Institution · Corrected Electron Optical Systems (Germany)
Most cited papers from Corrected Electron Optical Systems (Germany)
What are the most cited papers from Corrected Electron Optical Systems (Germany)?
The most cited paper from Corrected Electron Optical Systems (Germany) is "Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit" (C. F. Kisielowski et al., 2008), with 310 citations. Next come "Transmission electron microscopy at 20kV for imaging and spectroscopy" (202) and "Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope" (197).
Showing 50 of 59 papers. Every paper with more than 6 citations is listed.
| # | Paper | ||
|---|---|---|---|
| 1 | Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit C. F. Kisielowski et al. · Microscopy and Microanalysis | 16 Sep 2008 | 310 |
| 2 | Transmission electron microscopy at 20kV for imaging and spectroscopy Ute A. Kaiser, Johannes Biskupek, Jannik C. Meyer et al. · Ultramicroscopy | 8 Jun 2011 | 202 |
| 3 | Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope Maximilian Haider, H. Rose, Stephan Uhlemann et al. · Journal of Electron Microscopy | 1998 | 197 |
| 4 | Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM Mohammad Sohail Haider, Stephan Uhlemann, Juliusz Żach · Ultramicroscopy | Apr 2000 | 174 |
| 5 | Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV Martin Linck, Peter Hartel, Stephan Uhlemann et al. · Physical Review Letters | 9 Aug 2016 | 140 |
| 6 | First application of Cc-corrected imaging for high-resolution and energy-filtered TEM Bernd C. Kabius, Peter Hartel, Mohammad Sohail Haider et al. · Journal of Electron Microscopy | 27 Apr 2009 | 133 |
| 7 | Advancing the Hexapole Cs-Corrector for the Scanning Transmission Electron Microscope Heiko Müller, Stephan Uhlemann, Peter Hartel et al. · Microscopy and Microanalysis | 11 Oct 2006 | 116 |
| 8 | Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration Mohammad Sohail Haider, Peter Hartel, Heiko Müller et al. · Microscopy and Microanalysis | 2 Jul 2010 | 115 |
| 9 | Thermal Magnetic Field Noise Limits Resolution in Transmission Electron Microscopy Stephan Uhlemann, Heiko Müller, Peter Hartel et al. · Physical Review Letters | 22 Jul 2013 | 110 |
| 10 | Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM Mohammad Sohail Haider, Heiko Müller, Stephan Uhlemann et al. · Ultramicroscopy | 6 Nov 2007 | 103 |
| 11 | Aberration corrected 1.2-MV cold field-emission transmission electron microscope with a sub-50-pm resolution Tetsuya Akashi, Yoshio Takahashi, Toshiaki Tanigaki et al. · Applied Physics Letters | 16 Feb 2015 | 93 |
| 12 | Current and future aberration correctors for the improvement of resolution in electron microscopy Mohammad Sohail Haider, Peter Hartel, Heiko Müller et al. · Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences | 17 Aug 2009 | 85 |
| 13 | Efficient diffractive phase optics for electrons Tyler R. Harvey, Jordan Pierce, Amit Kumar Agrawal et al. · New Journal of Physics | 25 Sep 2014 | 78 |
| 14 | Stability and dynamics of small molecules trapped on graphene Rolf Erni, Marta D. Rossell, Manh‐Thuong Nguyen et al. · Physical Review B | 25 Oct 2010 | 76 |
| 15 | Probing the Out-of-Plane Distortion of Single Point Defects in Atomically Thin Hexagonal Boron Nitride at the Picometer Scale Nasim Alem, Oleg V. Yazyev, Christian F. Kisielowski et al. · Physical Review Letters | 21 Mar 2011 | 72 |
| 16 | Annular dark field imaging in a TEM Sara Bals, Bernd C. Kabius, Maximilian Haider et al. · Solid State Communications | 10 Apr 2004 | 62 |
| 17 | A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope Knut W. Urban, Bernd C. Kabius, Mohammad Sohail Haider et al. · Journal of Electron Microscopy | 1999 | 58 |
| 18 | Origins and demonstrations of electrons with orbital angular momentum Benjamin J. McMorran, Amit Kumar Agrawal, Peter A. Ercius et al. · Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences | 9 Jan 2017 | 55 |
| 19 | Aplanatic imaging systems for the transmission electron microscope Heiko Müller, Ingo Maßmann, Stephan Uhlemann et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment | 22 Dec 2010 | 37 |
| 20 | Aberration correction and its automatic control in scanning electron microscopes Shinobu Uno, Kazuhiro Honda, Natsuko Nakamura et al. · Optik | 18 Aug 2005 | 31 |
| 21 | New Electrostatic Phase Plate for Phase-Contrast Transmission Electron Microscopy and Its Application for Wave-Function Reconstruction Katrin Schultheiß, Joachim Zach, Bjoern Gamm et al. · Microscopy and Microanalysis | 15 Oct 2010 | 31 |
| 22 | Experimental evidence for hotspot and phase-slip mechanisms of voltage switching in ultrathin YBa2Cu3O7–x nanowires Matvey Lyatti, Martin A. Wolff, Alexey Savenko et al. · Physical review. B./Physical review. B | 13 Aug 2018 | 30 |
| 23 | Vacancy growth and migration dynamics in atomically thin hexagonal boron nitride under electron beam irradiation Nasim Alem, Rolf Erni, Christian F. Kisielowski et al. · physica status solidi (RRL) - Rapid Research Letters | 11 Jul 2011 | 29 |
| 24 | Test and characterization of a new post-column imaging energy filter Frank Kahl, Volker Gerheim, Martin Linck et al. · Advances in imaging and electron physics | 2019 | 28 |
| 25 | First application of a spherical‐aberration corrected transmission electron microscope in materials science Bernd C. Kabius, Max Haider, Stefan Uhlemann et al. · Journal of Electron Microscopy | 27 Mar 2002 | 28 |
| 26 | Electron nanodiffraction using sharply focused parallel probes Christian Dwyer, Angus I. Kirkland, Peter Hartel et al. · Applied Physics Letters | 9 Apr 2007 | 27 |
| 27 | Effects of residual aberrations explored on single-walled carbon nanotubes Johannes Biskupek, Peter Hartel, Maximilian Haider et al. · Ultramicroscopy | 18 Mar 2012 | 27 |
| 28 | In-focus electron microscopy of frozen-hydrated biological samples with a Boersch phase plate Bastian Barton, Daniel Rhinow, Andreas Walter et al. · Ultramicroscopy | 17 Sep 2011 | 27 |
| 29 | Ultra-thin YBa 2 Cu 3 O 7− x films with high critical current density Matvey Lyatti, Alexey Savenko, U. Poppe · Superconductor Science and Technology | 6 May 2016 | 25 |
| 30 | Thermal magnetic field noise: Electron optics and decoherence Stephan Uhlemann, Heiko Müller, Joachim Zach et al. · Ultramicroscopy | 29 Nov 2014 | 22 |
| 31 | Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samples Colin Ophus, Haider I. Rasool, Martin Linck et al. · Advanced Structural and Chemical Imaging | 30 Nov 2016 | 21 |
| 32 | Elemental mapping in single-particle reconstructions by reconstructed electron energy-loss analysis Olivia Pfeil-Gardiner, Higor Vinícius Dias Rosa, Dietmar Riedel et al. · Nature Methods | 24 Oct 2024 | 20 |
| 33 | Entrepreneurs’ Self-Perception of Skills in Rural Tourism Conceição Castro, Fernanda A. Ferreira · DOAJ (DOAJ: Directory of Open Access Journals) | Mar 2019 | 19 |
| 34 | Chromatic correction: a revolution in electron microscopy? Juliusz Żach · Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences | 17 Aug 2009 | 19 |
| 35 | Aberration corrected STEM by means of diffraction gratings Martin Linck, Peter A. Ercius, Jordan Pierce et al. · Ultramicroscopy | 12 Jun 2017 | 18 |
| 36 | Sub-nanometer Resolution in Field-free Imaging using a Titan 80-300 with Lorentz lens and Image Cs-Corrector at 300kV Acceleration Voltage Bert H. Freitag, Maarten Bischoff, Hans-Helge Mueller et al. · Microscopy and Microanalysis | Jul 2009 | 18 |
| 37 | Aberration-corrected optics: from an idea to a device Heiko Müller, Stephan Uhlemann, Peter Hartel et al. · Physics Procedia | Aug 2008 | 17 |
| 38 | TEM bright field imaging of thick specimens: nodes in Thon ring patterns Willem Tichelaar, Wim J. H. Hagen, Tatiana E. Gorelik et al. · Ultramicroscopy | 27 May 2020 | 16 |
| 39 | In Situ TEM Investigation of the Lithiation and Delithiation Process Between Graphene Sheets in the Presence of Atomic Defects Yueliang Li, Felix Börrnert, Mahdi Ghorbani‐Asl et al. · Advanced Functional Materials | 18 Jul 2024 | 13 |
| 40 | Experimental realization of a π /2 vortex mode converter for electrons using a spherical aberration corrector Thomas Schachinger, Peter Hartel, Peng‐Han Lu et al. · Ultramicroscopy | 27 Jun 2021 | 12 |
| 41 | Atomic Scale Analysis of Planar Defects in Polycrystalline Diamond Rolf Erni, Bert H. Freitag, Peter Hartel et al. · Microscopy and Microanalysis | 11 Oct 2006 | 12 |
| 42 | Experimental Set-up of a Purely Electrostatic Monochromator for High Resolution and Analytical Purposes of a 200 KV TEM Stephan Uhlemann, Max Haider · Microscopy and Microanalysis | Aug 2002 | 11 |
| 43 | Performance of Monochromized and Aberration-Corrected TEMs Gerd Benner, Erik Essers, Marko Matijević et al. · Microscopy and Microanalysis | Aug 2004 | 11 |
| 44 | π/2 mode converters and vortex generators for electrons Christian Kramberger, Stefan Löffler, Thomas Schachinger et al. · Ultramicroscopy | 16 May 2019 | 10 |
| 45 | Realization of the First Aplanatic Transmission Electron Microscope I Maβmann, Stephan Uhlemann, Heiko Müller et al. · Microscopy and Microanalysis | Jul 2011 | 10 |
| 46 | Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV Ryusuke Sagawa, Akira Yasuhara, Hiroki Hashiguchi et al. · Ultramicroscopy | 30 Nov 2021 | 9 |
| 47 | Applications of a Cs Corrected HRTEM in Materials Science JOHN L. HUTCHISON, John M. Titchmarsh, D. J. H. Cockayne et al. · Microscopy and Microanalysis | Aug 2002 | 9 |
| 48 | A flexible multi-stimuli in situ (S)TEM: Concept, optical performance, and outlook Felix Börrnert, Heiko Müller, Thomas Riedel et al. · Ultramicroscopy | 21 Nov 2014 | 9 |
| 49 | The Dresden in-situ (S)TEM special with a continuous-flow liquid-helium cryostat Felix Börrnert, Felix Kern, Franziska Harder et al. · Ultramicroscopy | 10 Feb 2019 | 8 |
| 50 | Optimum aberration coefficients for recording high-resolution off-axis holograms in a Cs-corrected TEM Martin Linck · Ultramicroscopy | 24 Aug 2012 | 8 |
Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.