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Most cited papers from Cascade Microtech (United States)

What are the most cited papers from Cascade Microtech (United States)?

The most cited paper from Cascade Microtech (United States) is "Comparison of On-Wafer Calibrations" (Dylan Forrest Williams, Roger B. Marks, Andrew Davidson, 1991), with 229 citations. Next come "LRM and LRRM Calibrations with Automatic Determination of Load Inductance" (197) and "Accuracy improvements in microwave noise parameter measurements" (140).

Showing 50 of 60 papers. Every paper with more than 7 citations is listed.

Most cited papers, sortable by citations and release date
#Paper
1 Comparison of On-Wafer Calibrations Dylan Forrest Williams, Roger B. Marks, Andrew Davidson Conference paper Dec 1991 229
2 LRM and LRRM Calibrations with Automatic Determination of Load Inductance Andrew Davidson, Keith E. Jones, E.W. Strid Conference paper Nov 1990 197
3 Accuracy improvements in microwave noise parameter measurements Andrew Davidson, B.W. Leake, E.W. Strid · IEEE Transactions on Microwave Theory and Techniques 1989 140
4 Terahertz CMOS Frequency Generator Using Linear Superposition Technique Daquan Huang, Tim R. LaRocca, Mau-Chung Frank Chang et al. · IEEE Journal of Solid-State Circuits Dec 2008 139
5 Characterization of InGaAs/AlGaAs pseudomorphic modulation-doped field-effect transistors A. Ketterson, William Ted Masselink, J.S. Gedymin et al. · IEEE Transactions on Electron Devices May 1986 135
6 Multimode TRL. A new concept in microwave measurements: theory and experimental verification C. Seguinot, P. Kennis, Jean-François Legier et al. · IEEE Transactions on Microwave Theory and Techniques May 1998 121
7 The Development and Characterization of an In Vitro Model of Psoriasis Carol L. Barker, Mark T. McHale, Angela Gillies et al. · Journal of Investigative Dermatology Open access 13 Oct 2004 104
8 An enhanced Line-Reflect-Reflect-Match calibration Leonard A. Hayden Conference paper Jun 2006 73
9 Achieving greater on-wafer S-parameter accuracy with the LRM calibration technique Andrew Davidson, E.W. Strid, Keith E. Jones Conference paper Nov 1989 71
10 Proliferation?differentiation relationships in the expression of heparin-binding epidermal growth factor-related factors and erbB receptors by normal and psoriatic human keratinocytes Michael W. Piepkorn, Holly Predd, Robert Underwood et al. · Archives of Dermatological Research Jul 2003 70
11 Amphiregulin Causes Functional Downregulation of Adherens Junctions in Psoriasis Eun‐Kyung Chung, Paul W. Cook, Charles A. Parkos et al. · Journal of Investigative Dermatology Open access Jun 2005 66
12 A dc and microwave comparison of GaAs MESFET's on GaAs and Si substrates R. Fischer, Navin Chand, William Kopp et al. · IEEE Transactions on Electron Devices Feb 1986 64
13 Evaluation of TSV and micro-bump probing for wide I/O testing Ken Robert Smith, Peter Hanaway, Mike Jolley et al. Conference paper Sep 2011 57
14 Microwave performance of InAlAs/InGaAs/InP MODFET's C. K. Peng, M.I. Aksun, A. Ketterson et al. · IEEE Electron Device Letters 1987 53
15 The cardiac sodium channel mRNA is expressed in the developing and adult rat and human brain Laurel M. Donahue, Penelope W. Coates, Vaughan H. Lee et al. · Brain Research Dec 2000 52
16 An SOLR calibration for accurate measurement of orthogonal on-wafer DUTs S. Basu, Leonard A. Hayden Conference paper 22 Nov 2002 51
17 Polarization control for coherent fiber-optic systems using nematic liquid crystals SCOTT H. RUMBAUGH, Michael D. Jones, Lee W. Casperson · Journal of Lightwave Technology Mar 1990 45
18 Novel transition between different configurations of planar transmission lines Amr M. E. Safwat, Kawthar A. Zaki, W.B. Johnson et al. · IEEE Microwave and Wireless Components Letters Apr 2002 45
19 Sensitivity Analysis of Calibration Standards for SOLT and LRRM Amr M. E. Safwat, Leonard A. Hayden Conference paper Nov 2001 40
20 Surface Wave Phenomenon in Wafer Probing Environments Edward M. Godshalk Conference paper Dec 1992 39
21 GHz on-silicon-wafer probing calibration methods Arthur Fraser, Reed Gleason, E.W. Strid Conference paper 6 Jan 2003 38
22 Broadband Active Balun Using Combined Cascode–Cascade Configuration Kooho Jung, William R. Eisenstadt, Robert M. Fox et al. · IEEE Transactions on Microwave Theory and Techniques Aug 2008 37
23 Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface Erik Jan Marinissen, Bart De Wachter, Ken Robert Smith et al. Conference paper Oct 2014 31
24 Amphiregulin Overexpression Results in Rapidly Growing Keratinocytic Tumors Steven D. Billings, Michael D. Southall, Tao Li et al. · American Journal Of Pathology Open access Dec 2003 30
25 A V-band wafer probe using ridge-trough waveguide Edward M. Godshalk · IEEE Transactions on Microwave Theory and Techniques 1991 28
26 State-of-the-art and future perspectives in calibration and de-embedding techniques for characterization of advanced SiGe HBTs featuring sub-THz fT/fMAX N. Derrier, Andrej Rumiantsev, D. Céli Conference paper Sep 2012 25
27 A passive portable microfluidic blood–plasma separator for simultaneous determination of direct and indirect ABO/Rh blood typing Shadi Karimi, Pouya Mehrdel, Josep Farré‐Lladós et al. · Lab on a Chip Open access 2019 24
28 Sensitivity analysis of calibration standards for fixed probe spacing on-wafer calibration techniques [vector network analyzers] Amr M. E. Safwat, Leonard A. Hayden Conference paper 25 Jun 2003 22
29 Test-station for flexible semi-automatic wafer-level silicon photonics testing Jeroen De Coster, Peter De Heyn, Marianna Pantouvaki et al. Conference paper May 2016 20
30 Normal Human Fibroblasts Produce Membrane-Bound and Soluble Isoforms of FGFR-1 Leslie Root, Gary D. Shipley · Molecular Cell Biology Research Communications Feb 2000 20
31 A New Characterization and Calibration Method for 3-dB-Coupled On-Wafer Measurements Kooho Jung, Leonard A. Hayden, O.D. Crisalle et al. · IEEE Transactions on Microwave Theory and Techniques May 2008 18
32 Internal-node waveform analysis of MMIC power amplifiers Ce-Jun Wei, Y.A. Tkachenko, James C. M. Hwang et al. · IEEE Transactions on Microwave Theory and Techniques 1995 18
33 Validation of on-wafer vector network analyzer systems J. Randy Fenton Conference paper Nov 2006 16
34 A W-band wafer probe Edward M. Godshalk Conference paper 31 Dec 2002 16
35 An Air Coplanar Wafer Probe Edward M. Godshalk, Jeremy Burr, Jeff Williams Conference paper May 1994 16
36 A 2 to 8 GHz Leveling Loop Using a GaAs MMIC Active Splitter and Attenuator G.S. Barta, Keith E. Jones, G.C. Herrick et al. Conference paper 1986 15
37 VNA error model conversion for N-port calibration comparison Leonard A. Hayden Conference paper Jun 2007 15
38 Stability analysis for large signal design of a microwave frequency doubler S. Basu, Stephen A. Maas, T. Itoh · IEEE Transactions on Microwave Theory and Techniques 1995 15
39 Comparing the Accuracy and Repeatability of On-Wafer Calibration Techniques to 110GHz Anthony Lord Conference paper Oct 1999 15
40 Buried-Channel GaAs MESFETs with Improved Small-Signal Characteristics Paul C. Canfield, D.J. Allstot, J. Medinger et al. Conference paper Oct 1987 14
41 RFCMOS Unit Width Optimization Technique Ah Fatt Tong, Wei Meng Lim, Choon Beng Sia et al. · IEEE Transactions on Microwave Theory and Techniques Sep 2007 14
42 Marchand Balun Embedded Probe Kooho Jung, Richard L. Campbell, Peter Hanaway et al. · IEEE Transactions on Microwave Theory and Techniques May 2008 14
43 DC and microwave characteristics of an In 0.53 Ga 0.47 As/In 0.52 Al 0.48 As modulation-doped quasi-MISFET K. Seo, P. Bhattacharya, K. Reed Gleason · Electronics Letters 12 Mar 1987 14
44 Where Are My On-Wafer Reference Planes? Keith E. Jones, E.W. Strid Conference paper Dec 1987 13
45 Accurate measurement of high-speed package and interconnect parasitics Duncan M Carlton, K. Reed Gleason, R. Hopkins et al. Conference paper 6 Jan 2003 13
46 Verification of LRRM Calibrations with Load Inductance Compensation for CPW Measurements on GaAs Substrates J. Pence Conference paper Dec 1993 12
47 Bias-Dependent Microwave Characteristics of Atomic Planar-Doped AIGaAs/InGaAs/GaAs Double Heterojunction MODFET's (Short Paper) Y.K. Chen, G.W. Wang, D.C. Radulescu et al. · IEEE Transactions on Microwave Theory and Techniques Dec 1987 11
48 An Automated W-Band On-Wafer Noise Figure Measurement System Sian Chen, Daniel C. H. Yang, Huei Wang et al. Conference paper Jun 1993 11
49 A hybrid probe-tip calibration for multiport vector network analyzers Leonard A. Hayden Conference paper Nov 2006 10
50 A novel RFCMOS process monitoring test structure Choon Beng Sia, B.H. Ong, Kok Meng Lim et al. Conference paper 20 Jul 2004 10

Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.