Ch. Lehrer
Ch. Lehrer publishes mostly in Electrical and Electronic Engineering, Computational Mechanics and Biomedical Engineering, on topics such as Integrated Circuits and Semiconductor Failure Analysis, Ion-surface interactions and analysis and Electron and X-Ray Spectroscopy Techniques.
- World rank
- #3,033,979 of 7,710,434 ranked researchers
- Rank in Germany
- #150,892 of 364,343
- Works
- 29
- Citations
- 764
- Citations per work
- 26.3
What does Ch. Lehrer research?
Ch. Lehrer's work is mostly in Engineering (66%), Materials Science (13%), Physics and Astronomy (13%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2791.9%
- Engineering1966.3%
- Materials Science412.8%
- Physics and Astronomy412.8%
- Everything else28.1%
- 1Electrical and Electronic Engineering28% of their works
- 2Computational Mechanics17% of their works
- 3Biomedical Engineering14% of their works
- 4Atomic and Molecular Physics, and Optics13% of their works
- 5Surfaces, Coatings and Films13% of their works
- 6Mechanics of Materials7% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- Ion-surface interactions and analysis
- Electron and X-Ray Spectroscopy Techniques
- Force Microscopy Techniques and Applications
- Metal and Thin Film Mechanics
- Near-Field Optical Microscopy
- Advanced Materials Characterization Techniques
- Semiconductor materials and devices
Which keywords describe Ch. Lehrer's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, X-ray Photoelectron Spectroscopy, Ion Beam, Surface Analysis, Electron Inelastic Mean Free Paths, Scanning Electron Microscopy and Atomic Force Microscopy.
- High-k Dielectrics
- Atom Probe Tomography
- Near-Field Optical Microscopy
- Nanoindentation
- Atomic Force Microscopy
- Electron Inelastic Mean Free Paths
- Ion Beam
- Integrated Circuits
- Failure Analysis
- X-ray Photoelectron Spectroscopy
- Surface Analysis
- Scanning Electron Microscopy
- Force Spectroscopy
- Thin Films
- Photonic Nanojets
- Atomic Layer Deposition
- Three-Dimensional Analysis
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Failure Analysis171 topic
- Integrated Circuits171 topic
- X-ray Photoelectron Spectroscopy162 topics
- Ion Beam151 topic
- Surface Analysis151 topic
- Electron Inelastic Mean Free Paths101 topic
- Scanning Electron Microscopy101 topic
- Atomic Force Microscopy81 topic
- Force Spectroscopy81 topic
- Nanoindentation61 topic
- Thin Films61 topic
- Near-Field Optical Microscopy51 topic
- Photonic Nanojets51 topic
- Atom Probe Tomography31 topic
- Atomic Layer Deposition31 topic
- High-k Dielectrics31 topic
- Three-Dimensional Analysis31 topic
Where does Ch. Lehrer work?
Ch. Lehrer's main affiliation in the publication record is Schott (Germany), Germany.
How many publications and citations does Ch. Lehrer have?
OpenAlex counts 29 works and 764 citations for Ch. Lehrer, an h-index of 15, ranking #3,033,979 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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