Most cited papers from PrimeNano (united States)
What are the most cited papers from PrimeNano (united States)?
The most cited paper from PrimeNano (united States) is "Practical quantitative scanning microwave impedance microscopy" (Oskar Amster, Fred E. Stanke, Stuart Friedman et al., 2017), with 17 citations. Next come "Scanning Microwave Impedance Microscopy (sMIM) in Electronic and Quantum Materials" (11) and "Scanning Microwave Impedance Microscopy: Room-Temperature and Low-Temperature Applications for Device and Material Characterization" (10).
Showing 19 of 19 papers. Every paper is listed.
| # | Paper | ||
|---|---|---|---|
| 1 | Practical quantitative scanning microwave impedance microscopy Oskar Amster, Fred E. Stanke, Stuart Friedman et al. · Microelectronics Reliability | 26 Jul 2017 | 17 |
| 2 | Scanning Microwave Impedance Microscopy (sMIM) in Electronic and Quantum Materials Kurt A. Rubin, Yongliang Yang, Oskar Amster et al. · Nanoscience and technology | 2019 | 11 |
| 3 | Scanning Microwave Impedance Microscopy: Room-Temperature and Low-Temperature Applications for Device and Material Characterization Ravi Chandra Chintala, Kurt A. Rubin, Yongliang Yang · IEEE Microwave Magazine | 4 Sep 2020 | 10 |
| 4 | Recent advances in scanning Microwave Impedance Microscopy (sMIM) for nano-scale measurements and industrial applications Stuart Friedman, Oskar Amster, Yongliang Yang · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE | 27 Aug 2014 | 8 |
| 5 | Characterizing non-linear microwave behavior of semiconductor materials with Scanning Microwave Impedance Microscopy Stuart Friedman, Yongliang Yang, Oskar Amster et al. | May 2016 | 5 |
| 6 | Practical quantitative scanning microwave impedance microscopy of semiconductor devices Oskar Amster, Yongliang Yang, Benedict Drevniok et al. | Jul 2017 | 4 |
| 7 | Application of Scanning Microwave Microscopy nano-C-V to investigate dopant defect under a poly gate device Oskar Amster, Kurt A. Rubin, Yong‐Liang Yang et al. · Microelectronics Reliability | Sep 2018 | 3 |
| 8 | Advances in Scanning Microwave Impedance Microscopy Ravi Chandra Chintala, Yongliang Yang · Microscopy and Microanalysis | 30 Jul 2020 | 2 |
| 9 | The EDFAS FA Technology Roadmap—FA Future Roadmap Nicholas Antoniou, Brendan J. Foran · EDFA Technical Articles | May 2023 | 1 |
| 10 | Nanoscale Capacitance and Capacitance-Voltage Curves for Advanced Characterization of Electrical Properties of Silicon and GaN Structures Using Scanning Microwave Impedance Microscopy (sMIM) Oskar Amster, Stuart Friedman, Yongliang Yang et al. · EDFA Technical Articles | Nov 2017 | 1 |
| 11 | Nanoscale Capacitance and Capacitance-Voltage Curves for Advanced Characterization of Electrical Properties of Si and GaN Structures Using Scanning Microwave Impedance Microscopy Stuart Friedman, Oskar Amster, Yongliang Yang et al. · Proceedings - International Symposium for Testing and Failure Analysis | Nov 2016 | 1 |
| 12 | Measurement of Dielectric Constant and Doping Concentration of a Cross-Sectioned Device by Quantitative Scanning Microwave Impedance Microscopy D. Iyer, A. Messinger, R. Crowder et al. · Proceedings - International Symposium for Testing and Failure Analysis | Nov 2017 | 1 |
| 13 | Device Dielectric Quality Analysis and Fault Isolation at the Contact Level by Scanning Microwave Impedance Microscopy Wei‐Shan Hu, Jeng-Han Lee, Ming-Hong Kao et al. · Proceedings - International Symposium for Testing and Failure Analysis | Nov 2016 | 1 |
| 14 | Failure Analysis Future Roadmap Nicholas Antoniou · ASM International eBooks | Nov 2023 | 0 |
| 15 | Scanning Microwave Impedance Microscopy: Overview and Low Temperature Operation Nicholas Antoniou · EDFA Technical Articles | Feb 2023 | 0 |
| 16 | The EDFAS FA Technology Roadmap—Advancing Our Community Nicholas Antoniou · EDFA Technical Articles | May 2022 | 0 |
| 17 | Scanning microwave impedance microscopy (sMIM) for materials characterization and metrology Nicholas Antoniou, Ravi Chandra Chintala, Yongliang Yang · Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV | 19 Feb 2021 | 0 |
| 18 | Finite-Element Modeling and Quantitative Measurement Using Scanning Microwave Microscopy to Characterize Dielectric Films Kurt A. Rubin, W. Jolley, Yongliang Yang · Proceedings - International Symposium for Testing and Failure Analysis | Nov 2018 | 0 |
| 19 | Nano C-V imaging of Semiconductor Devices with Scanning Microwave Impedance Microscopy Oskar Amster, Kurt A. Rubin, Yongliang Yang et al. | Jul 2018 | 0 |
Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.