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Institution · United Microelectronics (Taiwan)

Most cited papers from United Microelectronics (Taiwan)

United Microelectronics (Taiwan)

What are the most cited papers from United Microelectronics (Taiwan)?

The most cited paper from United Microelectronics (Taiwan) is "A green supplier selection model for high-tech industry" (Amy H.I. Lee, He‐Yau Kang, Chang-Fu Hsu et al., 2008), with 799 citations. Next come "Structural characterization of nano-sized calcium deficient apatite powders" (191) and "High-density MIM capacitors using Al2O3 and AlTiOx dielectrics" (168).

Showing 50 of 61 papers. Every paper with more than 33 citations is listed.

Most cited papers, sortable by citations and release date
#Paper
1 A green supplier selection model for high-tech industry Amy H.I. Lee, He‐Yau Kang, Chang-Fu Hsu et al. · Expert Systems with Applications 9 Dec 2008 799
2 Structural characterization of nano-sized calcium deficient apatite powders Sz‐Chian Liou, San‐Yuan Chen, Hsin‐Yi Lee et al. · Biomaterials 24 Oct 2003 191
3 High-density MIM capacitors using Al2O3 and AlTiOx dielectrics S.B. Chen, Chyong‐Huey Lai, Albert Chin et al. · IEEE Electron Device Letters Apr 2002 168
4 Optimization of multiple responses using principal component analysis and technique for order preference by similarity to ideal solution Lee‐Ing Tong, Chung‐Ho Wang, Hung-Cheng Chen · The International Journal of Advanced Manufacturing Technology 6 Jul 2004 141
5 Structural characterization of room-temperature synthesized nano-sized β-tricalcium phosphate Jong-Shing Bow, Sz‐Chian Liou, San‐Yuan Chen · Biomaterials 10 Dec 2003 132
6 A 130 mV SRAM With Expanded Write and Read Margins for Subthreshold Applications Meng‐Fan Chang, Shi-Wei Chang, Po-Wei Chou et al. · IEEE Journal of Solid-State Circuits 11 Dec 2010 125
7 K-band low-noise amplifiers using 0.18 /spl mu/m CMOS technology Kyung-Wan Yu, Yin-Lung Lu, Da‐Chiang Chang et al. · IEEE Microwave and Wireless Components Letters Mar 2004 92
8 Dynamic multiple responses by ideal solution analysis Lee‐Ing Tong, Chung‐Ho Wang, Chih‐Chien Chen et al. · European Journal of Operational Research 5 Apr 2003 85
9 Mechanism of Nonlinear Switching in HfO2-Based Crossbar RRAM With Inserting Large Bandgap Tunneling Barrier Layer Umesh Chand, Kuan-Chang Huang, Chun-Yang Huang et al. · IEEE Transactions on Electron Devices 10 Sep 2015 82
10 Effective repair to ultra-low- k dielectric material ( k ∼2.0) by hexamethyldisilazane treatment Y. S. Mor, Ting‐Chang Chang, Po‐Tsun Liu et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Jul 2002 81
11 Current crowding-induced electromigration in SnAg3.0Cu0.5 microbumps Kuo‐Ning Chiang, Chien Chen Lee, Chang‐Chun Lee et al. · Applied Physics Letters 10 Feb 2006 76
12 $K$-Band CMOS Differential and Quadrature Voltage-Controlled Oscillators for Low Phase-Noise and Low-Power Applications Hong‐Yeh Chang, Yuan-Ta Chiu · IEEE Transactions on Microwave Theory and Techniques 5 Dec 2011 75
13 Photoluminescent characterization of KNbO3:Eu3+ Te‐Hua Fang, Yu‐Jen Hsiao, Yee‐Shin Chang et al. · Materials Chemistry and Physics 24 Feb 2006 75
14 Electromigration of Sn–37Pb and Sn–3Ag–1.5Cu/Sn–3Ag–0.5Cu composite flip–chip solder bumps with Ti/Ni(V)/Cu under bump metallurgy Yi‐Shao Lai, Kuo-Ming Chen, Chin-Li Kao et al. · Microelectronics Reliability 4 Nov 2006 73
15 Full-Chip Routing Considering Double-Via Insertion Huang-Yu Chen, Mei-Fang Chiang, Yao‐Wen Chang et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 23 Apr 2008 67
16 Does Value Congruence Lead to Voice? Cooperative Voice and Cooperative Silence under Team and Differentiated Transformational Leadership An-Chih Wang, Hsu-Hung Hsieh, Chou‐Yu Tsai et al. · Management and Organization Review Sep 2011 64
17 A 2-ns detecting time, 2- mu m CMOS built-in current sensing circuit Tung-Li Shen, James C. Daly, Jien-Chung Lo · IEEE Journal of Solid-State Circuits Open access 1993 61
18 The observation of trapping and detrapping effects in high-k gate dielectric MOSFETs by a new gate current Random Telegraph Noise (IG-RTN) approach Chian-Sern Chang, Steve Shao-Shiun Chung, Y. S. Hsieh et al. Conference paper Dec 2008 60
19 Accurate Systematic Model-Parameter Extraction for On-Chip Spiral Inductors Hao-Hui Chen, Huai-Wen Zhang, Shyh‐Jong Chung et al. · IEEE Transactions on Electron Devices Nov 2008 57
20 A Tri-Band Bandpass Filter With Wide Stopband Using Asymmetric Stub-Loaded Resonators Siang‐Wen Lan, Min‐Hang Weng, Shoou‐Jinn Chang et al. · IEEE Microwave and Wireless Components Letters 5 Nov 2014 57
21 Effects of underfill materials on the reliability of low-K flip-chip packaging K.M. Chen, Don Son Jiang, Nicholas Kao et al. · Microelectronics Reliability 15 Jun 2005 56
22 Electromigration Lifetime Improvement of Copper Interconnect by Cap/Dielectric Interface Treatment and Geometrical Design Ming‐Hsien Lin, Y.L. Lin, J.M. Chen et al. · IEEE Transactions on Electron Devices Dec 2005 54
23 High-Performance Plasmonic Nanolasers with a Nanotrench Defect Cavity for Sensing Applications Pi-Ju Cheng, Zhen‐Ting Huang, Jhu-Hong Li et al. · ACS Photonics 19 Mar 2018 51
24 Investigation of thermal stability and reliability of HfO2 based resistive random access memory devices with cross-bar structure Umesh Chand, Kuan-Chang Huang, Chun-Yang Huang et al. · Journal of Applied Physics 14 May 2015 51
25 40-GHz coplanar waveguide bandpass filters on silicon substrate K.T. Chan, C.Y. Chen, Albert Chin et al. · IEEE Microwave and Wireless Components Letters Nov 2002 49
26 Big data analytics energy-saving strategies for air compressors in the semiconductor industry – an empirical study Kuo-Hao Chang, Yi-Jyun Sun, Chi-An Lai et al. · International Journal of Production Research 12 Jan 2021 48
27 Frequency-dependent capacitance reduction in high-k AlTiOx and Al2O3 gate dielectrics from IF to RF frequency range S.B. Chen, Chyong‐Huey Lai, K.T. Chan et al. · IEEE Electron Device Letters Apr 2002 46
28 An Integrated Wideband Power Amplifier for Cognitive Radio Yi‐Jan Emery Chen, Liyuan Yang, Wei-Chin Yeh · IEEE Transactions on Microwave Theory and Techniques Oct 2007 46
29 Mechanism of Threshold Voltage Shift (ΔVth) Caused by Negative Bias Temperature Instability (NBTI) in Deep Submicron pMOSFETs Chuan-Hsi Liu, Ming T. Lee, Chih-yung Lin et al. · Japanese Journal of Applied Physics 30 Apr 2002 45
30 Two-way shape memory effect of NiTi alloy induced by constraint aging treatment at room temperature Ching-Yig Chang, David Vokoun, Chen‐Ti Hu · Metallurgical and Materials Transactions A Jul 2001 45
31 A new experimental method to determine the saturation voltage of a small-geometry MOSFET Wen-Yueh Jang, Chung‐Yu Wu, Hong-Jen Wu · Solid-State Electronics Sep 1988 43
32 Embedded Memory and ARM Cortex-M0 Core Using 60-nm C-Axis Aligned Crystalline Indium–Gallium–Zinc Oxide FET Integrated With 65-nm Si CMOS Tatsuya Onuki, Wataru Uesugi, Atsuo Isobe et al. · IEEE Journal of Solid-State Circuits 4 Jan 2017 42
33 An H.264/AVC scalable extension and high profile HDTV 1080p encoder chip Yi‐Hau Chen, T. J. Chuang, Yu-Jen Chen et al. Conference paper Jun 2008 42
34 TRIZ-based trimming for process-machine improvements: Slit-valve innovative redesign Dongliang Daniel Sheu, Chun Ting Hou · Computers & Industrial Engineering 13 Feb 2013 42
35 From IC Layout to Die Photograph: A CNN-Based Data-Driven Approach Hao-Chiang Shao, Chao-Yi Peng, Jun-Rei Wu et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Open access 10 Aug 2020 41
36 The effects of NH3 plasma passivation on polysilicon thin-film transistors Fang-Hsing Wang, Meng-Jin Tsai, Huang‐Chung Cheng · IEEE Electron Device Letters Nov 1995 41
37 Alloy effects on the Raman spectra of Si1 xGexand calibration protocols for alloy compositions based on polarization measurements Shyama Rath, M L Hsieh, P. Etchegoin et al. · Semiconductor Science and Technology Open access 7 May 2003 41
38 High performance 50 nm CMOS devices for microprocessor and embedded processor core applications Shih-Fen Huang et al. Conference paper 13 Nov 2002 39
39 Metal induced crystallized poly-Si-based conductive bridge resistive switching memory device with one transistor and one resistor architecture Umesh Chand, Chun-Yang Huang, Dayanand Kumar et al. · Applied Physics Letters 16 Nov 2015 39
40 Design of Power-Rail ESD Clamp Circuit With Ultra-Low Standby Leakage Current in Nanoscale CMOS Technology Chang-Tzu Wang, Ming‐Dou Ker · IEEE Journal of Solid-State Circuits 26 Feb 2009 39
41 Copper pillar bump design optimization for lead free flip-chip packaging K. M. Chen, Te‐Sheng Lin · Journal of Materials Science Materials in Electronics 14 May 2009 39
42 Voltage references for ultra-low supply voltages Peter R. Kinget, Christos Vezyrtzis, E. Chiang et al. Conference paper Sep 2008 38
43 Detection and estimation of DOA's of signals via Bayesian predictive densities Chao-Ming Cho, Petar M. Djurić · IEEE Transactions on Signal Processing 1994 38
44 ESD Protection Design With Lateral DMOS Transistor in 40-V BCD Technology Chang-Tzu Wang, Ming‐Dou Ker · IEEE Transactions on Electron Devices 19 Oct 2010 38
45 Implementation of the CMOS MEMS Condenser Microphone with Corrugated Metal Diaphragm and Silicon Back-Plate Chien‐Hsin Huang, Chien-Hsing Lee, Tsung-Min Hsieh et al. · Sensors Open access 10 Jun 2011 38
46 Fast Evaluation of the High-Frequency Channel Noise in Nanoscale MOSFETs Xuesong Chen, Chih‐Hung Chen, Ryan Lee · IEEE Transactions on Electron Devices Mar 2018 37
47 A Compact-Area Low-VDDmin 6T SRAM With Improvement in Cell Stability, Read Speed, and Write Margin Using a Dual-Split-Control-Assist Scheme Meng‐Fan Chang, Chien-Fu Chen, Ting-Hao Chang et al. · IEEE Journal of Solid-State Circuits 23 May 2017 37
48 RF passive devices on Si with excellent performance close to ideal devices designed by electro-magnetic simulation Albert Chin, K.T. Chan, Chao-Jen Huang et al. Conference paper 22 Mar 2004 37
49 DESIGN OF THE COMPACT PARALLEL-COUPLED LINES WIDEBAND BANDPASS FILTERS USING IMAGE PARAMETER METHOD Chang‐Sin Ye, Yan‐Kuin Su, Min‐Hang Weng et al. · Electromagnetic waves Open access 2010 37
50 Investigation of Reliability Characteristics in NMOS and PMOS FinFETs Wen‐Shiang Liao, Yie-Gie Liaw, Mao-Chyuan Tang et al. · IEEE Electron Device Letters Jul 2008 37

Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.