Stephan Waldner
Stephan Waldner publishes mostly in Electrical and Electronic Engineering, Mechanical Engineering and Computer Vision and Pattern Recognition, on topics such as Optical measurement and interference techniques, Advanced Measurement and Metrology Techniques and Surface Roughness and Optical Measurements.
- World rank
- #4,763,325 of 7,710,434 ranked researchers
- Rank in Switzerland
- #63,169 of 80,918
- Works
- 30
- Citations
- 442
- Citations per work
- 14.7
What does Stephan Waldner research?
Stephan Waldner's work is mostly in Engineering (51%), Computer Science (12%), Materials Science (8%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2171.0%
- Engineering1551.3%
- Computer Science411.8%
- Materials Science27.9%
- Everything else929.0%
- 1Electrical and Electronic Engineering20% of their works
- 2Mechanical Engineering13% of their works
- 3Computer Vision and Pattern Recognition12% of their works
- 4Computational Mechanics10% of their works
- 5Mechanics of Materials8% of their works
- 6Surfaces, Coatings and Films8% of their works
Research topics
- Optical measurement and interference techniques
- Advanced Measurement and Metrology Techniques
- Surface Roughness and Optical Measurements
- Optical Coatings and Gratings
- Advanced Measurement and Detection Methods
- Advanced Surface Polishing Techniques
- Photonic and Optical Devices
- Semiconductor Lasers and Optical Devices
Which keywords describe Stephan Waldner's research?
The keywords of their largest research topics: Image Processing, Camera Calibration, Dimensional Metrology, Error Compensation, Structured Light, Roughness Measurement, Surface Characterization and Antireflective Coatings.
- Semiconductor Lasers
- Optical Interconnects
- Chemical Mechanical Planarization
- Measurement
- Antireflective Coatings
- Roughness Measurement
- Error Compensation
- Camera Calibration
- Image Processing
- Dimensional Metrology
- Structured Light
- Surface Characterization
- Nanostructures
- Optoelectronic
- Material Removal Mechanism
- Optical Modulators
- Silicon Photonics
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 17 words, with their numbers
- Image Processing102 topics
- Camera Calibration91 topic
- Dimensional Metrology91 topic
- Error Compensation91 topic
- Structured Light91 topic
- Roughness Measurement71 topic
- Surface Characterization71 topic
- Antireflective Coatings51 topic
- Nanostructures51 topic
- Measurement31 topic
- Optoelectronic31 topic
- Chemical Mechanical Planarization21 topic
- Material Removal Mechanism21 topic
- Optical Interconnects21 topic
- Optical Modulators21 topic
- Semiconductor Lasers21 topic
- Silicon Photonics21 topic
Where does Stephan Waldner work?
Stephan Waldner's main affiliation in the publication record is RhySearch (Switzerland), Switzerland.
How many publications and citations does Stephan Waldner have?
OpenAlex counts 30 works and 442 citations for Stephan Waldner, an h-index of 7, ranking #4,763,325 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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