Most cited papers in Integrated Circuits and Semiconductor Failure Analysis
What are the most cited papers in Integrated Circuits and Semiconductor Failure Analysis?
The most cited paper in Integrated Circuits and Semiconductor Failure Analysis is "IMPROVEMENTS IN EPOXY RESIN EMBEDDING METHODS" (John H. Luft, 1961), with 10,256 citations. Next come "Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy" (6,210) and "In vitro scratch assay: a convenient and inexpensive method for analysis of cell migration in vitro" (4,789).
Showing 50 of 100 papers. Every paper with more than 733 citations is listed.
| # | Paper | ||
|---|---|---|---|
| 1 | IMPROVEMENTS IN EPOXY RESIN EMBEDDING METHODS John H. Luft · The Journal of Cell Biology | Feb 1961 | 10,256 |
| 2 | Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy Stefan W. Hell, Jan Wichmann · Optics Letters | Jun 1994 | 6,210 |
| 3 | In vitro scratch assay: a convenient and inexpensive method for analysis of cell migration in vitro Chun-Chi Liang, Ann Y. Park, Jun‐Lin Guan · Nature Protocols | Feb 2007 | 4,789 |
| 4 | Metal-semiconductor Contacts Mingsheng Li, Ming Li · Kluwer Academic Publishers eBooks | 19 Dec 2005 | 3,976 |
| 5 | PARP inhibitors: Synthetic lethality in the clinic Christopher J. Lord, Alan Ashworth · Science | 16 Mar 2017 | 2,980 |
| 6 | Spin-Orbit Interaction and Magnetoresistance in the Two Dimensional Random System S. Hikami, A. I. Larkin, Yasutaka Nagaoka · Progress of Theoretical Physics | Feb 1980 | 2,803 |
| 7 | Extraction of Schottky diode parameters from forward current-voltage characteristics S. K. Cheung, Nathan W. Cheung · Applied Physics Letters | 14 Jul 1986 | 2,776 |
| 8 | Trapping of PARP1 and PARP2 by Clinical PARP Inhibitors Junko Murai, Shar-yin N. Huang, Benu Brata Das et al. · Cancer Research | 31 Oct 2012 | 2,224 |
| 9 | Robust Physical-World Attacks on Deep Learning Visual Classification Kevin Eykholt, Ivan Evtimov, Earlence Fernandes et al. | Jun 2018 | 2,168 |
| 10 | Optical stethoscopy: Image recording with resolution λ/20 Dieter Pohl, Winfried T. Denk, M. Lanz · Applied Physics Letters | Apr 1984 | 2,031 |
| 11 | Poly(ADP-ribose): novel functions for an old molecule Valérie Schreiber, Françoise Dantzer, Jean‐Christophe Amé et al. · Nature Reviews Molecular Cell Biology | Jul 2006 | 1,930 |
| 12 | Simple technique for measurements of pulsed Gaussian-beam spot sizes J. M. Liu · Optics Letters | May 1982 | 1,892 |
| 13 | Mediation of Poly(ADP-Ribose) Polymerase-1-Dependent Cell Death by Apoptosis-Inducing Factor Seong-Woon Yu, Hongmin Wang, Marc F. Poitras et al. · Science | 12 Jul 2002 | 1,825 |
| 14 | Microscopic structure of the SiO2 /Si interface Franz J. Himpsel, F. Read McFeely, Amina Taleb‐Ibrahimi et al. · Physical review. B, Condensed matter | 15 Sep 1988 | 1,814 |
| 15 | High dielectric constant oxides John D. Robertson · The European Physical Journal Applied Physics | Dec 2004 | 1,813 |
| 16 | Near-Field Optics: Microscopy, Spectroscopy, and Surface Modification Beyond the Diffraction Limit Eric Betzig, Jay K. Trautman · Science | 10 Jul 1992 | 1,808 |
| 17 | Studies of tunnel MOS diodes I. Interface effects in silicon Schottky diodes HOWARD C. CARD, E. H. Rhoderick · Journal of Physics D Applied Physics | Oct 1971 | 1,802 |
| 18 | Adversarial Examples: Attacks and Defenses for Deep Learning Xiaoyong Yuan, Pan He, Qile Zhu et al. · IEEE Transactions on Neural Networks and Learning Systems | 14 Jan 2019 | 1,790 |
| 19 | Metal-semiconductor contacts E. H. Rhoderick · IEE Proceedings I Solid State and Electron Devices | 1982 | 1,735 |
| 20 | High dielectric constant gate oxides for metal oxide Si transistors John D. Robertson · Reports on Progress in Physics | 14 Dec 2005 | 1,725 |
| 21 | A proposed method of calculating displacement dose rates M J Norgett, M. T. Robinson, IAN McC. TORRENS · Nuclear Engineering and Design | Aug 1975 | 1,686 |
| 22 | Barrier inhomogeneities at Schottky contacts Jürgen H. Werner, Herbert H. Güttler · Journal of Applied Physics | Feb 1991 | 1,646 |
| 23 | A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy J. P. Cleveland, S. Manne, Dan Bocek et al. · Review of Scientific Instruments | Feb 1993 | 1,644 |
| 24 | Band Structures and Pseudopotential Form Factors for Fourteen Semiconductors of the Diamond and Zinc-blende Structures Marvin L. Cohen, T. K. Bergstresser · Physical Review | 14 Jan 1966 | 1,638 |
| 25 | An overview of nitinol medical applications Thomas W. Duerig, Alan R. Pelton, Dieter Stöckel · Materials Science and Engineering A | Dec 1999 | 1,636 |
| 26 | Device scaling limits of Si MOSFETs and their application dependencies David J. Frank, Robert H. Dennard, Etienne Nowak et al. · Proceedings of the IEEE | Mar 2001 | 1,580 |
| 27 | Breaking the Diffraction Barrier: Optical Microscopy on a Nanometric Scale Eric Betzig, Jay K. Trautman, T.D. Harris et al. · Science | 22 Mar 1991 | 1,539 |
| 28 | The PARP superfamily Jean‐Christophe Amé, Catherine Spenlehauer, Gilbert de Murcia · BioEssays | 19 Jul 2004 | 1,462 |
| 29 | The physics and chemistry of the Schottky barrier height R. T. Tung · Applied Physics Reviews | 13 Jan 2014 | 1,405 |
| 30 | A Survey of Hardware Trojan Taxonomy and Detection Mohammad Tehranipoor, Farinaz Koushanfar · IEEE Design & Test of Computers | 2010 | 1,404 |
| 31 | Atomic force microscope–force mapping and profiling on a sub 100-Å scale Y. Martin, Clayton C. Williams, Hemantha Kumar Wickramasinghe · Journal of Applied Physics | 15 May 1987 | 1,404 |
| 32 | Ion Implantation in Semiconductors James W. Mayer, O. J. Marsh · Applied solid state science | 1969 | 1,392 |
| 33 | Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy Ondrej L. Krivanek, Matthew F. Chisholm, Valeria Nicolosi et al. · Nature | Mar 2010 | 1,359 |
| 34 | A reliable approach to charge-pumping measurements in MOS transistors G. Groeseneken, H.E. Maes, N. Beltran et al. · IEEE Transactions on Electron Devices | 1984 | 1,358 |
| 35 | Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy Kiyomi Takayanagi, Y. Tanishiro, Masaetsu Takahashi et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films | May 1985 | 1,318 |
| 36 | Alternative dielectrics to silicon dioxide for memory and logic devices Angus I. Kingon, Jon‐Paul Maria, S. K. Streiffer · Nature | Aug 2000 | 1,285 |
| 37 | Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise Michael James Kirton, Michael J. Uren · Advances In Physics | 1989 | 1,278 |
| 38 | New insights into the molecular and cellular functions of poly(ADP-ribose) and PARPs Bryan A. Gibson, W. Lee Kraus · Nature Reviews Molecular Cell Biology | 20 Jun 2012 | 1,250 |
| 39 | Recent advances in Schottky barrier concepts R. T. Tung · Materials Science and Engineering R Reports | Nov 2001 | 1,235 |
| 40 | FPGA Intrinsic PUFs and Their Use for IP Protection Jorge Guajardo, Sandeep S. Kumar, Geert-Jan Schrijen et al. · Lecture notes in computer science | 22 Aug 2007 | 1,209 |
| 41 | Upset hardened memory design for submicron CMOS technology T. Calin, M. Nicolaidis, Raoul Velazco · IEEE Transactions on Nuclear Science | Dec 1996 | 1,169 |
| 42 | A high-speed atomic force microscope for studying biological macromolecules Toshio Ando, Noriyuki Kodera, Eisuke Takai et al. · Proceedings of the National Academy of Sciences | 9 Oct 2001 | 1,123 |
| 43 | Electron microscopy image enhanced Maximilian Haider, Stephan Uhlemann, Eugen Schwan et al. · Nature | Apr 1998 | 1,064 |
| 44 | Extracting secret keys from integrated circuits Daihyun Lim, J.W. Lee, Blaise Gassend et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems | Oct 2005 | 1,057 |
| 45 | Optical interconnections for VLSI systems Joseph W. Goodman, Fred J. Leonberger, Sun-Yuan Kung et al. · Proceedings of the IEEE | 1984 | 1,056 |
| 46 | Picosecond photoconducting Hertzian dipoles D. H. Auston, K. P. Cheung, P. R. Smith · Applied Physics Letters | Aug 1984 | 1,038 |
| 47 | Imaging Crystals, Polymers, and Processes in Water with the Atomic Force Microscope B. Drake, Craig B. Prater, Albrecht L. Weisenhorn et al. · Science | 24 Mar 1989 | 1,030 |
| 48 | Gas-assisted focused electron beam and ion beam processing and fabrication Ivo Utke, P. Hoffmann, John Melngailis · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena | Jul 2008 | 1,029 |
| 49 | Immunotherapy of non-Hodgkin’s lymphoma with a defined ratio of CD8 + and CD4 + CD19-specific chimeric antigen receptor–modified T cells Cameron John Turtle, Laïla‐Aïcha Hanafi, Carolina Berger et al. · Science Translational Medicine | 7 Sep 2016 | 1,026 |
| 50 | Microscopy and its focal switch Stefan W. Hell · Nature Methods | 17 Dec 2008 | 1,006 |
Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for a field when OpenAlex files it under one of the field's topics; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.