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Institution · Microelectronics Research Development (United States)

Most cited papers from Microelectronics Research Development (United States)

Microelectronics Research Development (United States)

What are the most cited papers from Microelectronics Research Development (United States)?

The most cited paper from Microelectronics Research Development (United States) is "Reverse time migration" (Edip Baysal, Dan D. Kosloff, John W. C. Sherwood, 1983), with 1,580 citations. Next come "Transient Response of Multiconductor Transmission Lines Excited by a Nonuniform Electromagnetic Field" (985) and "Soft error rate mitigation techniques for modern microcircuits" (366).

Showing 50 of 60 papers. Every paper with more than 67 citations is listed.

Most cited papers, sortable by citations and release date
#Paper
1 Reverse time migration Edip Baysal, Dan D. Kosloff, John W. C. Sherwood · Geophysics Nov 1983 1,580
2 Transient Response of Multiconductor Transmission Lines Excited by a Nonuniform Electromagnetic Field Ashok Kumar Agrawal, Harold J. Price, Shyam H. Gurbaxani · IEEE Transactions on Electromagnetic Compatibility May 1980 985
3 Soft error rate mitigation techniques for modern microcircuits David G. Mavis, Paul H. Eaton Conference paper 25 Jun 2003 366
4 Response of advanced bipolar processes to ionizing radiation E.W. Enlow, Ronald L. Pease, W.E. Combs et al. · IEEE Transactions on Nuclear Science Dec 1991 327
5 Robust hash functions for digital watermarking Jessica Fridrich, Miroslav Goljan Conference paper 7 Nov 2002 327
6 Finite-Difference Analysis of EMP Coupling to Thin Struts and Wires Richard Holland, Larry Simpson · IEEE Transactions on Electromagnetic Compatibility May 1981 284
7 Simulation techniques for heavy ion fusion chamber transport Dale R. Welch, D. V. Rose, Bryan V. Oliver et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment May 2001 252
8 Fracture initiation at sharp notches: Correlation using critical stress intensities Martin L. Dunn, Wan Suwito, Shawn J. Cunningham · International Journal of Solids and Structures Oct 1997 236
9 Radio frequency rectifiers based on organic thin-film transistors Robert Rotzoll, Siddharth Mohapatra, Viorel Olariu et al. · Applied Physics Letters 20 Mar 2006 216
10 Image watermarking for tamper detection Jessica Fridrich Conference paper 27 Nov 2002 209
11 Images with self-correcting capabilities Jessica Fridrich, Miroslav Goljan Conference paper 20 Jan 2003 196
12 Trends in the total-dose response of modern bipolar transistors R.N. Nowlin, E.W. Enlow, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science Dec 1992 195
13 Characteristics and scaling of tungsten-wire-array z -pinch implosion dynamics at 20 MA M. E. Cuneo et al. · Physical Review E 22 Apr 2005 189
14 Epitaxial films of semiconducting FeSi2 on (001) silicon John E. Mahan, K.M. Geib, Gary Y. Robinson et al. · Applied Physics Letters Open access 21 May 1990 177
15 Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies Balaji Narasimham, Bharat L. Bhuva, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science Dec 2007 170
16 THREDE: A Free-Field EMP Coupling and Scattering Code Richard Holland · IEEE Transactions on Nuclear Science 1977 167
17 A two-way nonreflecting wave equation Edip Baysal, Dan D. Kosloff, John W. C. Sherwood · Geophysics Feb 1984 166
18 Lithology color-coded seismic sections: The calibration of AVO crossplotting to rock properties Richard W. Verm, Fred Hilterman · The Leading Edge Aug 1995 155
19 I DDQ testing: A review Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati et al. · Journal of Electronic Testing Dec 1992 154
20 Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits Jonathan R. Ahlbin, Lloyd W. Massengill, Bharat L. Bhuva et al. · IEEE Transactions on Nuclear Science Dec 2009 146
21 Single event transient pulse widths in digital microcircuits Matthew J. Gadlage, Ronald D. Schrimpf, Joseph M. Benedetto et al. · IEEE Transactions on Nuclear Science Dec 2004 146
22 Digital Single Event Transient Trends With Technology Node Scaling Joseph M. Benedetto, Paul H. Eaton, David G. Mavis et al. · IEEE Transactions on Nuclear Science Dec 2006 142
23 Heavy ion-induced digital single-event transients in deep submicron Processes Joseph M. Benedetto, Paul H. Eaton, Keith A. Avery et al. · IEEE Transactions on Nuclear Science Dec 2004 136
24 Stress intensities at notch singularities Martin L. Dunn, Wan Suwito, Shawn J. Cunningham · Engineering Fracture Mechanics Jul 1997 134
25 QUIETEST: a quiescent current testing methodology for detecting leakage faults Weiwei Mao, Ravi K. Gulati, D.K. Goel et al. Conference paper 4 Dec 2002 131
26 Fracture initiation at sharp notches under mode I, mode II, and mild mixed mode loading Martin L. Dunn, Wan Suwito, Shawn J. Cunningham et al. · International Journal of Fracture Apr 1997 130
27 Finite-Difference Analysis of EMP Coupling to Lossy Dielectric Structures Richard Holland, Larry Simpson, Karl S. Kunz · IEEE Transactions on Electromagnetic Compatibility Aug 1980 120
28 Robust bit extraction from images Jessica Fridrich Conference paper 20 Jan 2003 117
29 Velocity and interface depth determination by tomography of depth migration gathers Dan D. Kosloff, John W. C. Sherwood, Zvi Koren et al. · Geophysics Oct 1996 117
30 Low-noise AlInAsSb avalanche photodiode Madison Woodson, Min Ren, Scott J. Maddox et al. · Applied Physics Letters 22 Feb 2016 116
31 Viscous air damping in laterally driven microresonators Xia Zhang, William C. Tang Conference paper 17 Dec 2002 115
32 SEU and SET Modeling and Mitigation in Deep Submicron Technologies David G. Mavis, Paul H. Eaton Conference paper Apr 2007 114
33 A Three-Dimensional Finite-Difference Solution of the External Response of an Aircraft to a Complex Transient EM Environment: Part I-The Method and Its Implementation Karl S. Kunz, Kuan-min Lee · IEEE Transactions on Electromagnetic Compatibility May 1978 110
34 Hardness-assurance and testing issues for bipolar/BiCMOS devices R.N. Nowlin, Daniel M. Fleetwood, Ronald D. Schrimpf et al. · IEEE Transactions on Nuclear Science Open access Dec 1993 106
35 Implementation of an non-iterative implicit electromagnetic field solver for dense plasma simulation Dale R. Welch, D. V. Rose, Robert Emerson Clark et al. · Computer Physics Communications 23 Jul 2004 104
36 Fusion energy with lasers, direct drive targets, and dry wall chambers J. D. Sethian et al. · Nuclear Fusion Open access Dec 2003 99
37 Transient response of multiconductor transmission lines excited by a nonuniform electromagnetic field A.K. Agrawal, Harold J. Price, Shyam H. Gurbaxani Conference paper 1980 96
38 Three-dimensional calculations for a 4 kA, 3.5 MV, 2 microsecond injector with asymmetric power feed T.P. Hughes, Robert Emerson Clark, Simon S. Yu · Physical Review Special Topics - Accelerators and Beams Open access 15 Nov 1999 95
39 Filtered x-ray diode diagnostics fielded on the Z accelerator for source power measurements Gordon A. Chandler, C. Deeney, M. E. Cuneo et al. · Review of Scientific Instruments 1999 94
40 Smooth particle hydrodynamics R. F. Stellingwerf · Lecture notes in physics Book chapter 7 Apr 2008 92
41 1 000 000 °C/s thin film electrical heater: In situ resistivity measurements of Al and Ti/Si thin films during ultra rapid thermal annealing L. H. Allen, Ganpati Ramanath, S. L. Lai et al. · Applied Physics Letters 24 Jan 1994 90
42 Total-Field versus Scattered-Field Finite-Difference Codes: A Comparative Assessment Richard Holland, John Warren Williams · IEEE Transactions on Nuclear Science Dec 1983 90
43 Elastic moduli, strength, and fracture initiation at sharp notches in etched single crystal silicon microstructures Wan Suwito, Martin L. Dunn, Shawn J. Cunningham et al. · Journal of Applied Physics Apr 1999 88
44 An improved standard total dose test for CMOS space electronics Daniel M. Fleetwood, Peter S. Winokur, L.C. Riewe et al. · IEEE Transactions on Nuclear Science Dec 1989 88
45 Lightning return stroke. A numerical calculation of the optical radiation Alan H. Paxton, Robert L. Gardner, Louis C. W. Baker · The Physics of Fluids Aug 1986 86
46 Implementation of the Thin-Slot Formalism in the Finite-Difference EMP Code THREDII James L. Gilbert, Richard Holland · IEEE Transactions on Nuclear Science Dec 1981 85
47 Characterization of highly doped n- and p-type 6H-SiC piezoresistors Robert S. Okojie, Alex A. Ned, Anthony D. Kurtz et al. · IEEE Transactions on Electron Devices Apr 1998 81
48 High power, nearly diffraction-limited output from a semiconductor laser with an unstable resonator Michael L. Tilton, Gregory C. Dente, Alan H. Paxton et al. · IEEE Journal of Quantum Electronics 1991 80
49 Results of vacuum cleaning techniques on the performance of LiF field-threshold ion sources on extraction applied-B ion diodes at 1-10 TW M. E. Cuneo, Peter R. Menge, D. L. Hanson et al. · IEEE Transactions on Plasma Science Apr 1997 78
50 Is AVO the seismic signature of lithology? A case history of Ship Shoal-South Addition Fred Hilterman · The Leading Edge Jun 1990 78

Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for an institution when any of its authors gave it as an affiliation; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.