Charles J. Hitzman
Charles J. Hitzman publishes mostly in Electrical and Electronic Engineering, Computational Mechanics and Surfaces, Coatings and Films, on topics such as Ion-surface interactions and analysis, Electron and X-Ray Spectroscopy Techniques and Semiconductor materials and devices.
- World rank
- #3,416,433 of 7,710,434 ranked researchers
- Rank in United States
- #959,849 of 1,627,098
- Works
- 29
- Citations
- 737
- Citations per work
- 25.4
What does Charles J. Hitzman research?
Charles J. Hitzman's work is mostly in Engineering (55%), Materials Science (20%), Physics and Astronomy (8%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences2482.6%
- Engineering1654.7%
- Materials Science619.8%
- Physics and Astronomy28.1%
- Everything else517.4%
- 1Electrical and Electronic Engineering35% of their works
- 2Computational Mechanics16% of their works
- 3Surfaces, Coatings and Films14% of their works
- 4Atomic and Molecular Physics, and Optics8% of their works
- 5Materials Chemistry6% of their works
- 6Mechanics of Materials4% of their works
Research topics
- Ion-surface interactions and analysis
- Electron and X-Ray Spectroscopy Techniques
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon and Solar Cell Technologies
- Advanced Memory and Neural Computing
- Semiconductor materials and interfaces
- Photonic and Optical Devices
Which keywords describe Charles J. Hitzman's research?
The keywords of their largest research topics: Ion Beam, Surface Analysis, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Integrated Circuits, Atomic Layer Deposition, Failure Analysis and High-k Dielectrics.
- Silicon Photonics
- Schottky Barrier
- Metal-Semiconductor Contacts
- Silicon
- Solar Cells
- High-k Dielectrics
- Atomic Layer Deposition
- X-ray Photoelectron Spectroscopy
- Surface Analysis
- Ion Beam
- Scanning Electron Microscopy
- Integrated Circuits
- Failure Analysis
- Photon Emission Microscopy
- Efficiency
- Memristor
- Neuromorphic Computing
- Optical Modulators
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 18 words, with their numbers
- Ion Beam131 topic
- Surface Analysis131 topic
- Scanning Electron Microscopy111 topic
- X-ray Photoelectron Spectroscopy111 topic
- Integrated Circuits92 topics
- Atomic Layer Deposition71 topic
- Failure Analysis71 topic
- High-k Dielectrics71 topic
- Photon Emission Microscopy71 topic
- Solar Cells72 topics
- Efficiency41 topic
- Silicon41 topic
- Memristor31 topic
- Metal-Semiconductor Contacts31 topic
- Neuromorphic Computing31 topic
- Schottky Barrier31 topic
- Optical Modulators21 topic
- Silicon Photonics21 topic
Where does Charles J. Hitzman work?
Charles J. Hitzman's main affiliation in the publication record is Evans Analytical Group (United States), United States.
How many publications and citations does Charles J. Hitzman have?
OpenAlex counts 29 works and 737 citations for Charles J. Hitzman, an h-index of 10, ranking #3,416,433 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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