Kenneth S. M. Fung
Kenneth S. M. Fung publishes mostly in Computer Vision and Pattern Recognition, Media Technology and Mechanical Engineering, on topics such as Optical measurement and interference techniques, Advanced Measurement and Metrology Techniques and Image Processing Techniques and Applications.
- World rank
- #7,140,680 of 7,710,434 ranked researchers
- Rank in China
- #943,622 of 978,568
- Works
- 21
- Citations
- 91
- Citations per work
- 4.3
What does Kenneth S. M. Fung research?
Kenneth S. M. Fung's work is mostly in Engineering (52%), Computer Science (41%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2093.7%
- Engineering1152.4%
- Computer Science941.3%
- Everything else16.3%
- 1Computer Vision and Pattern Recognition41% of their works
- 2Media Technology16% of their works
- 3Mechanical Engineering14% of their works
- 4Electrical and Electronic Engineering11% of their works
- 5Industrial and Manufacturing Engineering8% of their works
- 6Biomedical Engineering3% of their works
Research topics
- Optical measurement and interference techniques
- Advanced Measurement and Metrology Techniques
- Image Processing Techniques and Applications
- Image and Object Detection Techniques
- Industrial Vision Systems and Defect Detection
- Optical Systems and Laser Technology
- Advancements in Photolithography Techniques
- Image Processing and 3D Reconstruction
Which keywords describe Kenneth S. M. Fung's research?
The keywords of their largest research topics: Camera Calibration, Structured Light, Machine Vision, Autofocusing, Depth Estimation, Dimensional Metrology, Error Compensation and Fabric Defect Detection.
- Fragmented Objects
- Electron Beam Lithography
- Laser
- Line Detection
- Fabric Defect Detection
- Dimensional Metrology
- Autofocusing
- Structured Light
- Camera Calibration
- Machine Vision
- Depth Estimation
- Error Compensation
- Hough Transform
- Texture Analysis
- Semiconductor
- Nanofabrication
- Reconstruction
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Camera Calibration171 topic
- Structured Light171 topic
- Machine Vision142 topics
- Autofocusing91 topic
- Depth Estimation91 topic
- Dimensional Metrology91 topic
- Error Compensation91 topic
- Fabric Defect Detection51 topic
- Hough Transform51 topic
- Line Detection51 topic
- Texture Analysis51 topic
- Laser31 topic
- Semiconductor31 topic
- Electron Beam Lithography21 topic
- Nanofabrication21 topic
- Fragmented Objects11 topic
- Reconstruction11 topic
Where does Kenneth S. M. Fung work?
Kenneth S. M. Fung's main affiliation in the publication record is ASM Pacific Technology (China), China.
How many publications and citations does Kenneth S. M. Fung have?
OpenAlex counts 21 works and 91 citations for Kenneth S. M. Fung, an h-index of 6, ranking #7,140,680 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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