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Topic · Electrical and Electronic Engineering

Integrated Circuits and Semiconductor Failure Analysis

Integrated Circuits and Semiconductor Failure Analysis is a research topic within Electrical and Electronic Engineering. Science Explorer counts 56k research works in it since 1950. 9.9% of them reached the world's top 10% most cited for their field and year.

This cluster of papers focuses on advanced techniques and methodologies for failure analysis of integrated circuits. It covers a wide range of topics including photon emission microscopy, laser voltage probing, backside analysis, nanoprobing, fault localization, time-resolved imaging, and electrical characterization. The papers explore innovative approaches to identify and analyze failures in CMOS circuits and other semiconductor devices.

  • Failure Analysis
  • Integrated Circuits
  • Photon Emission Microscopy
  • Laser Voltage Probing
  • Backside Analysis
  • Nanoprobing
  • CMOS Circuits
  • Fault Localization
  • Time-Resolved Imaging
  • Electrical Characterization
Research works
56k
fractional, since 1950
In the world top 10%
5.6k
per year above
Top-10% rate
9.9%
share of its works in the world top 10%
Growth, 2018-21 → 2022-25
+11%
the tick is no change
Largest producer
China
34% of the 10 largest, 2022-now
Integrated Circuits and Semiconductor Failure Analysis

Which countries lead Integrated Circuits and Semiconductor Failure Analysis research?

By volume, China and the United States publish the most (1.8k and 1.2k works in 2022-now).

By volume, 2022-now

  1. 1 China 1.8k works
  2. 2 United States 1.2k works
  3. 3 India 559 works
  4. 4 Germany 386 works
  5. 5 Japan 327 works
  6. 6 South Korea 281 works
  7. 7 France 217 works
  8. 8 Taiwan 176 works
  9. 9 United Kingdom 151 works
  10. 10 Italy 131 works

How concentrated that is

The same countries as shares of everything the list above accounts for. A node where two countries do two thirds of the work and one spread evenly across twelve read alike as a ranking and not at all alike here.

China: 33.6%United States: 23.6%India: 10.7%Germany: 7.4%6 others listed: 24.6%34%largest
China1,753 · 33.6%United States1,232 · 23.6%India559 · 10.7%Germany386 · 7.4%6 others listed1,283 · 24.6%

Shares of the rows listed above, not of the whole node.

Which institutions lead Integrated Circuits and Semiconductor Failure Analysis research?

By volume in 2022-now, Chinese Academy of Sciences publishes the most Integrated Circuits and Semiconductor Failure Analysis research, followed by Centre National de la Recherche Scientifique and IMEC.

By volume, 2022-now

  1. 1 Chinese Academy of SciencesChina 133 works
  2. 2 Centre National de la Recherche ScientifiqueFrance 72 works
  3. 3 IMECBelgium 72 works
  4. 4 Samsung (South Korea)South Korea 66 works
  5. 5 University of FloridaUnited States 58 works
  6. 6 Intel (United States)United States 50 works
  7. 7 Fraunhofer-GesellschaftGermany 46 works
  8. 8 Zhejiang UniversityChina 43 works
  9. 9 Xidian UniversityChina 40 works
  10. 10 Xi'an Jiaotong UniversityChina 38 works

Who are the leading researchers in Integrated Circuits and Semiconductor Failure Analysis?

The most-cited researchers publishing on Integrated Circuits and Semiconductor Failure Analysis include Zhong Lin Wang, Yury G. Gogotsi and Wei Huang.

  1. 1 Zhong Lin Wang United States 491k citations
  2. 2 Yury G. Gogotsi United States 313k citations
  3. 3 Wei Huang China 267k citations
  4. 4 Gordon Brent Mills United States 265k citations
  5. 5 Xiaogang Wang China 260k citations
  6. 6 Kenji Watanabe Japan 237k citations
  7. 7 Matthew James Page Australia 235k citations
  8. 8 Takashi Taniguchi Japan 227k citations
  9. 9 Kai You Wang China 224k citations
  10. 10 Albert-Ĺaszló Barabási United States 223k citations

Ranked by citations received across their whole record, among researchers with at least three works on this topic.

What are the most cited papers in Integrated Circuits and Semiconductor Failure Analysis?

The most cited paper in Integrated Circuits and Semiconductor Failure Analysis is "IMPROVEMENTS IN EPOXY RESIN EMBEDDING METHODS" (John H. Luft, 1961), with 10,256 citations. Next come "Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy" (6,210) and "In vitro scratch assay: a convenient and inexpensive method for analysis of cell migration in vitro" (4,789).

Most cited papers
#PaperReleasedCitations
1 IMPROVEMENTS IN EPOXY RESIN EMBEDDING METHODS John H. Luft · The Journal of Cell Biology Open access Feb 1961 10,256
2 Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy Stefan W. Hell, Jan Wichmann · Optics Letters Jun 1994 6,210
3 In vitro scratch assay: a convenient and inexpensive method for analysis of cell migration in vitro Chun-Chi Liang, Ann Y. Park, Jun‐Lin Guan · Nature Protocols Feb 2007 4,789
4 Metal-semiconductor Contacts Mingsheng Li, Ming Li · Kluwer Academic Publishers eBooks Book chapter 19 Dec 2005 3,976
5 PARP inhibitors: Synthetic lethality in the clinic Christopher J. Lord, Alan Ashworth · Science Open access 16 Mar 2017 2,980
All 100 most cited papers, with filters and sorting

Where is Integrated Circuits and Semiconductor Failure Analysis research done?

The largest centres of Integrated Circuits and Semiconductor Failure Analysis research in 2022-now are Beijing (China), Seoul (South Korea), Shanghai (China) and Xi'an (China). Among places with at least 20 works in it, it is an unusually large share of all research in Santa Clara.

Largest cities, 2022-now

  1. 1 BeijingChina 378 works
  2. 2 SeoulSouth Korea 177 works
  3. 3 ShanghaiChina 173 works
  4. 4 Xi'anChina 135 works
  5. 5 TokyoJapan 119 works
  6. 6 LeuvenBelgium 90 works
  7. 7 NanjingChina 88 works
  8. 8 SingaporeSingapore 77 works
  9. 9 HsinchuTaiwan 72 works
  10. 10 HangzhouChina 70 works

Where it is the local speciality

  1. Santa ClaraUS · 61.9 works39×
← less than its size predicts1×more →

Location quotient: how much more of its research is in Integrated Circuits and Semiconductor Failure Analysis than the world average.

See Integrated Circuits and Semiconductor Failure Analysis on the map

Where is the best place to study Integrated Circuits and Semiconductor Failure Analysis?

Among universities, judged by research, University of Florida, Gazi University and Xi'an Jiaotong University score highest, combining excellence, specialisation, size, growth and international reach. Research strength is one signal when choosing where to study; it does not measure teaching.

0%20%40%60%mean 16.95%fractional works in this field (log) →share of work in the world top 10% →Gazi UniversityHuazhong University …Xi'an Jiaotong Unive…University of Florida
above the meannear itbelow it

One dot per university in the first ten of the table below, at the default weights. The upper left is the interesting corner: small places doing unusually strong work.

Excellenceshare of its work in the world top 10%, 2022-now and all time averaged
40%
Specialisationhow much of its work is in this field, counted up to 10× the world share
10%
Sizeits output in this field, on a log scale
30%
Growthoutput growth, counted from -20% to +20%
10%
Internationalshare of its work with a co-author abroad
10%
Each slider sets a weight; the share it gets of the score is beside it.
#UniversityScoreTop 10%SpecialisationWorksGrowth
1University of FloridaUnited States 60.16.2%9.8×58 +37.6%
2Gazi UniversityTürkiye 56.052.0%3.8×10 +2.1%
3Xi'an Jiaotong UniversityChina 53.118.4%4.0×38 +83.9%
4Huazhong University of Science and TechnologyChina 51.219.3%3.2×32 +137.3%
5Zhejiang UniversityChina 49.910.1%2.9×43 +155.8%
6Xidian UniversityChina 49.26.0%10.0×40 +124.1%
7University of Chinese Academy of SciencesChina 47.914.0%3.5×32 +22.6%
8Sungkyunkwan UniversitySouth Korea 47.123.5%5.3×20 +41.4%
9Beihang UniversityChina 46.714.4%4.7×28 +39.1%
10University of Electronic Science and Technology of ChinaChina 44.75.6%5.2×32 +21.5%

Universities only. The score blends excellence (40%), size (30%), specialisation (10%), growth (10%), international reach (10%), 2022-now; growth compares 2018-21 with 2022-25 and counts up to +20%, since a jump from a small base is mostly noise.

Every institution in Integrated Circuits and Semiconductor Failure Analysis, country by country

Is Integrated Circuits and Semiconductor Failure Analysis research growing?

Output in 2022-2025 was 11% higher than in 2018-2021, peaking in 2002. The fastest-growing topics are Integrated Circuits and Semiconductor Failure Analysis.

still counting19801990200020102020
grewheldshrank

The same series as a ribbon: one cell per year, darker for more. The line above answers how much; this answers when.

Its share of all research

Growing output can still be a shrinking share: all of science grows. This is Integrated Circuits and Semiconductor Failure Analysis as a percentage of every work published that year, 0.033% in 2024.

still counting0.10%0.20%Integrated Circuits and Semiconductor Failure Analysis0.027% in 202519801990200020102020

Fractional works of Integrated Circuits and Semiconductor Failure Analysis over all fractional works that year. How the balance of science has shifted.

How much of it reaches the world top 10%

Year by year.

still counting5%10%15%Integrated Circuits and Semiconductor Failure Analysis9.8% in 2025200020102020

Of each year's works in it, the share that reached the world's 10% most cited for their field and year. A field is the world for its own topics, so there is no other line to hold it against.

Which topics inside it are moving

Growth and decline on one axis around a shared zero. Two lists side by side hide the thing that matters: whether the growth dwarfs the decline, or the other way round.

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