Geoff Dearnaley
Geoff Dearnaley publishes mostly in Materials Chemistry, Electrical and Electronic Engineering and Computational Mechanics, on topics such as Ion-surface interactions and analysis, Metal and Thin Film Mechanics and Diamond and Carbon-based Materials Research.
- World rank
- #709,457 of 7,710,434 ranked researchers
- Rank in United Kingdom
- #59,697 of 367,258
- Works
- 214
- Citations
- 5.3k
- Citations per work
- 24.9
What does Geoff Dearnaley research?
Geoff Dearnaley's work is mostly in Engineering (47%), Materials Science (17%), Physics and Astronomy (8%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences15572.6%
- Engineering10147.2%
- Materials Science3717.3%
- Physics and Astronomy178.1%
- Everything else5927.4%
- 1Materials Chemistry17% of their works
- 2Electrical and Electronic Engineering17% of their works
- 3Computational Mechanics13% of their works
- 4Mechanics of Materials12% of their works
- 5Radiation8% of their works
- 6Mechanical Engineering6% of their works
Research topics
- Ion-surface interactions and analysis
- Metal and Thin Film Mechanics
- Diamond and Carbon-based Materials Research
- Semiconductor materials and devices
- Silicon and Solar Cell Technologies
- Radiation Detection and Scintillator Technologies
- Nuclear Physics and Applications
- Integrated Circuits and Semiconductor Failure Analysis
Which keywords describe Geoff Dearnaley's research?
The keywords of their largest research topics: Ion Beam, Surface Analysis, Nanoindentation, Thin Films, Nanodiamonds, Quantum Sensing, Atomic Layer Deposition and High-k Dielectrics.
- Integrated Circuits
- Small-Angle Scattering
- Solar Cells
- Scintillation Detectors
- High-k Dielectrics
- Quantum Sensing
- Thin Films
- Surface Analysis
- Ion Beam
- Nanoindentation
- Nanodiamonds
- Atomic Layer Deposition
- Inorganic Scintillators
- Silicon
- Neutron Imaging
- Failure Analysis
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Ion Beam751 topic
- Surface Analysis751 topic
- Nanoindentation691 topic
- Thin Films691 topic
- Nanodiamonds371 topic
- Quantum Sensing371 topic
- Atomic Layer Deposition341 topic
- High-k Dielectrics341 topic
- Inorganic Scintillators231 topic
- Scintillation Detectors231 topic
- Silicon231 topic
- Solar Cells231 topic
- Neutron Imaging191 topic
- Small-Angle Scattering191 topic
- Failure Analysis181 topic
- Integrated Circuits181 topic
Where does Geoff Dearnaley work?
Geoff Dearnaley's main affiliation in the publication record is Research Complex at Harwell, United Kingdom.
How many publications and citations does Geoff Dearnaley have?
OpenAlex counts 214 works and 5,320 citations for Geoff Dearnaley, an h-index of 37, ranking #709,457 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
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