Ivan Ohlı́dal
Ivan Ohlı́dal publishes mostly in Computational Mechanics, Electrical and Electronic Engineering and Surfaces, Coatings and Films, on topics such as Surface Roughness and Optical Measurements, Optical Coatings and Gratings and Advanced Measurement and Metrology Techniques.
- World rank
- #401,079 of 1,633,909 ranked researchers
- Rank in Czechia
- #1,010 of 9,029
- Works
- 58
- Citations
- 133
- Citations per work
- 2.3
What does Ivan Ohlı́dal research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Computational Mechanics24% of their works
- 2Electrical and Electronic Engineering16% of their works
- 3Surfaces, Coatings and Films10% of their works
- 4Mechanical Engineering8% of their works
- 5Biomedical Engineering8% of their works
- 6Computer Vision and Pattern Recognition7% of their works
Research topics
- Surface Roughness and Optical Measurements
- Optical Coatings and Gratings
- Advanced Measurement and Metrology Techniques
- Optical measurement and interference techniques
- Optical Polarization and Ellipsometry
- Thin-Film Transistor Technologies
- Force Microscopy Techniques and Applications
- Calibration and Measurement Techniques
Which keywords describe Ivan Ohlı́dal's research?
The keywords of their largest research topics: Roughness Measurement, Surface Characterization, Solar Cells, Antireflective Coatings, Nanostructures, Dimensional Metrology, Error Compensation and Camera Calibration.
- On-Orbit Performance
- Polarimetry
- Imaging Spectroscopy
- Atomic Force Microscopy
- Camera Calibration
- Dimensional Metrology
- Antireflective Coatings
- Surface Characterization
- Roughness Measurement
- Solar Cells
- Nanostructures
- Error Compensation
- Structured Light
- Force Spectroscopy
- Plasmonics
- Thin-Film Transistors
- Radiometric Calibration
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Roughness Measurement161 topic
- Surface Characterization161 topic
- Solar Cells102 topics
- Antireflective Coatings71 topic
- Nanostructures71 topic
- Dimensional Metrology61 topic
- Error Compensation61 topic
- Camera Calibration51 topic
- Structured Light51 topic
- Atomic Force Microscopy31 topic
- Force Spectroscopy31 topic
- Imaging Spectroscopy31 topic
- Plasmonics31 topic
- Polarimetry31 topic
- Thin-Film Transistors31 topic
- On-Orbit Performance21 topic
- Radiometric Calibration21 topic
Where does Ivan Ohlı́dal work?
Ivan Ohlı́dal's main affiliation in the publication record is Masaryk University, Czechia.
How many publications and citations does Ivan Ohlı́dal have?
Science Explorer counts 58 works and 133 citations for Ivan Ohlı́dal, ranking #401,079 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.