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Most cited papers in Engineering and Test Systems

Engineering and Test Systems

What are the most cited papers in Engineering and Test Systems?

The most cited paper in Engineering and Test Systems is "Condition monitoring of wind turbines: Techniques and methods" (Fausto Pedro Garcı́a Márquez, Andrew Mark Tobias, Jesús María Pinar-Pérez et al., 2012), with 876 citations. Next come "A Two's Complement Parallel Array Multiplication Algorithm" (648) and "Separating Reliability and Stability in Test-Retest Correlation" (592).

Showing 50 of 97 papers. Every paper with more than 106 citations is listed.

Most cited papers, sortable by citations and release date
#Paper
1 Condition monitoring of wind turbines: Techniques and methods Fausto Pedro Garcı́a Márquez, Andrew Mark Tobias, Jesús María Pinar-Pérez et al. · Renewable Energy Open access 4 Apr 2012 876
2 A Two's Complement Parallel Array Multiplication Algorithm C.R. Baugh, B.A. Wooley · IEEE Transactions on Computers Dec 1973 648
3 Separating Reliability and Stability in Test-Retest Correlation David R. Heise · American Sociological Review Feb 1969 592
4 A Survey on Wind Turbine Condition Monitoring and Fault Diagnosis—Part I: Components and Subsystems Wei Qiao, Dingguo Lu · IEEE Transactions on Industrial Electronics 10 Apr 2015 535
5 Survey of Test Vector Compression Techniques Nur A. Touba · IEEE Design & Test of Computers Apr 2006 440
6 Probabilistic Treatment of General Combinational Networks Kenneth P. Parker, E.J. McCluske · IEEE Transactions on Computers Jun 1975 434
7 Built-In Self-Test Techniques Edward R. McCluskey · IEEE Design & Test of Computers 1985 421
8 Embedded deterministic test for low cost manufacturing test Janusz Rajski, Jerzy Tyszer, Mark Kassab et al. Conference paper 25 Jun 2003 404
9 Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic Circuits J. Paul Roth, W. G. Bouricius, Peter R. Schneider · IEEE Transactions on Electronic Computers Oct 1967 374
10 The advanced multifunction RF concept G.C. Tavik, C.L. Hilterbrick, James B. Evins et al. · IEEE Transactions on Microwave Theory and Techniques Mar 2005 369
11 State-of-the-Art Predictive Maintenance Techniques* Hashem M. Hashemian, Wendell C. Bean · IEEE Transactions on Instrumentation and Measurement 26 Apr 2011 353
12 Analysis of spread spectrum time domain reflectometry for wire fault location Paul Smith, Cynthia M. Furse, Jacob H. Gunther · IEEE Sensors Journal 15 Nov 2005 347
13 Reducing test application time for full scan embedded cores İlker Hamzaoğlu, Janak H. Patel Conference paper 20 Jan 2003 338
14 Logic Testing and Design for testability Hideo Fujiwara · Computer-Aided Design Jun 1986 325
15 IEEE 1547 Series of Standards: Interconnection Issues Thomas S. Basso, Richard DeBlasio · IEEE Transactions on Power Electronics Sep 2004 316
16 Personnel Selection: Test and Measurement Techniques Patricia C. Smith, Robert L. Thorndike · Industrial and Labor Relations Review Jul 1951 310
17 A prognostics and health management roadmap for information and electronics-rich systems MICHAEL G. PECHT, Rubyca Jaai · Microelectronics Reliability 10 Feb 2010 309
18 A set of benchmarks for modular testing of SOCs Erik Jan Marinissen, V. Iyengar, Krishnendu Chakrabarty Conference paper 25 Jun 2003 308
19 Design for Testability—A Survey Williams, Parker · IEEE Transactions on Computers 1982 298
20 A trend filtering algorithm for wide-field variability surveys Géza Kovács, Gáspár Bakos, Robert W. Noyes · Monthly Notices of the Royal Astronomical Society Open access 21 Dec 2004 297
21 Test vector decompression via cyclical scan chains and its application to testing core-based designs Abhijit Jas, Nur A. Touba Conference paper 27 Nov 2002 275
22 A tutorial on built-in self-test. I. Principles Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja · IEEE Design & Test of Computers Mar 1993 269
23 Adapting scan architectures for low power operation Lee Whetsel Conference paper 7 Nov 2002 268
24 A Dynamic-Bayesian-Network-Based Fault Diagnosis Methodology Considering Transient and Intermittent Faults Baoping Cai, Yü Liu, Min Xie · IEEE Transactions on Automation Science and Engineering 20 Jun 2016 267
25 Triple-triple redundant 777 primary flight computer Y.C. Yeh · 1996 IEEE Aerospace Applications Conference. Proceedings Conference paper 23 Dec 2002 267
26 Microprocessor Software-Based Self-Testing Mihalis Psarakis, Dimitris Gizopoulos, Ernesto Sánchez et al. · IEEE Design & Test of Computers 26 Jan 2010 262
27 Broad-side delay test Jacob Savir, S. Patil · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 1994 256
28 Practical questions in the use of DIF statistics in test development. Michael J. Zieky 1993 254
29 Application of heuristic search and information theory to sequential fault diagnosis Krishna Rao Pattipati, M.G. Alexandridis · IEEE Transactions on Systems Man and Cybernetics 1990 250
30 Frequency-domain reflectometery for on-board testing of aging aircraft wiring Cynthia M. Furse, You Chung Chung, R. Dangol et al. · IEEE Transactions on Electromagnetic Compatibility May 2003 249
31 Test vector encoding using partial LFSR reseeding C. Vamsi Krishna, Abhijit Jas, Nur A. Touba Conference paper 13 Nov 2002 231
32 Production of Large Computer Programs Herbert D. Benington · IEEE Annals of the History of Computing Oct 1983 228
33 Design for Autonomous Test McCluskey, Bozorgui-Nesbat · IEEE Transactions on Computers Nov 1981 223
34 Test volume and application time reduction through scan chain concealment I. Bayraktaroglu, Alex Orailoğlu Conference paper 2001 222
35 X-compact: an efficient response compaction technique for test cost reduction Subhasish Mitra, Kee Sup Kim Conference paper 25 Jun 2003 217
36 Test scheduling for core-based systems using mixed-integer linear programming Krishnendu Chakrabarty · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2000 210
37 Scan chain design for test time reduction in core-based ICs Joep Aerts, Erik Jan Marinissen Conference paper 27 Nov 2002 203
38 A tutorial on built-in self-test. 2. Applications Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja · IEEE Design & Test of Computers Jun 1993 193
39 Testing for Faults in Wiring Networks William H. Kautz · IEEE Transactions on Computers Apr 1974 190
40 The BACK algorithm for sequential test generation Wu-Tung Cheng Conference paper 6 Jan 2003 186
41 Effective and efficient test architecture design for SOCs Sandeep Goel, Erik Jan Marinissen Conference paper 25 Jun 2003 184
42 A Model and Heuristic For Solving Very Large Item Selection Problems Len Swanson, Martha L. Stocking · Applied Psychological Measurement Open access Jun 1993 181
43 Reconfigurable Monitoring System for Time-Frequency Analysis on Industrial Equipment Through STFT and DWT Eduardo Cabal‐Yépez, Armando Guadalupe Garcia-Ramirez, René de Jesús Romero-Troncoso et al. · IEEE Transactions on Industrial Informatics Oct 2012 177
44 Commercial Tool Condition Monitoring Systems Krzysztof Jemielniak · The International Journal of Advanced Manufacturing Technology Sep 1999 172
45 Electrical power technology for the more electric aircraft J.A. Weimer Conference paper 30 Dec 2002 169
46 DESIGN FOR TESTABILITY USING SCANPATH TECHNIQUES FOR PATH-DELAY TEST AND MEASUREMENT Bulent I. Dervisoglu, Gayvin E. Stong Conference paper 24 Aug 2005 167
47 Reducing test data volume using LFSR reseeding with seed compression C. Vamsi Krishna, Nur A. Touba Conference paper 25 Jun 2003 166
48 On low-capture-power test generation for scan testing Xiaoqing Wen, Yoshiyuki Yamashita, Seiji Kajihara et al. Conference paperOpen access 27 Jul 2005 165
49 Native mode functional test generation for processors with applications to self test and design validation Jian Shen, Jacob A. Abraham Conference paper 27 Nov 2002 163
50 Redundancy Management Technique for Space Shuttle Computers J. R. Sklaroff · IBM Journal of Research and Development 1976 162

Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for a field when OpenAlex files it under one of the field's topics; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.