M. Texier
M. Texier publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics, on topics such as Silicon and Solar Cell Technologies, Advanced Surface Polishing Techniques and Advanced Materials Characterization Techniques.
- World rank
- #1,540,122 of 1,633,909 ranked researchers
- Rank in France
- #91,555 of 96,116
- Works
- 20
- Citations
- 19
- Citations per work
- 1.0
What does M. Texier research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering33% of their works
- 2Biomedical Engineering24% of their works
- 3Atomic and Molecular Physics, and Optics15% of their works
- 4Computational Mechanics9% of their works
- 5Materials Chemistry9% of their works
- 6Surfaces, Coatings and Films6% of their works
Research topics
- Silicon and Solar Cell Technologies
- Advanced Surface Polishing Techniques
- Advanced Materials Characterization Techniques
- Ion-surface interactions and analysis
- Thin-Film Transistor Technologies
- Semiconductor materials and interfaces
- Silicon Nanostructures and Photoluminescence
- Electron and X-Ray Spectroscopy Techniques
Which keywords describe M. Texier's research?
The keywords of their largest research topics: Solar Cells, Efficiency, Silicon, Chemical Mechanical Planarization, Material Removal Mechanism, Atom Probe Tomography, Ion Beam and Metal-Semiconductor Contacts.
- Scanning Electron Microscopy
- Nanoparticles
- Thin-Film Transistors
- Schottky Barrier
- Metal-Semiconductor Contacts
- Atom Probe Tomography
- Chemical Mechanical Planarization
- Efficiency
- Solar Cells
- Silicon
- Material Removal Mechanism
- Ion Beam
- Plasmonics
- Surface Analysis
- Three-Dimensional Analysis
- Porous Silicon
- X-ray Photoelectron Spectroscopy
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Solar Cells113 topics
- Efficiency51 topic
- Silicon51 topic
- Chemical Mechanical Planarization41 topic
- Material Removal Mechanism41 topic
- Atom Probe Tomography31 topic
- Ion Beam31 topic
- Metal-Semiconductor Contacts31 topic
- Plasmonics31 topic
- Schottky Barrier31 topic
- Surface Analysis31 topic
- Thin-Film Transistors31 topic
- Three-Dimensional Analysis31 topic
- Nanoparticles21 topic
- Porous Silicon21 topic
- Scanning Electron Microscopy21 topic
- X-ray Photoelectron Spectroscopy21 topic
Where does M. Texier work?
M. Texier's main affiliation in the publication record is Institut des Matériaux, de Microélectronique et des Nanosciences de Provence, France.
How many publications and citations does M. Texier have?
Science Explorer counts 20 works and 19 citations for M. Texier, ranking #1,540,122 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.