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Most cited papers from MCNC Research and Development Institute

What are the most cited papers from MCNC Research and Development Institute?

The most cited paper from MCNC Research and Development Institute is "Thin-Film Permeation-Barrier Technology for Flexible Organic Light-Emitting Devices" (John S. Lewis, Michael S. Weaver, 2004), with 503 citations. Next come "Rotary traveling-wave oscillator arrays: a new clock technology" (298) and "MOCVD of Bi2Te3, Sb2Te3 and their superlattice structures for thin-film thermoelectric applications" (287).

Showing 50 of 60 papers. Every paper with more than 50 citations is listed.

Most cited papers, sortable by citations and release date
#Paper
1 Thin-Film Permeation-Barrier Technology for Flexible Organic Light-Emitting Devices John S. Lewis, Michael S. Weaver · IEEE Journal of Selected Topics in Quantum Electronics 2004 503
2 Rotary traveling-wave oscillator arrays: a new clock technology John Wood, Terry C. Edwards, Steve Lipa · IEEE Journal of Solid-State Circuits 2001 298
3 MOCVD of Bi2Te3, Sb2Te3 and their superlattice structures for thin-film thermoelectric applications R. Venkatasubramanian, T.S. Colpitts, E. Watko et al. · Journal of Crystal Growth 1997 287
4 Highly flexible transparent electrodes for organic light-emitting diode-based displays Jay S. Lewis, Sonia Grego, Babu R. Chalamala et al. · Applied Physics Letters 18 Oct 2004 267
5 A VLSI fuzzy logic controller with reconfigurable, cascadable architecture Hiroyuki Watanabe, W.D. Dettloff, K.E. Yount · IEEE Journal of Solid-State Circuits Apr 1990 262
6 Mechanism of negative-bias-temperature instability C. E. Blat, Edward H. Nicollian, Edward H. Poindexter · Journal of Applied Physics Feb 1991 243
7 Modeling Rapid Thermal Diffusion of Arsenic and Boron in Silicon Richard B. Fair, J. J. Wortman, J. Liu · Journal of The Electrochemical Society Oct 1984 158
8 Contribution of electrodes and microstructures to the electrical properties of Pb(Zr0.53Ti0.47)O3 thin film capacitors Husam Niman Alshareef, Angus I. Kingon, X. Chen et al. · Journal of materials research/Pratt's guide to venture capital sources Nov 1994 157
9 Influence of platinum interlayers on the electrical properties of RuO2/Pb(Zr0.53Ti0.47)O3/RuO2 capacitor heterostructures Husam Niman Alshareef, K. R. Bellur, Angus I. Kingon et al. · Applied Physics Letters 9 Jan 1995 147
10 Oriented ferroelectric La-Sr-Co-O/Pb-La-Zr-Ti-O/La-Sr-Co-O heterostructures on [001] Pt/SiO2 Si substrates using a bismuth titanate template layer Ramamoorthy Ramesh, J. Lee, Tim D. Sands et al. · Applied Physics Letters 9 May 1994 144
11 Mechanisms of amorphization and recrystallization in ion implanted III–V compound semiconductors D. K. Sadana · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms Mar 1985 138
12 Identification of ground targets from sequential high-range-resolution radar signatures Xuejun Liao, Paul R. Runkle, Lawrence Carin · IEEE Transactions on Aerospace and Electronic Systems Oct 2002 129
13 Low-temperature organometallic epitaxy and its application to superlattice structures in thermoelectrics R. Venkatasubramanian, T.S. Colpitts, Brooks O’Quinn et al. · Applied Physics Letters 23 Aug 1999 129
14 Chemical Vapor Deposition of Copper from Copper (II) Hexafluoroacetylacetonate Dorota S. Temple, Arnold Reisman · Journal of The Electrochemical Society Open access Nov 1989 127
15 Characterizing intrusion tolerant systems using a state transition model Katerina Goševa-Popstojanova, Feiyi Wang, Rong Wang et al. Conference paper 13 Nov 2002 121
16 Formation of epitaxial CoSi2 films on (001) silicon using Ti-Co alloy and bimetal source materials S. L. Hsia, Teng Yong Tan, Peter Smith et al. · Journal of Applied Physics 15 Dec 1991 120
17 Spectroscopic ellipsometry: A new tool for nondestructive depth profiling and characterization of interfaces Patrick J. McMarr, Kuppuswami Vedam, J. Narayan · Journal of Applied Physics Feb 1986 113
18 Residual defects following rapid thermal annealing of shallow boron and boron fluoride implants into preamorphized silicon C. Carter, W. Maszara, D. K. Sadana et al. · Applied Physics Letters 15 Feb 1984 105
19 Defect annihilation in shallow p+ junctions using titanium silicide D. S. Wen, P. L. Smith, C. M. Osburn et al. · Applied Physics Letters 12 Oct 1987 104
20 Geographical Data Structures Compared: A Study of Data Structures Supporting Region Queries Jonathan B. Rosenberg · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 1985 103
21 Optimum and suboptimum algorithms for input encoding and its relationship to logic minimization Shipin Yang, Maciej J. Ciesielski · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 1991 97
22 Testability-Driven Random Test-Pattern Generation R. Lisanke, F. Brglez, A.J. de Geus et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Nov 1987 96
23 Hardware-based weighted random pattern generation for boundary scan F. Brglez, Clay Gloster, Gershon Kedem Conference paper 13 Jan 2003 94
24 Simulation of arbitrary transmission line networks with nonlinear terminations D. Winklestein, Michael B. Steer, R. Pomerleau · IEEE Transactions on Circuits and Systems Apr 1991 89
25 Electrodes for ferroelectric thin films Husam Niman Alshareef, K. D. Gifford, Shang Hsien Rou et al. · Integrated ferroelectrics Dec 1993 87
26 The effect of ion-implantation damage on dopant diffusion in silicon during shallow-junction formation Yudong Kim, Hisham Z. Massoud, Richard B. Fair · Journal of Electronic Materials Mar 1989 84
27 Analysis of the effects of scaling on interconnect delay in ULSI circuits Shilpa Bothra, Bridget R. Rogers, Mark D. Kellam et al. · IEEE Transactions on Electron Devices Mar 1993 83
28 Benchmarks for layout synthesis---evolution and current status Krzysztof Koźmiński Conference paper 1991 82
29 Rapid thermal annealing of arsenic and boron-implanted silicon J. Narayan, O. W. Holland, Robert E. Eby et al. · Applied Physics Letters 15 Nov 1983 82
30 Control of structure and electrical properties of lead-zirconium-titanate-based ferroelectric capacitors produced using a layer-by-layer ion beam sputter-deposition technique Orlando H. Auciello, K. D. Gifford, Angus I. Kingon · Applied Physics Letters 23 May 1994 82
31 Radiation‐Induced Neutral Electron Trap Generation in Electrically Biased Insulated Gate Field Effect Transistor Gate Insulators Mark D. Walters, Arnold Reisman · Journal of The Electrochemical Society Open access Sep 1991 81
32 Influence of Dynamic Gap Junction Resistance on Impulse Propagation in Ventricular Myocardium: A Computer Simulation Study Alexandra P. Henriquez, Rolf Vogel, Barbara J. Muller-Borer et al. · Biophysical Journal Open access Oct 2001 79
33 Lung Models: Strengths and Limitations T.B. Martonen, Cynthia J. Musante, Rebecca A. Segal et al. · Respiratory Care Jun 2000 76
34 On the physical and logical topology design of large-scale optical networks Yufeng Xin, George N. Rouskas, Harry G. Perros · Journal of Lightwave Technology Apr 2003 70
35 A new MOS-gated power thyristor structure with turn-off achieved by controlling the base resistance Mahalingam Nandakumar, B. Jayant Baliga, M.S. Shekar et al. · IEEE Electron Device Letters May 1991 68
36 Germanium Implantation into Silicon: An Alternate Pre‐Amorphization/Rapid Thermal Annealing Procedure for Shallow Junction Formation D. K. Sadana, W. Maszara, J. J. Wortmann et al. · Journal of The Electrochemical Society Open access Apr 1984 67
37 Rapid thermal curing of BCB dielectric Phil E. Garrou, Robert H. Heistand, Mitchell G. Dibbs et al. · IEEE Transactions on Components Hybrids and Manufacturing Technology 1993 67
38 Point Defect Charge‐State Effects on Transient Diffusion of Dopants in Si Richard B. Fair · Journal of The Electrochemical Society Open access Feb 1990 67
39 Incorporation of metal silicides and refractory metals in VLSI technology C. M. Osburn, Q.F. Wang, Mark D. Kellam et al. · Applied Surface Science Nov 1991 65
40 Characteristics of the emitter-switched thyristor M.S. Shekar, B. Jayant Baliga, Mahalingam Nandakumar et al. · IEEE Transactions on Electron Devices Jul 1991 64
41 BLITZEN: A highly integrated massively parallel machine Donald W. Blevins, Edward W. Dams, Robert A. Heaton et al. · Journal of Parallel and Distributed Computing Open access Feb 1990 64
42 Just-in-time optical burst switching implementation in the atdnet all-optical networking testbed Ilya Baldin, Mark Cassada, Arnold W. Bragg et al. Conference paper 8 Jul 2004 62
43 The effect of deposition parameters on the properties of yttria-stabilized zirconia thin films David E Ruddell, Brian R. Stoner, Jeffrey Y. Thompson · Thin Solid Films Nov 2003 62
44 Density-functional calculations of the structure and stability of C240 Darrin M. York, Jian Ping Lu, Weitao Yang · Physical review. B, Condensed matter 15 Mar 1994 62
45 Ultra-shallow junction formation using silicide as a diffusion source and low thermal budget Q. Wang, C. M. Osburn, C. A. Canovai · IEEE Transactions on Electron Devices 1992 60
46 Phase evolution and annealing effects on the electrical properties of Pb(Zr0.53Ti0.47)O3 thin films with RuO2 electrodes Husam Niman Alshareef, K. R. Bellur, Orlando H. Auciello et al. · Thin Solid Films Feb 1995 60
47 Challenges to manufacturing submicron, ultra-large scale integrated circuits Richard B. Fair · Proceedings of the IEEE 1990 60
48 Characterization of conduction in PZT thin films produced by laser ablation deposition X. Chen, Angus I. Kingon, Lucy-Marie Mantese et al. · Integrated ferroelectrics Dec 1993 56
49 Generation and annealing of defects in silicon dioxide Arnold Reisman, C. Kenneth Williams, José R. Maldonado · Journal of Applied Physics Aug 1987 54
50 Synthesis and characterization of Pb (ZrxTi1−x)O3 thin films produced by an automated laser ablation deposition technique Orlando H. Auciello, Lucy-Marie Mantese, J. Duarte et al. · Journal of Applied Physics 15 May 1993 54

Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.