Most cited papers from CMA Technologies (United States)
What are the most cited papers from CMA Technologies (United States)?
The most cited paper from CMA Technologies (United States) is "Detection of Discrete Surface and Subsurface Defects" (John C. Stover, Douglas E. McGary, 1990), with 0 citations. Next come "Specifications for Low Scatter Optics" (0) and "CVD silicon carbide—a promising material for low-scatter mirrors" (0).
Showing 4 of 4 papers. Every paper is listed.
| # | Paper | ||
|---|---|---|---|
| 1 | Detection of Discrete Surface and Subsurface Defects John C. Stover, Douglas E. McGary | 1990 | 0 |
| 2 | Specifications for Low Scatter Optics John C. Stover | 1990 | 0 |
| 3 | CVD silicon carbide—a promising material for low-scatter mirrors Jean M. Bennett, Phillip C. Archibald, Randle V. De’wees et al. · Optical Society of America Annual Meeting | 1990 | 0 |
| 4 | jaamsim: Release 2016-11 mchudleigh, Harry J. King, sawong et al. · INFM-OAR (INFN Catania) | 7 Jul 2016 | 0 |
Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.