Harold E. Boesch
Harold E. Boesch publishes mostly in Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry, on topics such as Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #335,380 of 7,710,434 ranked researchers
- Rank in United States
- #120,704 of 1,627,098
- Works
- 70
- Citations
- 3.4k
- Citations per work
- 48.1
What does Harold E. Boesch research?
Harold E. Boesch's work is mostly in Engineering (71%), Physics and Astronomy (10%), Materials Science (7%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences6288.6%
- Engineering5071.4%
- Physics and Astronomy710.5%
- Materials Science56.7%
- Everything else811.4%
- 1Electrical and Electronic Engineering66% of their works
- 2Atomic and Molecular Physics, and Optics10% of their works
- 3Materials Chemistry5% of their works
- 4Mechanics of Materials3% of their works
- 5Aerospace Engineering2% of their works
- 6Electronic, Optical and Magnetic Materials2% of their works
Research topics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and interfaces
- Radiation Effects in Electronics
- Silicon and Solar Cell Technologies
- Advanced Memory and Neural Computing
- Flow Measurement and Analysis
Which keywords describe Harold E. Boesch's research?
The keywords of their largest research topics: Nanoelectronics, Atomic Layer Deposition, High-k Dielectrics, Nanowire Transistors, Tunnel Field-Effect Transistors, Solar Cells, Failure Analysis and Integrated Circuits.
- Ultrasonic
- Neuromorphic Computing
- Silicon
- Soft Errors
- Schottky Barrier
- Integrated Circuits
- Solar Cells
- Nanowire Transistors
- Atomic Layer Deposition
- Nanoelectronics
- High-k Dielectrics
- Tunnel Field-Effect Transistors
- Failure Analysis
- Metal-Semiconductor Contacts
- Radiation Effects
- Efficiency
- Memristor
- Flow Measurement
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most. The words come from the keyword list OpenAlex gives each topic, not from the text of the papers, so a word can appear that none of the papers uses.
All 18 words, with their numbers
- Nanoelectronics672 topics
- Atomic Layer Deposition571 topic
- High-k Dielectrics571 topic
- Nanowire Transistors261 topic
- Tunnel Field-Effect Transistors261 topic
- Solar Cells252 topics
- Failure Analysis241 topic
- Integrated Circuits241 topic
- Metal-Semiconductor Contacts171 topic
- Schottky Barrier171 topic
- Radiation Effects101 topic
- Soft Errors101 topic
- Efficiency81 topic
- Silicon81 topic
- Memristor51 topic
- Neuromorphic Computing51 topic
- Flow Measurement41 topic
- Ultrasonic41 topic
Where does Harold E. Boesch work?
Harold E. Boesch's main affiliation in the publication record is Adelphi Laboratory Center, United States.
How many publications and citations does Harold E. Boesch have?
OpenAlex counts 70 works and 3,370 citations for Harold E. Boesch, an h-index of 31, ranking #335,380 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised citation excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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