E. J. van Loenen
E. J. van Loenen publishes mostly in Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Surfaces, Coatings and Films, on topics such as Surface and Thin Film Phenomena, Electron and X-Ray Spectroscopy Techniques and Advanced Materials Characterization Techniques.
- World rank
- #791,303 of 7,710,434 ranked researchers
- Rank in Netherlands
- #18,914 of 107,149
- Works
- 91
- Citations
- 3.4k
- Citations per work
- 37.4
What does E. J. van Loenen research?
E. J. van Loenen's work is mostly in Physics and Astronomy (32%), Engineering (31%), Materials Science (8%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences6571.3%
- Physics and Astronomy2932.1%
- Engineering2830.9%
- Materials Science88.3%
- Everything else2628.7%
- 1Atomic and Molecular Physics, and Optics32% of their works
- 2Electrical and Electronic Engineering11% of their works
- 3Surfaces, Coatings and Films8% of their works
- 4Biomedical Engineering8% of their works
- 5Building and Construction6% of their works
- 6Computational Mechanics6% of their works
Research topics
- Surface and Thin Film Phenomena
- Electron and X-Ray Spectroscopy Techniques
- Advanced Materials Characterization Techniques
- Force Microscopy Techniques and Applications
- Semiconductor materials and interfaces
- Ion-surface interactions and analysis
- Building Energy and Comfort Optimization
- Advanced Electron Microscopy Techniques and Applications
Which keywords describe E. J. van Loenen's research?
The keywords of their largest research topics: Quantum Size Effects, Superconductivity, Scanning Electron Microscopy, X-ray Photoelectron Spectroscopy, Atom Probe Tomography, Three-Dimensional Analysis, Atomic Force Microscopy and Force Spectroscopy.
- Single-Particle Analysis
- Thermal Comfort
- Surface Analysis
- Schottky Barrier
- Force Spectroscopy
- Three-Dimensional Analysis
- X-ray Photoelectron Spectroscopy
- Superconductivity
- Quantum Size Effects
- Scanning Electron Microscopy
- Atom Probe Tomography
- Atomic Force Microscopy
- Metal-Semiconductor Contacts
- Ion Beam
- Building Energy Consumption
- Cryo-Electron Microscopy
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 16 words, with their numbers
- Quantum Size Effects401 topic
- Superconductivity401 topic
- Scanning Electron Microscopy221 topic
- X-ray Photoelectron Spectroscopy221 topic
- Atom Probe Tomography201 topic
- Three-Dimensional Analysis201 topic
- Atomic Force Microscopy191 topic
- Force Spectroscopy191 topic
- Metal-Semiconductor Contacts181 topic
- Schottky Barrier181 topic
- Ion Beam151 topic
- Surface Analysis151 topic
- Building Energy Consumption141 topic
- Thermal Comfort141 topic
- Cryo-Electron Microscopy111 topic
- Single-Particle Analysis111 topic
Where does E. J. van Loenen work?
E. J. van Loenen's main affiliation in the publication record is Philips (Netherlands), Netherlands.
How many publications and citations does E. J. van Loenen have?
OpenAlex counts 91 works and 3,403 citations for E. J. van Loenen, an h-index of 31, ranking #791,303 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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