M.A. Foad
M.A. Foad publishes mostly in Electrical and Electronic Engineering, Computational Mechanics and Materials Chemistry, on topics such as Semiconductor materials and devices, Integrated Circuits and Semiconductor Failure Analysis and Silicon and Solar Cell Technologies.
- World rank
- #930,726 of 1,633,909 ranked researchers
- Rank in United States
- #252,309 of 358,040
- Works
- 24
- Citations
- 37
- Citations per work
- 1.5
What does M.A. Foad research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering74% of their works
- 2Computational Mechanics7% of their works
- 3Materials Chemistry4% of their works
- 4Atomic and Molecular Physics, and Optics4% of their works
- 5Mechanical Engineering4% of their works
- 6Electronic, Optical and Magnetic Materials4% of their works
Research topics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon and Solar Cell Technologies
- Advancements in Semiconductor Devices and Circuit Design
- Ion-surface interactions and analysis
- Advanced Surface Polishing Techniques
- Advancements in Photolithography Techniques
- CCD and CMOS Imaging Sensors
Which keywords describe M.A. Foad's research?
The keywords of their largest research topics: Atomic Layer Deposition, High-k Dielectrics, Failure Analysis, Integrated Circuits, Silicon, Solar Cells, Nanowire Transistors and Tunnel Field-Effect Transistors.
- Nanofabrication
- High-Speed Imaging
- Chemical Mechanical Planarization
- Surface Analysis
- Tunnel Field-Effect Transistors
- Solar Cells
- Integrated Circuits
- High-k Dielectrics
- Atomic Layer Deposition
- Failure Analysis
- Silicon
- Nanowire Transistors
- Ion Beam
- CMOS Image Sensors
- Electron Beam Lithography
- Material Removal Mechanism
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Atomic Layer Deposition61 topic
- High-k Dielectrics61 topic
- Failure Analysis51 topic
- Integrated Circuits51 topic
- Silicon41 topic
- Solar Cells41 topic
- Nanowire Transistors31 topic
- Tunnel Field-Effect Transistors31 topic
- Ion Beam21 topic
- Surface Analysis21 topic
- CMOS Image Sensors11 topic
- Chemical Mechanical Planarization11 topic
- Electron Beam Lithography11 topic
- High-Speed Imaging11 topic
- Material Removal Mechanism11 topic
- Nanofabrication11 topic
Where does M.A. Foad work?
M.A. Foad's main affiliation in the publication record is Applied Materials (United States), United States.
How many publications and citations does M.A. Foad have?
Science Explorer counts 24 works and 37 citations for M.A. Foad, ranking #930,726 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.