Ion-surface interactions and analysis

Ion-surface interactions and analysis is a research topic within Computational Mechanics. Science Explorer counts 50k research works in it since 1950. 9.9% of them reached the world's top 10% most cited for their field and year.

This cluster of papers focuses on the use of ion beam techniques, such as Secondary Ion Mass Spectrometry (SIMS) and swift heavy ions, for surface analysis, nanoscale patterning, and molecular imaging. It covers a wide range of applications including surface engineering, nanostructure fabrication, and depth profiling of biological samples.

• Ion Beam
• Surface Analysis
• Secondary Ion Mass Spectrometry
• Nanoscale Patterning
• Cluster Ion
• Time-of-Flight
• Molecular Imaging
• Swift Heavy Ions
• Surface Engineering
• Nanostructures