Institution · Silicon Mitus (United States)
Most cited papers from Silicon Mitus (United States)
What are the most cited papers from Silicon Mitus (United States)?
The most cited paper from Silicon Mitus (United States) is "Reforming of Hydrocarbons into Synthesis Gas on Supported Metal Catalysts." (J.R. Rostrup-Nielsen, Jørn H. Hansen, Luis M. Aparicio, 1997), with 63 citations. Next come "A Current-Sourced LED Driver Compatible With Fluorescent Lamp Ballasts" (41) and "Defect Formation in Heavily As-Doped Cz Si" (12).
Showing 22 of 22 papers. Every paper is listed.
| # | Paper | ||
|---|---|---|---|
| 1 | Reforming of Hydrocarbons into Synthesis Gas on Supported Metal Catalysts. J.R. Rostrup-Nielsen, Jørn H. Hansen, Luis M. Aparicio · 石油学会誌 | 1997 | 63 |
| 2 | A Current-Sourced LED Driver Compatible With Fluorescent Lamp Ballasts Jaeyoung Choi, Hee-Seok Han, Kwyro Lee · IEEE Transactions on Power Electronics | 27 Aug 2014 | 41 |
| 3 | Defect Formation in Heavily As-Doped Cz Si Sergei Rouvimov, R. Kuytt, Joel Kearns et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena | Sep 2003 | 12 |
| 4 | Iron Solubility in Boron-Doped Silicon and Fe Gettering Mechanism in p/p+ Epitaxial Wafers Mohammad Bagher Shabani, Yusuke Shiina, Shigetaka Shimanuki et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena | Nov 2001 | 6 |
| 5 | A Novel 4-to-1 Switched-Capacitor Converter Kin Keung Jeff Lau, Jaesoon Choi, Seokmum Choi et al. | 14 Jun 2021 | 4 |
| 6 | Strain and Gettering in Epitaxial Silicon Wafers F.‐G. Kirscht, Mohammad Bagher Shabani, Takeo Yoshimi et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena | Jul 1997 | 4 |
| 7 | Fine Structure of Dislocation Related PL Bands D1 and D2 in Silicon Edward A. Steinman, А. Н. Терещенко, В. И. Орлов et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena | 15 Dec 2005 | 4 |
| 8 | Defect Control and Gettering in Cz-Silicon F.‐G. Kirscht, Eicke R. Weber, I. Babanskaya · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena | 1991 | 2 |
| 9 | Comparison of Nickel and Iron Gettering in Cz Silicon Wafers F.‐G. Kirscht, Benno Orschel, Sergei Rouvimov et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena | Nov 2001 | 2 |
| 10 | Gettering Strength Assessment Based on Lifetime Measurements F.‐G. Kirscht, Benno Orschel, V. Higgs et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena | Aug 1999 | 2 |
| 11 | PREDIÇÃO IN SILICO E SISTEMA TESTE A. CEPA APLICADOS PARA AVALIAÇÃO DOS EFEITOS CITOTÓXICOS E GENOTÓXICOS DE TEMPEROS INSTANTÂNEOS ULTRAPROCESSADOS Élen Juliane Vasconcelos Cardoso, AURIZANGELA OLIVEIRA DE SOUSA | 27 Mar 2023 | 1 |
| 12 | Charge Sharing LAU Switched-Capacitor Converter with Reducing Power Loss Jaesoon Choi, Kin Keung Jeff Lau, Seokmun Choi et al. · 2022 IEEE Applied Power Electronics Conference and Exposition (APEC) | 20 Mar 2022 | 1 |
| 13 | Volume Defect Formation in CZ SI Wafers and Related Electrical Effects F.‐G. Kirscht, Pascal Fricke, Jakob Reichel et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena | 1989 | 1 |
| 14 | Laser Scattering Tomography on Magnetic CZ-Si for Semiconductor Process Optimization Thomas Steinegger, M. Naumann, F.‐G. Kirscht · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena | 15 Dec 2005 | 1 |
| 15 | A Compact Low-Temperature CMOS Modeling Framework Using Measurement-Based V TH and I D Corrections Chanjung Park, Hyunuk Jeong, Jiyoung Kim et al. · IEEE Transactions on Circuits & Systems II Express Briefs | 2026 | 0 |
| 16 | A 0.6-V ping-pong auto-zero amplifier with a back-gate feedback offset- cancellation loop in a single differential pair Inju Yu, Mookyoung Yoo, Gibae Nam et al. · Microelectronics Journal | 22 Aug 2026 | 0 |
| 17 | A three-phase auto-zero stabilized multipath operational amplifier with switched-biasing noise reduction technique Hajun Bin, Jihyang Wi, Mookyoung Yoo et al. · Microelectronics Journal | 21 Jun 2026 | 0 |
| 18 | Norma e transgressão, à luz do paradigma bíblico José Augusto Ramos · Imprensa da Universidade de Coimbra eBooks | 2011 | 0 |
| 19 | A 7μΑ 1.6ppm/ °C bandgap design realizable in CMOS process Kin Keung Jeff Lau | May 2017 | 0 |
| 20 | Effect of Volume Defects on Gold Gettering in CZ-SI Klaus Schmalz, I. Babanskaya, H. Gdanitz et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena | 1989 | 0 |
| 21 | Impact of Volume Defects on Gold Gettering in Cz-Si Wafers F.‐G. Kirscht, Klaus Schmalz, I. Babanskaya · Materials science forum | 1989 | 0 |
| 22 | A method of regulating wireless power transfer based on the analysis of power communication Ngan K. Hoang, Sang‐Gug Lee | Jun 2015 | 0 |
Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.