 10 Mar 2006 | 31 |
| 8 | Design of integrated-circuit interconnects with accurate modeling of chemical-mechanical planarization Lei He, Andrew B. Kahng, King Ho Tam et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 5 May 2005 | 27 |
| 9 | Fast Dual-Graph-Based Hotspot Filtering Andrew B. Kahng, Chul‐Hong Park, Xu Xu · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 20 Aug 2008 | 23 |
| 10 | Performance-driven optical proximity correction for mask cost reduction Andrew B. Kahng · Journal of Micro/Nanolithography MEMS and MOEMS | Jul 2007 | 20 |
| 11 | Simultaneous buffer insertion and wire sizing considering systematic CMP variation and random leff variation Lei He, Andrew B. Kahng, King Ho Tam et al. | 3 Apr 2005 | 19 |
| 12 | Efficient design and analysis of robust power distribution meshes Puneet Gupta, Andrew B. Kahng | 2006 | 18 |
| 13 | A Practical Transistor-Level Dual Threshold Voltage Assignment Methodology Puneet Gupta, Andrew B. Kahng, Puneet Sharma | 31 Mar 2005 | 18 |
| 14 | Fast and Efficient Bright-Field AAPSM Conflict Detection and Correction Charles Chiang, Andrew B. Kahng, Subarnarekha Sinha et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 2007 | 17 |
| 15 | Detailed placement for improved depth of focus and CD control P. Gupta, A.B. Kahngt, Chul‐Hong Park · Proceedings of the ASP-DAC 2005. Asia and South Pacific Design Automation Conference, 2005. | 19 Jul 2005 | 16 |
| 16 | Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence Vineeth Veetil, Dennis Sylvester, David T. Blaauw et al. | 26 Jul 2009 | 15 |
| 17 | Self-compensating design for focus variation Puneet Gupta, Andrew B. Kahng, Youngmin Kim et al. | 2005 | 13 |
| 18 | Wafer topography-aware optical proximity correction for better DOF margin and CD control Puneet Gupta, Andrew B. Kahng, Chul‐Hong Park et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 28 Jun 2005 | 11 |
| 19 | Investigation of diffusion rounding for post-lithography analysis Puneet Gupta, Andrew B. Kahng, Young‐Min Kim et al. | 2008 | 10 |
| 20 | Modeling edge placement error distribution in standard cell library Puneet Gupta, Andrew B. Kahng, Swamy V. Muddu et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 10 Mar 2006 | 10 |
| 21 | Auxiliary pattern for cell-based OPC Andrew B. Kahng, Chul‐Hong Park · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 6 Oct 2006 | 10 |
| 22 | Fill for Shallow Trench Isolation CMP Andrew B. Kahng, Puneet Sharma, Alex Zelikovsky · Digest of technical papers/Digest of technical papers - IEEE/ACM International Conference on Computer-Aided Design | Nov 2006 | 9 |
| 23 | Compressible area fill synthesis Yu Chen, Andrew B. Kahng, Gabriel Robins et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 27 Jul 2005 | 9 |
| 24 | Shaping gate channels for improved devices Puneet Gupta, Andrew B. Kahng, Youngmin Kim et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 14 Mar 2008 | 8 |
| 25 | Defocus-aware leakage estimation and control A.B. Kahng, Shashank V. Muddu, P. Sharma | 2005 | 7 |
| 26 | Prediction of Toxic Emissions from Chemical Fire and Explosion Najem Moussa, Venkat Devarakonda · Fire Safety Science | 2014 | 7 |
| 27 | Self-Compensating Design for Reduction of Timing and Leakage Sensitivity to Systematic Pattern-Dependent Variation Puneet Gupta, Andrew B. Kahng, Young‐Min Kim et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 29 Aug 2007 | 6 |
| 28 | Manufacturing-aware design methodology for assist feature correctness Puneet Gupta, Andrew B. Kahng, Chul‐Hong Park · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 5 May 2005 | 6 |
| 29 | Datacom applications for new VCSEL technologies Eric B. Grann, Ken Herrity, Brian C. Peters et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | May 2000 | 6 |
| 30 | Modeling OPC complexity for design for manufacturability Puneet Gupta, Andrew B. Kahng, Swamy V. Muddu et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 21 Oct 2005 | 6 |
| 31 | Kinetics of Free Chlorine Decay in Water Distribution Networks Venkat Devarakonda, Najem Moussa, Vicki L. VanBlaricum et al. | 14 May 2010 | 6 |
| 32 | The Great Health Paradox: A Call for Increasing Investment in Public Health Dan German Blazer, Christopher C. Colenda, William B. Applegate et al. · Academic Medicine | 11 Jan 2022 | 5 |
| 33 | Wire Retiming Problem With Net Topology Optimization Dennis K. Y. Tong, Evangeline F. Y. Young, Chris Chong-Nuen Chu et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 29 Aug 2007 | 5 |
| 34 | Interaction and balance of mask write time and design RET strategies Yuan Zhang, Rick Gray, O.S. Nakagawa et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 28 Jun 2005 | 5 |
| 35 | Enhanced Design Flow and Optimizations for Multiproject Wafers Andrew B. Kahng, Ion Măndoiu, Xu Xu et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 23 Jan 2007 | 4 |
| 36 | Model calibration for optical lithography via semidefinite programming Mehrdad Nouralishahi, Clive Wu, Lieven Vandenberghe · Optimization and Engineering | 9 Nov 2007 | 4 |
| 37 | Line-end shortening is not always a failure Puneet Gupta, Andrew B. Kahng, Young‐Min Kim et al. · Proceedings - ACM IEEE Design Automation Conference | 2007 | 3 |
| 38 | Resonance-based light scattering techniques for investigation of microdroplet processes Asit Kumar Ray, Venkat Devarakonda, Zhiqiang Gao · Faraday Discussions | 30 Jul 2007 | 3 |
| 39 | Enhanced resist and etch CD control by design perturbation Puneet Gupta, Andrew B. Kahng, Chul‐Hong Park · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 21 Oct 2005 | 3 |
| 40 | Polarized light scattering technique for morphological characterization of waterborne pathogens Venkat Devarakonda, Sivakumar Manickavasagam · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 21 Apr 2009 | 3 |
| 41 | Standard cell library optimization for leakage reduction Sagar P. Shah, Puneet Gupta, Andrew B. Kahng · Proceedings - ACM IEEE Design Automation Conference | 2006 | 2 |
| 42 | Zero-Change Netlist Transformations: A New Technique for Placement Benchmarking Andrew B. Kahng, Sherief Reda · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | Dec 2006 | 2 |
| 43 | CMP Fill Synthesis: A Survey of Recent Studies Andrew B. Kahng, Kambiz Samadi · Auerbach Publications eBooks | 12 Nov 2008 | 1 |
| 44 | DFM: where's the proof of value? Jason P. Brandenburg, Raúl Camposano, M. Gianfagna et al. · Proceedings - ACM IEEE Design Automation Conference | 2006 | 1 |
| 45 | Data Loss Protection Ken Perkins · Elsevier eBooks | 2013 | 1 |
| 46 | Hot-surface ignition and fire-suppression tests in an aircraft engine bay W. Rockwell Geyer, Najem Moussa · 27th Joint Propulsion Conference | 24 Jun 1991 | 1 |
| 47 | CWDM for very-short-reach and optical-backplane interconnections Michael J. Laha · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 6 Jun 2002 | 1 |
| 48 | Transport element method for axisymmetric variable-density flow and its application to the spread and dispersion of a dense cloud Xiaoming J. Zhang, Ahmed F. Ghoniem · ESAIM Proceedings | 1996 | 1 |
| 49 | Prediction of contaminant fate and transport in potable water systems using H 2 OFate Venkat Devarakonda, Sivakumar Manickavasagam, Vicki L. VanBlaricum et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 21 Apr 2009 | 1 |
| 50 | Intelligent fill pattern and extraction methodology for sensitive RF/analog or SoC products Artur P. Balasinski, Joseph Cetin, Andrew B. Kahng · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 16 Mar 2007 | 1 |
Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.