Theodore V. Vorburger
Theodore V. Vorburger publishes mostly in Mechanical Engineering, Computational Mechanics and Biomedical Engineering, on topics such as Surface Roughness and Optical Measurements, Advanced Measurement and Metrology Techniques and Force Microscopy Techniques and Applications.
- World rank
- #3,121,274 of 7,710,434 ranked researchers
- Rank in United States
- #890,419 of 1,627,098
- Works
- 325
- Citations
- 3.5k
- Citations per work
- 10.7
What does Theodore V. Vorburger research?
Theodore V. Vorburger's work is mostly in Engineering (48%), Physics and Astronomy (13%), Computer Science (6%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences21867.0%
- Engineering15647.9%
- Physics and Astronomy4112.7%
- Computer Science216.4%
- Everything else10733.0%
- 1Mechanical Engineering14% of their works
- 2Computational Mechanics14% of their works
- 3Biomedical Engineering14% of their works
- 4Atomic and Molecular Physics, and Optics13% of their works
- 5Electrical and Electronic Engineering7% of their works
- 6Computer Vision and Pattern Recognition6% of their works
Research topics
- Surface Roughness and Optical Measurements
- Advanced Measurement and Metrology Techniques
- Force Microscopy Techniques and Applications
- Optical measurement and interference techniques
- Advanced Surface Polishing Techniques
- Advanced Materials Characterization Techniques
- Electron and X-Ray Spectroscopy Techniques
- Surface and Thin Film Phenomena
Which keywords describe Theodore V. Vorburger's research?
The keywords of their largest research topics: Roughness Measurement, Surface Characterization, Dimensional Metrology, Error Compensation, Atomic Force Microscopy, Force Spectroscopy, Camera Calibration and Structured Light.
- X-ray Photoelectron Spectroscopy
- Scanning Electron Microscopy
- Three-Dimensional Analysis
- Material Removal Mechanism
- Structured Light
- Force Spectroscopy
- Error Compensation
- Surface Characterization
- Roughness Measurement
- Dimensional Metrology
- Atomic Force Microscopy
- Camera Calibration
- Chemical Mechanical Planarization
- Atom Probe Tomography
- Quantum Size Effects
- Superconductivity
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Roughness Measurement1041 topic
- Surface Characterization1041 topic
- Dimensional Metrology951 topic
- Error Compensation951 topic
- Atomic Force Microscopy541 topic
- Force Spectroscopy541 topic
- Camera Calibration451 topic
- Structured Light451 topic
- Chemical Mechanical Planarization401 topic
- Material Removal Mechanism401 topic
- Atom Probe Tomography231 topic
- Three-Dimensional Analysis231 topic
- Quantum Size Effects221 topic
- Scanning Electron Microscopy221 topic
- Superconductivity221 topic
- X-ray Photoelectron Spectroscopy221 topic
Where does Theodore V. Vorburger work?
Theodore V. Vorburger's main affiliation in the publication record is National Institute of Standards and Technology, United States.
How many publications and citations does Theodore V. Vorburger have?
OpenAlex counts 325 works and 3,479 citations for Theodore V. Vorburger, an h-index of 33, ranking #3,121,274 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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