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Researcher · University of New Mexico · United States

Forrest L. Williams

Forrest L. Williams publishes mostly in Electrical and Electronic Engineering, Computational Mechanics and Materials Chemistry, on topics such as Surface Roughness and Optical Measurements, Optical Coatings and Gratings and Semiconductor materials and devices.

OpenAlex
World rank
#7,117,108
of 7,710,434 ranked researchers
Rank in United States
#1,584,567
of 1,627,098
Works
21
Citations
101
Citations per work
4.8
h-index
6
i10-index 4Top 82% in Electrical and Electronic Engineering
Forrest L. Williams

What does Forrest L. Williams research?

Forrest L. Williams's work is mostly in Engineering (52%), Materials Science (28%), Physics and Astronomy (7%).

Physical Sciences: 18 works · 86.6% of their workEngineering: 11 works · 51.6% of their workElectrical and Electronic Engineering: 5 works · 23.3% of their workComputational Mechanics: 4 works · 20.0% of their workMechanics of Materials: 2 works · 8.3% of their workMaterials Science: 6 works · 28.3% of their workMaterials Chemistry: 3 works · 15.0% of their workSurfaces, Coatings and Films: 3 works · 13.3% of their workPhysics and Astronomy: 1 works · 6.7% of their workAtomic and Molecular Physics, and Optics: 1 works · 6.7% of their workEverything else: 3 works · 13.4% of their workTHEIR WORKForrest L.Williams21works
Physical Sciences87%

Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.

The fields and subfields, with their numbers
    1. Engineering1151.6%
    2. Materials Science628.3%
    3. Physics and Astronomy16.7%
  2. Everything else313.4%
  1. 1Electrical and Electronic Engineering23% of their works
  2. 2Computational Mechanics20% of their works
  3. 3Materials Chemistry15% of their works
  4. 4Surfaces, Coatings and Films13% of their works
  5. 5Mechanics of Materials8% of their works
  6. 6Atomic and Molecular Physics, and Optics7% of their works

Research topics

Which keywords describe Forrest L. Williams's research?

The keywords of their largest research topics: Photonic Crystals, Nanostructures, Antireflective Coatings, Frequency Conversion, Roughness Measurement, Surface Characterization, Thin-Film Materials and Atomic Layer Deposition.

Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.

All 19 words, with their numbers
  1. Photonic Crystals122 topics
  2. Nanostructures112 topics
  3. Antireflective Coatings81 topic
  4. Frequency Conversion82 topics
  5. Roughness Measurement81 topic
  6. Surface Characterization81 topic
  7. Thin-Film Materials81 topic
  8. Atomic Layer Deposition51 topic
  9. High-k Dielectrics51 topic
  10. Nanoindentation51 topic
  11. Thin Films51 topic
  12. Lithium Niobate41 topic
  13. Photonics41 topic
  14. Solid-State Lasers41 topic
  15. Ytterbium41 topic
  16. Ion Beam31 topic
  17. Nanodiamonds31 topic
  18. Quantum Sensing31 topic
  19. Surface Analysis31 topic

Where does Forrest L. Williams work?

Forrest L. Williams's main affiliation in the publication record is University of New Mexico, United States.

How many publications and citations does Forrest L. Williams have?

OpenAlex counts 21 works and 101 citations for Forrest L. Williams, an h-index of 6, ranking #7,117,108 of 7,710,434 researchers worldwide on the quality score.

Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.

Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.

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