Jon F. Fleig
Jon F. Fleig publishes mostly in Computer Vision and Pattern Recognition, Mechanical Engineering and Computational Mechanics, on topics such as Optical measurement and interference techniques, Advanced Measurement and Metrology Techniques and Surface Roughness and Optical Measurements.
- World rank
- #3,676,846 of 7,710,434 ranked researchers
- Rank in United States
- #1,019,196 of 1,627,098
- Works
- 17
- Citations
- 346
- Citations per work
- 20.4
What does Jon F. Fleig research?
Jon F. Fleig's work is mostly in Engineering (57%), Computer Science (33%), Environmental Science (2%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1692.1%
- Engineering1056.8%
- Computer Science633.3%
- Environmental Science02.0%
- Everything else17.9%
- 1Computer Vision and Pattern Recognition33% of their works
- 2Mechanical Engineering31% of their works
- 3Computational Mechanics14% of their works
- 4Biomedical Engineering8% of their works
- 5Civil and Structural Engineering4% of their works
- 6Environmental Engineering2% of their works
Research topics
- Optical measurement and interference techniques
- Advanced Measurement and Metrology Techniques
- Surface Roughness and Optical Measurements
- Laser and Thermal Forming Techniques
- Structural Health Monitoring Techniques
- Calibration and Measurement Techniques
- Advanced Surface Polishing Techniques
- Optical Polarization and Ellipsometry
Which keywords describe Jon F. Fleig's research?
The keywords of their largest research topics: Camera Calibration, Structured Light, Dimensional Metrology, Error Compensation, Roughness Measurement, Surface Characterization, Finite Element Modeling and Laser Forming.
- Radiometric Calibration
- On-Orbit Performance
- Imaging Spectroscopy
- Wireless Sensors
- Laser Forming
- Surface Characterization
- Error Compensation
- Structured Light
- Camera Calibration
- Dimensional Metrology
- Roughness Measurement
- Finite Element Modeling
- Vibration-based Damage Identification
- Chemical Mechanical Planarization
- Material Removal Mechanism
- Polarimetry
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Camera Calibration171 topic
- Structured Light171 topic
- Dimensional Metrology161 topic
- Error Compensation161 topic
- Roughness Measurement41 topic
- Surface Characterization41 topic
- Finite Element Modeling31 topic
- Laser Forming31 topic
- Vibration-based Damage Identification21 topic
- Wireless Sensors21 topic
- Chemical Mechanical Planarization11 topic
- Imaging Spectroscopy11 topic
- Material Removal Mechanism11 topic
- On-Orbit Performance11 topic
- Polarimetry11 topic
- Radiometric Calibration11 topic
Where does Jon F. Fleig work?
Jon F. Fleig's main affiliation in the publication record is QED Technologies (United States), United States.
How many publications and citations does Jon F. Fleig have?
OpenAlex counts 17 works and 346 citations for Jon F. Fleig, an h-index of 6, ranking #3,676,846 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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