Most cited papers in Surface Roughness and Optical Measurements
What are the most cited papers in Surface Roughness and Optical Measurements?
The most cited paper in Surface Roughness and Optical Measurements is "Optical Constants of the Noble Metals" (P. B. Johnson, R. W. Christy, 1972), with 20,103 citations. Next come "A Concordance Correlation Coefficient to Evaluate Reproducibility" (8,920) and "An empirical correction for absorption anisotropy" (7,944).
Showing 50 of 98 papers. Every paper with more than 491 citations is listed.
| # | Paper | ||
|---|---|---|---|
| 1 | Optical Constants of the Noble Metals P. B. Johnson, R. W. Christy · Physical review. B, Solid state | 15 Dec 1972 | 20,103 |
| 2 | A Concordance Correlation Coefficient to Evaluate Reproducibility Lawrence I-Kuei Lin · Biometrics | Mar 1989 | 8,920 |
| 3 | An empirical correction for absorption anisotropy ROBERT H. BLESSING · Acta Crystallographica Section A Foundations of Crystallography | 1995 | 7,944 |
| 4 | Electron Spectroscopy Studies on Magneto-Optical Media and Plastic Substrate Interface Takehiko Yorozu, Mitsuhiro Hirano, Kunihiko Oka et al. · IEEE Translation Journal on Magnetics in Japan | Aug 1987 | 3,691 |
| 5 | Practical surface analysis Eberhard Umbach · TrAC Trends in Analytical Chemistry | May 1992 | 2,496 |
| 6 | X-ray and neutron scattering from rough surfaces Sunil Kumar Sinha, Eric B. Sirota, Stephen Garoff et al. · Physical review. B, Condensed matter | Aug 1988 | 2,421 |
| 7 | Applications of digital-image-correlation techniques to experimental mechanics Tsuchin Philip Chu, W. F. Ranson, Michael A. Sutton · Experimental Mechanics | Sep 1985 | 2,228 |
| 8 | Some fundamental properties of speckle* Joseph W. Goodman · Journal of the Optical Society of America | Nov 1976 | 2,119 |
| 9 | Roughness parameters E S Gadelmawla, M M Koura, T.M.A. Maksoud et al. · Journal of Materials Processing Technology | Apr 2002 | 1,952 |
| 10 | The scattering of electromagnetic waves from rough surfaces Martin Katzin · Proceedings of the IEEE | Nov 1964 | 1,894 |
| 11 | Simple technique for measurements of pulsed Gaussian-beam spot sizes J. M. Liu · Optics Letters | May 1982 | 1,892 |
| 12 | Digital Imaging Techniques In Experimental Stress Analysis W. H. Peters, W. F. Ranson · Optical Engineering | Jun 1982 | 1,863 |
| 13 | Optical constants of transition metals: Ti, V, Cr, Mn, Fe, Co, Ni, and Pd Pamela Johnson, Robert J. Christy · Physical review. B, Solid state | Jun 1974 | 1,748 |
| 14 | Die Bestimmung optischer Konstanten von Metallen durch Anregung von Oberflächenplasmaschwingungen Erwin Kretschmann · Zeitschrift für Physik A Hadrons and Nuclei | Aug 1971 | 1,693 |
| 15 | Magnetostatic modes of a ferromagnet slab R. W. Damon, J. R. Eshbach · Journal of Physics and Chemistry of Solids | May 1961 | 1,637 |
| 16 | Hill shading and the reflectance map Berthold K. P. Horn · Proceedings of the IEEE | 1981 | 1,373 |
| 17 | Laser-induced periodic surface structure. I. Theory John E. Sipe, Jeff F. Young, J. S. Prestón et al. · Physical review. B, Condensed matter | 15 Jan 1983 | 1,361 |
| 18 | Self-Organized Nanogratings in Glass Irradiated by Ultrashort Light Pulses Yasuhiko Shimotsuma, Peter G. Kazansky, Jiarong Qiu et al. · Physical Review Letters | 11 Dec 2003 | 1,285 |
| 19 | Disorder and the Optical-Absorption Edge of Hydrogenated Amorphous Silicon George D. Cody, Thomas Tiedje, B. Abeles et al. · Physical Review Letters | 16 Nov 1981 | 1,229 |
| 20 | Statistical ray optics Eli Yablonovitch · Journal of the Optical Society of America | Jul 1982 | 1,133 |
| 21 | Influence of Water Vapor on Crack Propagation in Soda‐Lime Glass Sheldon M. Wiederhorn · Journal of the American Ceramic Society | Aug 1967 | 1,127 |
| 22 | Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation Craig M. Herzinger, Blaine Johs, William A. McGahan et al. · Journal of Applied Physics | 15 Mar 1998 | 1,088 |
| 23 | Predicting surface roughness in machining: a review Panorios Benardos, George-Christopher Vosniakos · International Journal of Machine Tools and Manufacture | 24 Apr 2003 | 1,087 |
| 24 | Visible Light from Localized Surface Charges Moving across a Grating Stuart James Smith, Edward M. Purcell · Physical Review | 15 Nov 1953 | 1,051 |
| 25 | Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry D. E. Aspnes, J. B. Theeten, François Hottier · Physical review. B, Condensed matter | 15 Oct 1979 | 1,027 |
| 26 | Automated phase-measuring profilometry of 3-D diffuse objects V. S. Srinivasan, H. C. Liu, Maurice Halioua · Applied Optics | 15 Sep 1984 | 1,001 |
| 27 | A noise robust method based on completed local binary patterns for hot-rolled steel strip surface defects Kechen Song, Yunhui Yan · Applied Surface Science | 9 Sep 2013 | 992 |
| 28 | Role of Fractal Geometry in Roughness Characterization and Contact Mechanics of Surfaces Arun K. Majumdar, Bharat Bhushan · Journal of Tribology | Apr 1990 | 987 |
| 29 | Models of light reflection for computer synthesized pictures J.F. Blinn | 20 Jul 1977 | 979 |
| 30 | High-speed 3D shape measurement with structured light methods: A review Song Zhang · Optics and Lasers in Engineering | 18 Mar 2018 | 963 |
| 31 | Measuring and modeling anisotropic reflection Gregory J. Ward | Jul 1992 | 957 |
| 32 | IMD—Software for modeling the optical properties of multilayer films David L. Windt · Computers in Physics | Jul 1998 | 940 |
| 33 | The exchange-correlation energy of a metallic surface David C. Langreth, John P. Perdew · Solid State Communications | Dec 1975 | 917 |
| 34 | Radiation forces on a dielectric sphere in the Rayleigh scattering regime Yasuhiro Harada, Toshimitsu Asakura · Optics Communications | Mar 1996 | 910 |
| 35 | Determination of the concentration of surface hydroxyl groups on metal oxide films by a quantitative XPS method E. McCafferty, James P. Wightman · Surface and Interface Analysis | Jul 1998 | 900 |
| 36 | The properties of random surfaces of significance in their contact David J. Whitehouse, J. F. Archard · Proceedings of the Royal Society of London A Mathematical and Physical Sciences | 31 Mar 1970 | 898 |
| 37 | X-ray and neutron reflectivity for the investigation of polymers Thomas P. Russell · Materials Science Reports | 1990 | 893 |
| 38 | Segmentation-based deep-learning approach for surface-defect detection Domen Tabernik, Samo Šela, Jure Skvarč et al. · Journal of Intelligent Manufacturing | 15 May 2019 | 883 |
| 39 | Thin-film peeling-the elastic term K. Kendall · Journal of Physics D Applied Physics | 11 Sep 1975 | 878 |
| 40 | Surface roughness analysis, modelling and prediction in selective laser melting G. Strano, Liang Hao, Richard Everson et al. · Journal of Materials Processing Technology | 23 Nov 2012 | 875 |
| 41 | On the nature of surface roughness with application to contact mechanics, sealing, rubber friction and adhesion B N J Persson, O Albohr, U Tartaglino et al. · Journal of Physics Condensed Matter | 11 Dec 2004 | 870 |
| 42 | Characterization of diamondlike carbon films and their application as overcoats on thin-film media for magnetic recording Hsiao‐chu Tsai, David B. Bogy · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films | Nov 1987 | 851 |
| 43 | A TM Tasseled Cap equivalent transformation for reflectance factor data Eric P. Crist · Remote Sensing of Environment | Jun 1985 | 841 |
| 44 | General transfer-matrix method for optical multilayer systems with coherent, partially coherent, and incoherent interference C. Katsidis, Dimitrios I. Siapkas · Applied Optics | Jul 2002 | 831 |
| 45 | State of the Art in Defect Detection Based on Machine Vision Zhonghe Ren, Fengzhou Fang, Ning Yan et al. · International Journal of Precision Engineering and Manufacturing-Green Technology | 26 May 2021 | 800 |
| 46 | Fractal characterization and simulation of rough surfaces Arun K. Majumdar, C. L. Tien · Wear | Mar 1990 | 794 |
| 47 | A New Method Using Hexamethyldisilazane for Preparation of Soft Insect Tissues for Scanning Electron Microscopy James L. Nation · Stain Technology | 1983 | 782 |
| 48 | On Rayleigh Optical Depth Calculations Barry A. Bodhaine, Norman B. Wood, Ellsworth G Dutton et al. · Journal of Atmospheric and Oceanic Technology | Nov 1999 | 764 |
| 49 | Resistivity of polycrystalline zinc oxide films: current status and physical limit K. Ellmer · Journal of Physics D Applied Physics | 23 Oct 2001 | 764 |
| 50 | Computer-Vision-Based Fabric Defect Detection: A Survey Ajay Kumar · IEEE Transactions on Industrial Electronics | 2008 | 728 |
Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for a field when OpenAlex files it under one of the field's topics; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.