John C. Forster
John C. Forster publishes mostly in Electrical and Electronic Engineering, Mechanics of Materials and Electronic, Optical and Magnetic Materials, on topics such as Plasma Diagnostics and Applications, Metal and Thin Film Mechanics and Copper Interconnects and Reliability.
- World rank
- #770,157 of 7,710,434 ranked researchers
- Rank in United States
- #258,001 of 1,627,098
- Works
- 51
- Citations
- 2.1k
- Citations per work
- 41.2
What does John C. Forster research?
John C. Forster's work is mostly in Engineering (49%), Physics and Astronomy (15%), Materials Science (9%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences3772.2%
- Engineering2548.8%
- Physics and Astronomy714.6%
- Materials Science48.8%
- Everything else1427.8%
- 1Electrical and Electronic Engineering33% of their works
- 2Mechanics of Materials10% of their works
- 3Electronic, Optical and Magnetic Materials9% of their works
- 4Atomic and Molecular Physics, and Optics7% of their works
- 5Nuclear and High Energy Physics7% of their works
- 6Aerospace Engineering6% of their works
Research topics
Which keywords describe John C. Forster's research?
The keywords of their largest research topics: Thin Films, Plasma Etching, Semiconductor Industry, Coatings, Low-k Dielectrics, Microelectronics, Nanoindentation and Atomic Layer Deposition.
- Ionization
- Ionosphere
- Negative Ion Sources
- Tokamak
- Atomic Layer Deposition
- Microelectronics
- Coatings
- Plasma Etching
- Thin Films
- Semiconductor Industry
- Low-k Dielectrics
- Nanoindentation
- High-k Dielectrics
- Turbulence
- Superconducting Cavities
- Magnetosphere
- Mass Spectrometry
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Thin Films242 topics
- Plasma Etching231 topic
- Semiconductor Industry231 topic
- Coatings121 topic
- Low-k Dielectrics121 topic
- Microelectronics121 topic
- Nanoindentation121 topic
- Atomic Layer Deposition101 topic
- High-k Dielectrics101 topic
- Tokamak81 topic
- Turbulence81 topic
- Negative Ion Sources61 topic
- Superconducting Cavities61 topic
- Ionosphere51 topic
- Magnetosphere51 topic
- Ionization31 topic
- Mass Spectrometry31 topic
Where does John C. Forster work?
John C. Forster's main affiliation in the publication record is Applied Materials (United States), United States.
How many publications and citations does John C. Forster have?
OpenAlex counts 51 works and 2,099 citations for John C. Forster, an h-index of 18, ranking #770,157 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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