T.B. Eom
T.B. Eom publishes mostly in Electrical and Electronic Engineering, Mechanical Engineering and Computer Vision and Pattern Recognition, on topics such as Advanced Measurement and Metrology Techniques, CCD and CMOS Imaging Sensors and Sensor Technology and Measurement Systems.
- World rank
- #5,693,753 of 7,710,434 ranked researchers
- Rank in South Korea
- #105,985 of 162,609
- Works
- 25
- Citations
- 81
- Citations per work
- 3.2
What does T.B. Eom research?
T.B. Eom's work is mostly in Engineering (49%), Computer Science (15%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1664.3%
- Engineering1249.3%
- Computer Science415.0%
- Everything else935.7%
- 1Electrical and Electronic Engineering21% of their works
- 2Mechanical Engineering18% of their works
- 3Computer Vision and Pattern Recognition9% of their works
- 4Media Technology6% of their works
- 5Computer Networks and Communications6% of their works
- 6Biomedical Engineering4% of their works
Research topics
- Advanced Measurement and Metrology Techniques
- CCD and CMOS Imaging Sensors
- Sensor Technology and Measurement Systems
- Image Processing Techniques and Applications
- Scientific Measurement and Uncertainty Evaluation
- Image Enhancement Techniques
- Infrared Target Detection Methodologies
- Surface Roughness and Optical Measurements
Which keywords describe T.B. Eom's research?
The keywords of their largest research topics: Dimensional Metrology, Error Compensation, Image Processing, Neural Networks, CMOS Image Sensors, High-Speed Imaging, Machine Vision and IEEE 1451.
- Small Target
- Infrared
- Contrast Enhancement
- Measurement Uncertainty
- Autofocusing
- IEEE 1451
- High-Speed Imaging
- Neural Networks
- Error Compensation
- Dimensional Metrology
- Image Processing
- CMOS Image Sensors
- Machine Vision
- Smart Sensors
- Depth Estimation
- Redefinition of SI Units
- Dehazing
- Roughness Measurement
- Surface Characterization
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 19 words, with their numbers
- Dimensional Metrology111 topic
- Error Compensation111 topic
- Image Processing73 topics
- Neural Networks72 topics
- CMOS Image Sensors51 topic
- High-Speed Imaging51 topic
- Machine Vision52 topics
- IEEE 145141 topic
- Smart Sensors41 topic
- Autofocusing31 topic
- Depth Estimation31 topic
- Measurement Uncertainty31 topic
- Redefinition of SI Units31 topic
- Contrast Enhancement21 topic
- Dehazing21 topic
- Infrared21 topic
- Roughness Measurement21 topic
- Small Target21 topic
- Surface Characterization21 topic
Where does T.B. Eom work?
T.B. Eom's main affiliation in the publication record is Seoul National University of Science and Technology, South Korea.
How many publications and citations does T.B. Eom have?
OpenAlex counts 25 works and 81 citations for T.B. Eom, an h-index of 5, ranking #5,693,753 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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