John M. Carulli
John M. Carulli publishes mostly in Electrical and Electronic Engineering, Hardware and Architecture and Industrial and Manufacturing Engineering, on topics such as VLSI and Analog Circuit Testing, Integrated Circuits and Semiconductor Failure Analysis and Industrial Vision Systems and Defect Detection.
- World rank
- #893,558 of 1,633,909 ranked researchers
- Rank in United States
- #245,836 of 358,040
- Works
- 17
- Citations
- 53
- Citations per work
- 3.1
What does John M. Carulli research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering37% of their works
- 2Hardware and Architecture22% of their works
- 3Industrial and Manufacturing Engineering18% of their works
- 4Statistics and Probability7% of their works
- 5Mechanical Engineering7% of their works
- 6Artificial Intelligence4% of their works
Research topics
- VLSI and Analog Circuit Testing
- Integrated Circuits and Semiconductor Failure Analysis
- Industrial Vision Systems and Defect Detection
- Gaussian Processes and Bayesian Inference
- Electrostatic Discharge in Electronics
- Advancements in Photolithography Techniques
- Radiation Effects in Electronics
- 3D IC and TSV technologies
Which keywords describe John M. Carulli's research?
The keywords of their largest research topics: Deep Learning, Embedded Cores, Test Data Compression, Fabric Defect Detection, Failure Analysis, Integrated Circuits, Machine Vision and CMOS Technology.
- Through-Silicon Via
- SCR Devices
- Nanofabrication
- Interconnect
- Electron Beam Lithography
- CMOS Technology
- Integrated Circuits
- Fabric Defect Detection
- Embedded Cores
- Deep Learning
- Test Data Compression
- Failure Analysis
- Machine Vision
- ESD Protection
- Gaussian Processes
- Machine Learning
- Radiation Effects
- Soft Errors
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Deep Learning62 topics
- Embedded Cores61 topic
- Test Data Compression61 topic
- Fabric Defect Detection51 topic
- Failure Analysis51 topic
- Integrated Circuits51 topic
- Machine Vision51 topic
- CMOS Technology22 topics
- ESD Protection11 topic
- Electron Beam Lithography11 topic
- Gaussian Processes11 topic
- Interconnect11 topic
- Machine Learning11 topic
- Nanofabrication11 topic
- Radiation Effects11 topic
- SCR Devices11 topic
- Soft Errors11 topic
- Through-Silicon Via11 topic
Where does John M. Carulli work?
John M. Carulli's main affiliation in the publication record is Texas Instruments (United States), United States.
How many publications and citations does John M. Carulli have?
Science Explorer counts 17 works and 53 citations for John M. Carulli, ranking #893,558 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.