Researcher · QED Technologies (United States) · United States
Jon F. Fleig
Jon F. Fleig publishes mostly in Computer Vision and Pattern Recognition, Mechanical Engineering and Computational Mechanics, on topics such as Optical measurement and interference techniques, Advanced Measurement and Metrology Techniques and Surface Roughness and Optical Measurements.
- World rank
- #3,676,846 of 7,710,434 ranked researchers
- Rank in United States
- #1,019,196 of 1,627,098
- Works
- 17
- Citations
- 346
- Citations per work
- 20.4
Drawing this view