Institution · LPA Software Solutions (United States)
Most cited papers from LPA Software Solutions (United States)
What are the most cited papers from LPA Software Solutions (United States)?
The most cited paper from LPA Software Solutions (United States) is "The adhesion of spherical particles: Contributions of Van Der Waals and electrostatic interactions" (D. S. Rimai, David J. Quesnel, 2002), with 22 citations. Next come "Effects of Electrostatic and van der Waals Interactions on the Adhesion of Spherical 7 µm Particles" (19) and "Effect of Young's Modulus on the Detachment Force of 7 μm Particles" (8).
Showing 50 of 60 papers. Every paper is listed.
| # | Paper | ||
|---|---|---|---|
| 1 | The adhesion of spherical particles: Contributions of Van Der Waals and electrostatic interactions D. S. Rimai, David J. Quesnel · The Journal of Adhesion | May 2002 | 22 |
| 2 | Effects of Electrostatic and van der Waals Interactions on the Adhesion of Spherical 7 µm Particles D. S. Rimai, Matthew C. Ezenyilimba, David J. Quesnel · The Journal of Adhesion | Mar 2005 | 19 |
| 3 | Effect of Young's Modulus on the Detachment Force of 7 μm Particles M. Cristina Dejesus, Donald S. Rimai, David J. Quesnel · Langmuir | 14 Dec 2005 | 8 |
| 4 | The Adhesion of Irregularly-shaped 8 μm Diameter Particles to Substrates: The Contributions of Electrostatic and van der Waals Interactions D. S. Rimai, David J. Quesnel, Ron Reifenberger · The Journal of Adhesion | Dec 2000 | 7 |
| 5 | Leveraging MBSE for ESA Ground Segment Engineering: Starting with the Euclid Mission Daniel Fischer, Frank Keck, Mariella Spada et al. · 2018 SpaceOps Conference | 25 May 2018 | 6 |
| 6 | Effects of submicrometer particulate silica addenda on the adhesion of micrometer-size particles to a polyester-composite substrate D. S. Rimai, P. Alexandrovich, David J. Quesnel · The Journal of Adhesion | Nov 2003 | 6 |
| 7 | The Ethical Intersection of Elder Law and Elder Care Practices Krupa N. Shah, Neeraj L. Shah · Journal of the American Geriatrics Society | Dec 2013 | 4 |
| 8 | Finite Element Modeling of Particle Adhesion: A Surface Energy Formalism David J. Quesnel, Donald S. Rimai · The Journal of Adhesion | Dec 2000 | 4 |
| 9 | Organic Photoconductors David S. Weiss, Martin A. Abkowitz | 2006 | 3 |
| 10 | Differential Gloss Visual Threshold Under Normal Viewing Conditions Chunghui Kuo, Yee S. Ng, Jeffrey C. Wang · Technical programs and proceedings/Technical program and proceedings | 2002 | 2 |
| 11 | Differential Gloss in Electrophotography Cheng Wang · Technical programs and proceedings/Technical program and proceedings | 1999 | 2 |
| 12 | Quasi-Center-Weighted PWM Multi-level LED Printhead with Non-linear Exposure Uniformity Correction Isaac Ajewole, Yee S. Ng · Technical programs and proceedings/Technical program and proceedings | 2000 | 2 |
| 13 | Time-Dependence of the Adhesion of Micrometer-Size Particles to Substrates: Correlation with Postdeposition Particle Rotation M. Cristina Dejesus, Jason A. Morgan, D. S. Rimai · The Journal of Adhesion | Jun 2006 | 2 |
| 14 | The Time Dependence of the Detachment Force of Ground Micrometer-Size Particles from a Planar Substrate: Effect of Particle Rotation M. Cristina De Jesus, Jason A. Morgan, Rajib Ahmed et al. · Particulate Science And Technology | 30 Jan 2007 | 2 |
| 15 | Autonomous CI/CD Quality Assurance Using LangGraph Multi-Agent Orchestration and Risk-Proportionate Human-in-the-Loop Control Kavita Jadhav · International Journal Of Engineering And Computer Science | 2026 | 1 |
| 16 | Gloss Uniformity Attributes for Reflection Images Yee S. Ng, Chunghui Kuo, C. Jeffrey Wang · Technical programs and proceedings/Technical program and proceedings | 2001 | 1 |
| 17 | Digital Color Printing and the NexPress Approach Arun Chowdry · Technical programs and proceedings/Technical program and proceedings | 2001 | 1 |
| 18 | Best Practices in Serious Games: Gamification Strategies to Support Public Participation in Citizen Observatories Luca Simeone, Silvia Brandalesi, Stefano Tamascelli et al. · VBN Forskningsportal (Aalborg Universitet) | 30 Nov 2018 | 1 |
| 19 | Space Computation Sciences Leveraging Cloud Computing, Artificial Intelligence, and Advanced Analytics to Power Innovation: A Review Report Takudzwa Fadziso · Asia Pacific Journal of Energy and Environment | 31 Dec 2018 | 1 |
| 20 | Perceptual Color Contouring Detection and Quality Evaluation Using Scanners C.‐C. Jay Kuo, Yee S. Ng, Dmitri A. Gusev · Technical programs and proceedings/Technical program and proceedings | 2003 | 1 |
| 21 | Enterprise Agentic AI: A Reference Architecture for Natural Language to SQL, Model Context Protocol (MCP), Retrieval-Augmented Generation (RAG), Multi-Agent Systems, and Production AI Bothraj P · Zenodo (CERN European Organization for Nuclear Research) | 5 Jun 2026 | 0 |
| 22 | Carbon-Aware Test Scheduling in Agentic CI/CD: Risk-Proportionate Agent Tier Routing and Grid-Intensity Deferral Kavita Jadhav · Zenodo (CERN European Organization for Nuclear Research) | 28 Jun 2026 | 0 |
| 23 | Theory of Karmic Relativity: Why We Live in Different Yugas Under the Same Sun Kavita Jadhav · Zenodo (CERN European Organization for Nuclear Research) | 25 Jun 2026 | 0 |
| 24 | LLM Safety as a Quality Gate: Integrating Bias, Fairness, and Robustness Evaluation into CI/CD via GitHub Apps Kavita Jadhav · Zenodo (CERN European Organization for Nuclear Research) | 24 Jun 2026 | 0 |
| 25 | ATI: Adaptive Test Intelligence — A Unified Modular Microservice for Flaky Test Detection, Cost-Bounded LLM Repair, and Configurable Autonomy in CI/CD Kavita Jadhav · Zenodo (CERN European Organization for Nuclear Research) | 22 Jun 2026 | 0 |
| 26 | Karmic Intelligence Theory (KIT): A Vedantic-Psychological Framework for Moral Discernment, Conscious Action, and Civilizational Health Kavita Jadhav · Zenodo (CERN European Organization for Nuclear Research) | 17 Jun 2026 | 0 |
| 27 | Beyond Binary Verdicts: Aleatoric Uncertainty Quantification in Agentic CI/CD Quality Pipelines Kavita Jadhav · Zenodo (CERN European Organization for Nuclear Research) | 13 Jun 2026 | 0 |
| 28 | Beyond a Single Threshold: Uncertainty Source Classification and Type-Stratified Conformal Prediction for Agentic CI/CD Kavita Jadhav · Zenodo (CERN European Organization for Nuclear Research) | 14 Jun 2026 | 0 |
| 29 | Beyond Static Gates: Closing the Detect-Fix-Learn Loop in Agentic CI/CD Quality Assurance Kavita Jadhav · Zenodo (CERN European Organization for Nuclear Research) | 6 May 2026 | 0 |
| 30 | Empowering Emerging Engineers From Underrepresented Regions Ennouhe TALEB, Ang Boon Chong, Abhishek Sharma · IEEE Consumer Electronics Magazine | 6 May 2026 | 0 |
| 31 | Development of a Target Product Profile for an Artificial Intelligence for Use in English Diabetic Eye Screening, a Modified Delphi Consensus Study Trystan Macdonald et al. · SSRN Electronic Journal | 2025 | 0 |
| 32 | Improved Separating Agent for Roller Fusing Detlef Schulze-Hagenest, Dinesh Tyagi · Technical programs and proceedings/Technical program and proceedings | 2005 | 0 |
| 33 | NexPress Glosser Process for Photo-Rich Applications Muhammed Aslam, Yee S. Ng · Technical programs and proceedings/Technical program and proceedings | 2005 | 0 |
| 34 | Electrostatic Printing on Textiles and Non-Planar Substrates David S. Weiss, Donald S. Rimai, David J. Quesnel · Technical programs and proceedings/Technical program and proceedings | 2004 | 0 |
| 35 | Improvements in Toner Fines Characterization Kevin D. Lofftus · Technical programs and proceedings/Technical program and proceedings | 2005 | 0 |
| 36 | A Semi-Empirical Model For Dip Coating: Thickness and Thickness Uniformity Control Michel Frantz Molaire · Technical programs and proceedings/Technical program and proceedings | 2005 | 0 |
| 37 | Electrophotography as a Means of Nanofabrication: The Role of Electrodynamic and Electrostatic Forces David S. Weiss, Donald S. Rimai, M. Cristina De Jesus et al. · Technical programs and proceedings/Technical program and proceedings | 2005 | 0 |
| 38 | Photoconductor Discharge Curves, the Stretched Exponential, and Exponential Decay Functions Eric Carl Stelter · Technical programs and proceedings/Technical program and proceedings | 2005 | 0 |
| 39 | Cocrystalline Mixtures of Titanyl Fluorophthalocyanine and Unsubstituted Titanyl Phthalocyanine: The Mechanical Amorphization Process, Its Characterization, and Conditions for Cocrystallization Michel Frantz Molaire, Theodore Zubil · Technical programs and proceedings/Technical program and proceedings | 2004 | 0 |
| 40 | Enabling Expanded Color Gamut and In-line Coating Processes Dinesh Kumar Tyagi, Peter Alexandrovich, Yee S. Ng et al. · Technical programs and proceedings/Technical program and proceedings | 2004 | 0 |
| 41 | Techniques for Identifying and Analyzing Banding Sources in the Electrophotographic Process Ulrich von Huelsen · Technical programs and proceedings/Technical program and proceedings | 2003 | 0 |
| 42 | Perceptual Color Granularity Metric via Scanner Chunghui Kuo, Yee S. Ng · Technical programs and proceedings/Technical program and proceedings | 2004 | 0 |
| 43 | Conductivity and Time-Constant Measurements on Magnetically-Agitated Electrophotographic Developer Using the Method of the Compensated Probe Graham S. Wright · Technical programs and proceedings/Technical program and proceedings | 2003 | 0 |
| 44 | The Adhesion of Spherical Toner Particles to an Organic Photoconductor: Contributions of van der Waals and Electrostatic Interactions S. Cormier, D. S. Rimai, David J. Quesnel · Technical programs and proceedings/Technical program and proceedings | 2002 | 0 |
| 45 | Reinforced Elastomer Roller for Toner Transfer D. M. Herrick, Bonnie Patterson, Biao Tan · Technical programs and proceedings/Technical program and proceedings | 2002 | 0 |
| 46 | Achieving “Reliability” Through an Operator Replaceable Component Strategy David E. Bettiol · Technical programs and proceedings/Technical program and proceedings | 2003 | 0 |
| 47 | Image Graininess via Flatbed Scanner and Image Segmentation Chunghui Kuo, Yee S. Ng · Technical programs and proceedings/Technical program and proceedings | 2005 | 0 |
| 48 | Free-Volume Trapping in Charge Generating Layers Michel Frantz Molaire, Theodore Zubil, William T. Gruenbaum · Technical programs and proceedings/Technical program and proceedings | 1999 | 0 |
| 49 | The Opportunity of Digital Color Printing Christopher Payne · Technical programs and proceedings/Technical program and proceedings | 2001 | 0 |
| 50 | Developing a Common Print Application Architecture Leonard Christopher · Technical programs and proceedings/Technical program and proceedings | 2001 | 0 |
Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.