Institution · Nion (United States)
Most cited papers from Nion (United States)
What are the most cited papers from Nion (United States)?
The most cited paper from Nion (United States) is "Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy" (Ondrej L. Krivanek, Matthew F. Chisholm, Valeria Nicolosi et al., 2010), with 1,359 citations. Next come "Sub-ångstrom resolution using aberration corrected electron optics" (914) and "Vibrational spectroscopy in the electron microscope" (740).
Showing 50 of 58 papers. Every paper with more than 11 citations is listed.
| # | Paper | ||
|---|---|---|---|
| 1 | Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy Ondrej L. Krivanek, Matthew F. Chisholm, Valeria Nicolosi et al. · Nature | Mar 2010 | 1,359 |
| 2 | Sub-ångstrom resolution using aberration corrected electron optics Philip E. Batson, Niklas Dellby, Ondrej L. Krivanek · Nature | 8 Aug 2002 | 914 |
| 3 | Vibrational spectroscopy in the electron microscope Ondrej L. Krivanek, Tracy Clark Lovejoy, Niklas Dellby et al. · Nature | Oct 2014 | 740 |
| 4 | Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy David Anthony Muller, Lena Fitting Kourkoutis, M. Murfitt et al. · Science | 21 Feb 2008 | 617 |
| 5 | Towards sub-Å electron beams Ondrej L. Krivanek, Niklas Dellby, Andrew R. Lupini · Ultramicroscopy | Jun 1999 | 615 |
| 6 | Direct Sub-Angstrom Imaging of a Crystal Lattice P.D. Nellist, Matthew F. Chisholm, Niklas Dellby et al. · Science | 16 Sep 2004 | 532 |
| 7 | Spectroscopic Imaging of Single Atoms Within a Bulk Solid Maria Varela, Scott D. Findlay, Andrew R. Lupini et al. · Physical Review Letters | 3 Mar 2004 | 327 |
| 8 | An electron microscope for the aberration-corrected era Ondrej L. Krivanek, George J. Corbin, Niklas Dellby et al. · Ultramicroscopy | 9 Nov 2007 | 301 |
| 9 | Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution Timothy J. Pennycook, Andrew R. Lupini, Hao Yang et al. · Ultramicroscopy | 15 Oct 2014 | 276 |
| 10 | Progress in aberration-corrected scanning transmission electron microscopy Niklas Dellby, O. L. Krivanek, P.D. Nellist et al. · Microscopy | May 2001 | 245 |
| 11 | Single-defect phonons imaged by electron microscopy Xingxu Yan, Chengyan Liu, Chaitanya Avinash Gadre et al. · Nature | 6 Jan 2021 | 197 |
| 12 | Gentle STEM: ADF imaging and EELS at low primary energies Ondrej L. Krivanek, Niklas Dellby, Matthew F. Murfitt et al. · Ultramicroscopy | 17 Feb 2010 | 182 |
| 13 | Identification of site-specific isotopic labels by vibrational spectroscopy in the electron microscope Jordan A. Hachtel, Jingsong Huang, Ilja Popovs et al. · Science | Feb 2019 | 174 |
| 14 | Progress in ultrahigh energy resolution EELS Ondrej L. Krivanek, Niklas Dellby, Jordan A. Hachtel et al. · Ultramicroscopy | 10 Dec 2018 | 171 |
| 15 | Towards sub-0.5Å electron beams Ondrej L. Krivanek, Peter D. Nellist, Niklas Dellby et al. · Ultramicroscopy | 19 May 2003 | 169 |
| 16 | Damage-free vibrational spectroscopy of biological materials in the electron microscope Peter Rez, Toshihiro Aoki, Katia March et al. · Nature Communications | 10 Mar 2016 | 161 |
| 17 | High-energy-resolution monochromator for aberration-corrected scanning transmission electron microscopy/electron energy-loss spectroscopy Ondrej L. Krivanek, Jonathan P. Ursin, Neil J. Bacon et al. · Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences | 17 Aug 2009 | 160 |
| 18 | Nanoscale momentum-resolved vibrational spectroscopy Fredrik Sydow Hage, Rebecca J. Nicholls, Jonathan R. Yates et al. · Science Advances | Jun 2018 | 158 |
| 19 | Temperature Measurement by a Nanoscale Electron Probe Using Energy Gain and Loss Spectroscopy Juan Carlos Idrobo, Andrew R. Lupini, Tianli Feng et al. · Physical Review Letters | 2 Mar 2018 | 151 |
| 20 | Silicon–Carbon Bond Inversions Driven by 60-keV Electrons in Graphene Toma Susi, Jani Kotakoski, Demie M. Kepaptsoglou et al. · Physical Review Letters | 11 Sep 2014 | 151 |
| 21 | Electron-Beam Mapping of Vibrational Modes with Nanometer Spatial Resolution Christian Dwyer, Toshihiro Aoki, Peter Rez et al. · Physical Review Letters | 15 Dec 2016 | 120 |
| 22 | Monochromated STEM with a 30 meV-wide, atom-sized electron probe Ondrej L. Krivanek, Tracy Clark Lovejoy, Niklas Dellby et al. · Microscopy | 17 Jan 2013 | 114 |
| 23 | Hybrid pixel direct detector for electron energy loss spectroscopy Benjamin Plotkin-Swing, George J. Corbin, Sacha De Carlo et al. · Ultramicroscopy | 2 Jul 2020 | 110 |
| 24 | Single atom identification by energy dispersive x-ray spectroscopy T.C. Lovejoy, Quentin Mathieu Ramasse, Meiken Falke et al. · Applied Physics Letters | 9 Apr 2012 | 104 |
| 25 | Single Atom Microscopy Wu Zhou, Mark P. Oxley, Andrew R. Lupini et al. · Microscopy and Microanalysis | 12 Nov 2012 | 74 |
| 26 | Improvements in the X-Ray Analytical Capabilities of a Scanning Transmission Electron Microscope by Spherical-Aberration Correction Masashi Watanabe, David W. Ackland, Andrew D. Burrows et al. · Microscopy and Microanalysis | 11 Oct 2006 | 71 |
| 27 | Vibrational Spectroscopy of Water with High Spatial Resolution Jacob R. Jokisaari, Jordan A. Hachtel, Xuan Hu et al. · Advanced Materials | 30 Jul 2018 | 64 |
| 28 | The Quantitative Analysis of Terrorism and Immigration: An Initial Exploration Robert S. Leiken, Steven Brooke · Terrorism and Political Violence | 19 Sep 2006 | 55 |
| 29 | Dedicated STEM for 200 to 40 keV operation Niklas Dellby, Nicholas J. Bacon, P. Hrncirik et al. · The European Physical Journal Applied Physics | Jun 2011 | 47 |
| 30 | Towards sub-10 meV energy resolution STEM-EELS Ondrej L. Krivanek, Tracy Clark Lovejoy, Matthew F. Murfitt et al. · Journal of Physics Conference Series | 11 Jun 2014 | 46 |
| 31 | Atomic-Level Structural Engineering of Graphene on a Mesoscopic Scale Alberto Trentino, Jacob Madsen, Andreas Mittelberger et al. · Nano Letters | 9 Jun 2021 | 45 |
| 32 | Advances in Ultra-High Energy Resolution STEM-EELS T.C. Lovejoy, GJ Corbin, Niklas Dellby et al. · Microscopy and Microanalysis | Aug 2018 | 40 |
| 33 | Nion Swift: Open Source Image Processing Software for Instrument Control, Data Acquisition, Organization, Visualization, and Analysis Using Python. Chris Meyer, Niklas Dellby, Jordan A. Hachtel et al. · Microscopy and Microanalysis | Aug 2019 | 33 |
| 34 | Polarization Selectivity in Vibrational Electron-Energy-Loss Spectroscopy Guillaume Radtke, Dario Taverna, Nicolas Menguy et al. · Physical Review Letters | 19 Dec 2019 | 29 |
| 35 | Scanning transmission electron microscopy: Albert Crewe's vision and beyond Ondrej L. Krivanek, Matthew F. Chisholm, Matthew F. Murfitt et al. · Ultramicroscopy | 17 May 2012 | 28 |
| 36 | Jihadist Strategic Debates before 9/11 Steven Brooke · Studies in Conflict and Terrorism | 21 Feb 2008 | 26 |
| 37 | Aberration‐corrected STEM for atomic‐resolution imaging and analysis Ondrej L. Krivanek, T.C. Lovejoy, Niklas Dellby · Journal of Microscopy | 4 May 2015 | 26 |
| 38 | Measuring the hole-state anisotropy in MgB2 by electron energy-loss spectroscopy Robert F. Klie, Haibin Su, Ye Zhu et al. · Physical review. B, Condensed matter | 14 Apr 2003 | 23 |
| 39 | Synthesis of Electron Energy Loss Spectra for the Quantification of Detection Limits N K Menon, Ondrej L. Krivanek · Microscopy and Microanalysis | Jun 2002 | 22 |
| 40 | Aberration-Corrected Scanning Transmission Electron Microscopy: The Potential for Nano- and Interface Science Stephen John Pennycook, Andrew R. Lupini, Andreas V. Kadavanich et al. · International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde) | Apr 2003 | 21 |
| 41 | Ultra-high Energy Resolution EELS Niklas Dellby, Tracy Clark Lovejoy, George J. Corbin et al. · Microscopy and Microanalysis | 30 Jul 2020 | 20 |
| 42 | Variable voltage electron microscopy: Toward atom-by-atom fabrication in 2D materials Ondrej Dyck, Stephen Jesse, Niklas Delby et al. · Ultramicroscopy | 31 Jan 2020 | 20 |
| 43 | Toward Single Mode, Atomic Size Electron Vortex Beams Ondrej L. Krivanek, Ján Rusz, Juan Carlos Idrobo et al. · Microscopy and Microanalysis | 7 May 2014 | 19 |
| 44 | Aberration-corrected STEM: current performance and future directions Peter D. Nellist, M. F. Chisholm, Andrew R. Lupini et al. · Journal of Physics Conference Series | 22 Feb 2006 | 19 |
| 45 | A Materials Scientist's CANVAS: A System for Controlled Alteration of Nanomaterials in Vacuum Down to the Atomic Scale Clemens Mangler, Jannik C. Meyer, Andreas Mittelberger et al. · Microscopy and Microanalysis | 22 Jul 2022 | 17 |
| 46 | Toward Atomic-Scale Tomography: The ATOM Project Thomas F. Kelly, Michael Edward Miller, K. Rajan et al. · Microscopy and Microanalysis | Jul 2011 | 16 |
| 47 | Individual heteroatom identification with X-ray spectroscopy R. M. Stroud, T.C. Lovejoy, Meiken Falke et al. · Applied Physics Letters | 18 Apr 2016 | 15 |
| 48 | Chinese Corporate Governance and Prospects for Reform Richard Daniel Ewing · Journal of Contemporary China | May 2005 | 15 |
| 49 | 100,000 Diffraction Patterns per Second with Live Processing for 4D-STEM Benjamin Plotkin-Swing, Benedikt Haas, Andreas Mittelberger et al. · Microscopy and Microanalysis | 22 Jul 2022 | 14 |
| 50 | Emergence of point defect states in a plasmonic crystal Hikaru Saito, Hugo Lourenço‐Martins, Noémie Bonnet et al. · Physical review. B./Physical review. B | 2 Dec 2019 | 13 |
Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.