Institution · Staib Instruments (United States)

Most cited papers from Staib Instruments (United States)

Staib Instruments (United States)

What are the most cited papers from Staib Instruments (United States)?

The most cited paper from Staib Instruments (United States) is "Epitaxial growth of β-Ga2O3 on SrTiO3 (001) and SrTiO3-buffered Si (001) substrates by plasma-assisted molecular beam epitaxy" (Tobias Hadamek, Agham B. Posadas, Fatima Al-Quaiti et al., 2022), with 17 citations. Next come "In situ real time Auger analyses during oxides and alloy growth using a new spectrometer design" (13) and "An Energy Filter for Electron Backscattering Diffraction" (6).

Published TypeFieldAccess

Showing 10 of 10 papers. Every paper is listed.

Most cited papers, sortable by citations and release date
#	Paper
1	Epitaxial growth of β-Ga2O3 on SrTiO3 (001) and SrTiO3-buffered Si (001) substrates by plasma-assisted molecular beam epitaxy Tobias Hadamek, Agham B. Posadas, Fatima Al-Quaiti et al. · Journal of Applied Physics	8 Apr 2022	17
2	In situ real time Auger analyses during oxides and alloy growth using a new spectrometer design Philippe G. Staib · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena	21 Mar 2011	13
3	An Energy Filter for Electron Backscattering Diffraction Tejpal Kaur Hooghan, Philippe G. Staib, Alwyn Eades · Microscopy and Microanalysis	Aug 2004	6
4	Determination of N-/Ga-rich growth conditions, using in-situ auger electron spectroscopy Stefan P. Svensson, Wendy L. Sarney, Kin Man Yu et al. · Journal of Crystal Growth	21 Feb 2015	5
5	In situ Auger probe enabling epitaxy composition control of alloys by elemental surface analysis W. Laws Calley, Jordan D. Greenlee, Walter E. Henderson et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena	9 Apr 2013	2
6	A new compact electron detector with REELS, EPES and elastic peak imaging capabilities for SEM Ph. Staib · IOP Conference Series Materials Science and Engineering Conference paperOpen access	Feb 2025	1
7	Spectroscopies combined with reflection high-energy electron diffraction (RHEED) for real-time in situ surface monitoring of thin film growth Philippe G. Staib · Elsevier eBooks Book chapter	2011	1
8	Electron optical properties of retarding field analyzers for high energy resolution spectroscopy Ph. Staib · Review of Scientific Instruments Open access	Jul 2025	0
9	Exploring the Use of Electron Rutherford Backscattering for the Detection and Quantification of Light Elements in Scanning Electron Microscope (SEM) Ph. Staib · Microscopy and Microanalysis Open access	Jul 2024	0
10	Capabilities of a New Compact SEM / STEM Electron Detector for Energy Resolved Scanning Imaging, Reflection Electron Energy Loss Spectroscopy (REELS) and Elastic Peak Electron Spectroscopy (EPES) Ph. Staib · Microscopy and Microanalysis Open access	22 Jul 2023	0

Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.