John C. Stover
John C. Stover publishes mostly in Computational Mechanics, Surfaces, Coatings and Films and Electrical and Electronic Engineering, on topics such as Surface Roughness and Optical Measurements, Advanced Measurement and Metrology Techniques and Calibration and Measurement Techniques.
- World rank
- #234,861 of 1,633,909 ranked researchers
- Rank in United States
- #92,736 of 358,040
- Works
- 47
- Citations
- 76
- Citations per work
- 1.6
What does John C. Stover research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Computational Mechanics26% of their works
- 2Surfaces, Coatings and Films10% of their works
- 3Electrical and Electronic Engineering10% of their works
- 4Aerospace Engineering10% of their works
- 5Mechanical Engineering10% of their works
- 6Biomedical Engineering5% of their works
Research topics
- Surface Roughness and Optical Measurements
- Advanced Measurement and Metrology Techniques
- Calibration and Measurement Techniques
- Advancements in Photolithography Techniques
- Industrial Vision Systems and Defect Detection
- Electron and X-Ray Spectroscopy Techniques
- Optical Coatings and Gratings
- Optical measurement and interference techniques
Which keywords describe John C. Stover's research?
The keywords of their largest research topics: Machine Vision, Roughness Measurement, Surface Characterization, Dimensional Metrology, Error Compensation, Nanofabrication, Antireflective Coatings and Electron Beam Lithography.
- Structured Light
- X-ray Photoelectron Spectroscopy
- Scanning Electron Microscopy
- Radiometric Calibration
- Nanostructures
- Electron Beam Lithography
- Nanofabrication
- Dimensional Metrology
- Roughness Measurement
- Machine Vision
- Surface Characterization
- Error Compensation
- Antireflective Coatings
- Fabric Defect Detection
- On-Orbit Performance
- Resolution Limits
- Texture Analysis
- Camera Calibration
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Machine Vision122 topics
- Roughness Measurement101 topic
- Surface Characterization101 topic
- Dimensional Metrology41 topic
- Error Compensation41 topic
- Nanofabrication42 topics
- Antireflective Coatings21 topic
- Electron Beam Lithography21 topic
- Fabric Defect Detection21 topic
- Nanostructures21 topic
- On-Orbit Performance21 topic
- Radiometric Calibration21 topic
- Resolution Limits21 topic
- Scanning Electron Microscopy21 topic
- Texture Analysis21 topic
- X-ray Photoelectron Spectroscopy21 topic
- Camera Calibration11 topic
- Structured Light11 topic
Where does John C. Stover work?
John C. Stover's main affiliation in the publication record is The Scatter Works (United States), United States.
How many publications and citations does John C. Stover have?
Science Explorer counts 47 works and 76 citations for John C. Stover, ranking #234,861 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.