Francois M. Mottier
Francois M. Mottier publishes mostly in Computer Vision and Pattern Recognition, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, on topics such as Optical measurement and interference techniques, Advanced Measurement and Metrology Techniques and Digital Holography and Microscopy.
- World rank
- #2,648,885 of 7,710,434 ranked researchers
- Rank in Switzerland
- #40,332 of 80,918
- Works
- 32
- Citations
- 577
- Citations per work
- 18.0
What does Francois M. Mottier research?
Francois M. Mottier's work is mostly in Engineering (45%), Computer Science (18%), Physics and Astronomy (17%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2680.7%
- Engineering1545.5%
- Computer Science618.2%
- Physics and Astronomy517.0%
- Everything else619.3%
- 1Computer Vision and Pattern Recognition18% of their works
- 2Atomic and Molecular Physics, and Optics17% of their works
- 3Electrical and Electronic Engineering15% of their works
- 4Mechanical Engineering12% of their works
- 5Computational Mechanics9% of their works
- 6Media Technology9% of their works
Research topics
- Optical measurement and interference techniques
- Advanced Measurement and Metrology Techniques
- Digital Holography and Microscopy
- Advanced Optical Imaging Technologies
- Surface Roughness and Optical Measurements
- Optical Systems and Laser Technology
- Semiconductor Lasers and Optical Devices
- Advanced Fiber Optic Sensors
Which keywords describe Francois M. Mottier's research?
The keywords of their largest research topics: Camera Calibration, Structured Light, Dimensional Metrology, Error Compensation, Digital Holographic Microscopy, Quantitative Phase Imaging, Holographic Displays and Stereoscopic Displays.
- Semiconductor Lasers
- Optical Fiber
- Surface Characterization
- Roughness Measurement
- Stereoscopic Displays
- Quantitative Phase Imaging
- Error Compensation
- Structured Light
- Camera Calibration
- Dimensional Metrology
- Digital Holographic Microscopy
- Holographic Displays
- Laser
- Semiconductor
- Fiber Optic Sensors
- Optical Interconnects
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Camera Calibration151 topic
- Structured Light151 topic
- Dimensional Metrology111 topic
- Error Compensation111 topic
- Digital Holographic Microscopy91 topic
- Quantitative Phase Imaging91 topic
- Holographic Displays81 topic
- Stereoscopic Displays81 topic
- Laser41 topic
- Roughness Measurement41 topic
- Semiconductor41 topic
- Surface Characterization41 topic
- Fiber Optic Sensors21 topic
- Optical Fiber21 topic
- Optical Interconnects21 topic
- Semiconductor Lasers21 topic
Where does Francois M. Mottier work?
Francois M. Mottier's main affiliation in the publication record is ABB (Switzerland), Switzerland.
How many publications and citations does Francois M. Mottier have?
OpenAlex counts 32 works and 577 citations for Francois M. Mottier, an h-index of 9, ranking #2,648,885 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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