Question 1

Which countries lead Integrated Circuits and Semiconductor Failure Analysis research?

Accepted Answer

By volume, China and the United States publish the most (1.8k and 1.2k works in 2022-now).

Question 2

Which institutions lead Integrated Circuits and Semiconductor Failure Analysis research?

Accepted Answer

By volume in 2022-now, Chinese Academy of Sciences publishes the most Integrated Circuits and Semiconductor Failure Analysis research, followed by Centre National de la Recherche Scientifique and IMEC.

Question 3

Who are the leading researchers in Integrated Circuits and Semiconductor Failure Analysis?

Accepted Answer

The most-cited researchers publishing on Integrated Circuits and Semiconductor Failure Analysis include Zhong Lin Wang, Yury G. Gogotsi and Wei Huang.

Question 4

Where is Integrated Circuits and Semiconductor Failure Analysis research done?

Accepted Answer

The largest centres of Integrated Circuits and Semiconductor Failure Analysis research in 2022-now are Beijing (China), Seoul (South Korea), Shanghai (China) and Xi'an (China). Among places with at least 20 works in it, it is an unusually large share of all research in Santa Clara.

Question 5

Where is the best place to study Integrated Circuits and Semiconductor Failure Analysis?

Accepted Answer

Among universities, judged by research, University of Florida, Gazi University and Xi'an Jiaotong University score highest, combining excellence, specialisation, size, growth and international reach. Research strength is one signal when choosing where to study; it does not measure teaching.

Question 6

Is Integrated Circuits and Semiconductor Failure Analysis research growing?

Accepted Answer

Output in 2022-2025 was 11% higher than in 2018-2021, peaking in 2002. The fastest-growing topics are Integrated Circuits and Semiconductor Failure Analysis.

Question 7

What are the most cited papers in Integrated Circuits and Semiconductor Failure Analysis?

Accepted Answer

The most cited paper in Integrated Circuits and Semiconductor Failure Analysis is "IMPROVEMENTS IN EPOXY RESIN EMBEDDING METHODS" (John H. Luft, 1961), with 10,256 citations. Next come "Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy" (6,210) and "In vitro scratch assay: a convenient and inexpensive method for analysis of cell migration in vitro" (4,789).