Most cited papers from SiOnyx (United States)
What are the most cited papers from SiOnyx (United States)?
The most cited paper from SiOnyx (United States) is "Nanostructured Thermoelectrics: Big Efficiency Gains from Small Features" (Christopher J. Vineis, Ali Shakouri, Arun K. Majumdar et al., 2010), with 1,431 citations. Next come "Silicon photodiodes with high photoconductive gain at room temperature" (44) and "From black silicon to photovoltaic cells, using short pulse lasers" (34).
Showing 19 of 19 papers. Every paper is listed.
| # | Paper | ||
|---|---|---|---|
| 1 | Nanostructured Thermoelectrics: Big Efficiency Gains from Small Features Christopher J. Vineis, Ali Shakouri, Arun K. Majumdar et al. · Advanced Materials | 26 Jul 2010 | 1,431 |
| 2 | Silicon photodiodes with high photoconductive gain at room temperature X. Li, James E. Carey, Jason W. Sickler et al. · Optics Express | 22 Feb 2012 | 44 |
| 3 | From black silicon to photovoltaic cells, using short pulse lasers Thierry Sarnet, James E. Carey, Eric Mazur · AIP conference proceedings | 2012 | 34 |
| 4 | Black silicon enhanced photodetectors: a path to IR CMOS Martin U. Pralle, James E. Carey, H. Homayoon et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 23 Apr 2010 | 20 |
| 5 | High Repetition Rate, High Average Power, Femtosecond Erbium Fiber Ring Laser Jonathan L. Morse, Jason W. Sickler, J. Chen et al. | 2009 | 8 |
| 6 | IR CMOS: ultrafast laser-enhanced silicon detection Martin U. Pralle, James E. Carey, H. Homayoon et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 11 May 2011 | 8 |
| 7 | IR CMOS: infrared enhanced silicon imaging Martin U. Pralle, James E. Carey, Homayoon Haddad et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 11 Jun 2013 | 7 |
| 8 | Ultra low light CMOS image sensors Martin U. Pralle, Chris J. Vineis, Chintamani P. Palsule et al. | 9 Apr 2021 | 6 |
| 9 | Extending black silicon imaging to backside illumination Martin U. Pralle, Chris J. Vineis, Chintamani P. Palsule et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 20 May 2016 | 3 |
| 10 | Laser processing for enhanced photovoltaic performance Christopher J. Vineis, Moran Levy-Finklshtein, Martin U. Pralle et al. | Oct 2011 | 3 |
| 11 | Laser textured heterojunction solar cells on 45 um thick Si wafers: Effect of optical configuration and light trapping Steven Hegedus, Ujjwal Kumar Das, Chris J. Vineis et al. | Jun 2013 | 2 |
| 12 | Ultra-Low Light, Color CMOS Image Sensor Martin U. Pralle, R. M. Dawson, Chris J. Vineis et al. | Sep 2023 | 1 |
| 13 | Near-infrared enhanced position-sensitive avalanche photodiodes Richard A. Myers, Richard E. Farrell, Frank Robertson et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 28 Aug 2008 | 1 |
| 14 | IR CMOS: the digital nightvision solution to sub-1 mLux imaging Martin U. Pralle, James E. Carey, Chris J. Vineis et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 26 May 2015 | 1 |
| 15 | Characterization of the impact of dry etch removal of the passivation oxide on top of a backside-illuminated CMOS image sensor Chintamani P. Palsule, Jutao Jiang, Chris J. Vineis et al. | 10 Sep 2025 | 0 |
| 16 | IR CMOS: near infrared enhanced digital imaging (Presentation Recording) Martin U. Pralle, James E. Carey, Thomas Joy et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 28 Aug 2015 | 0 |
| 17 | IR CMOS: ultrafast laser-enhanced silicon imaging Martin U. Pralle, James E. Carey, H. Homayoon et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | May 2012 | 0 |
| 18 | Ultrafast Laser Processing of Semiconductor Devices James E. Carey, Martin U. Pralle, Chris J. Vineis et al. | 2011 | 0 |
| 19 | Infrared enhanced detection for laser imaging and biometrics Martin U. Pralle, James E. Carey, H. Homayoon et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 23 May 2013 | 0 |
Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.