Science Explorer Interactive view Map

VLSI and Analog Circuit Testing

VLSI and Analog Circuit Testing is a research topic within Hardware and Architecture. Science Explorer counts 32k research works in it since 1950. 12.4% of them reached the world's top 10% most cited for their field and year.

This cluster of papers focuses on various aspects of testing Very Large Scale Integration (VLSI) circuits, including techniques such as test data compression, embedded cores testing, scan testing, analog circuit fault diagnosis, BIST schemes, test access architectures, low-power testing, and delay fault testing.

  • Test Data Compression
  • Embedded Cores
  • Scan Testing
  • Analog Circuit Fault Diagnosis
  • BIST Scheme
  • Test Access Architecture
  • Low-Power Testing
  • Test Vector Compression
  • System-on-a-Chip Test
  • Delay Fault Testing
Research works
32k
fractional, since 1950
In the world top 10%
4k
per year above
Top-10% rate
12.4%
share of its works in the world top 10%
Growth, 2013–17 → 2018–22
-21%
the tick is no change

Which countries lead VLSI and Analog Circuit Testing research?

By volume, China and the United States publish the most (789 and 610 works in 2022–2025).

By volume, 2022–2025

  1. 1 China 789 works
  2. 2 United States 610 works
  3. 3 India 481 works
  4. 4 Germany 173 works
  5. 5 South Korea 140 works
  6. 6 Japan 107 works
  7. 7 Taiwan 107 works
  8. 8 France 86 works
  9. 9 Italy 86 works
  10. 10 United Kingdom 63 works

How concentrated that is

The same countries as shares of everything the list above accounts for. A node where two countries do two thirds of the work and one spread evenly across twelve read alike as a ranking and not at all alike here.

China: 29.9%United States: 23.1%India: 18.2%Germany: 6.5%6 others listed: 22.3%30%largest
China789 · 29.9%United States610 · 23.1%India481 · 18.2%Germany173 · 6.5%6 others listed589 · 22.3%

Shares of the rows listed above, not of the whole node.

Which institutions lead VLSI and Analog Circuit Testing research?

By volume in 2022–2025, Samsung (South Korea) publishes the most VLSI and Analog Circuit Testing research, followed by Purdue University West Lafayette and Intel (United States).

Who are the leading researchers in VLSI and Analog Circuit Testing?

The most-cited researchers publishing on VLSI and Analog Circuit Testing include K. De and Luca Benini.

  1. 1 K. De United States 7.6k citations
  2. 2 Luca Benini Italy 4.6k citations

Ranked by citations received across their whole record, among researchers with at least three works on this topic.

Where is VLSI and Analog Circuit Testing research done?

The largest centres of VLSI and Analog Circuit Testing research in 2022–2025 are Beijing (China), Seoul (South Korea), Shanghai (China) and Bengaluru (India). Among places with at least 20 works in it, it is an unusually large share of all research in Santa Clara and Hsinchu.

Largest cities, 2022–2025

  1. 1 Beijing China 197 works
  2. 2 Seoul South Korea 95 works
  3. 3 Shanghai China 82 works
  4. 4 Bengaluru India 61 works
  5. 5 Xi'an China 58 works
  6. 6 Nanjing China 53 works
  7. 7 Santa Clara United States 48 works
  8. 8 Hsinchu Taiwan 43 works
  9. 9 Hefei China 39 works
  10. 10 Coimbatore India 37 works

Where it is the local speciality

  1. Santa ClaraUS · 48.5 works58×
  2. HsinchuTW · 43.2 works16×
← less than its size predictsmore →

Location quotient: how much more of its research is in VLSI and Analog Circuit Testing than the world average.

See VLSI and Analog Circuit Testing on the map

Where is the best place to study VLSI and Analog Circuit Testing?

Among universities, judged by research, Amrita Vishwa Vidyapeetham, Politecnico di Torino and Anhui University score highest, combining excellence, specialisation, size, growth and international reach. Research strength is one signal when choosing where to study; it does not measure teaching.

0%20%40%mean 15.18%fractional works in this node (log) →share in the world top 10% →Amrita Vishwa Vidyapeetham: 24, 14.5%Politecnico di Torino: 23, 12.0%Anhui University: 14, 20.1%University of Florida: 17, 21.1%The University of Texas at Dallas: 9, 14.5%Xidian University: 22, 7.8%Chinese University of Hong Kong: 10, 30.7%Iowa State University: 9, 21.5%University of Bremen: 12, 7.7%Purdue University West Lafayette: 26, 1.9%University of FloridaAnhui UniversityAmrita Vishwa Vidyap…Politecnico di Torino
above the meannear itbelow it

One dot per university in the table below. The upper left is the interesting corner: small places doing unusually strong work.

#UniversityScoreTop 10%SpecialisationWorksGrowth
1 Amrita Vishwa VidyapeethamIndia 72.714.5%13.9×24 +226.4%
2 Politecnico di TorinoItaly 60.712.0%15.7×23 -2.9%
3 Anhui UniversityChina 55.420.1%9.6×14 -18.9%
4 University of FloridaUnited States 55.321.1%5.3×17 +98.3%
5 The University of Texas at DallasUnited States 51.014.5%14.0×9 +66.3%
6 Xidian UniversityChina 50.77.8%9.6×22 -25.9%
7 Chinese University of Hong KongHong Kong 50.130.7%4.3×10 -52.4%
8 Iowa State UniversityUnited States 46.221.5%7.9×9 -22.2%
9 University of BremenGermany 45.17.7%15.8×12 -3.6%
10 Purdue University West LafayetteUnited States 44.71.9%8.4×26 -23.6%

Universities only. Score blends excellence (30%), specialisation (25%), size (20%), growth (15%) and international reach (10%), 2015–2022; growth compares 2010–14 with 2015–19.

Is VLSI and Analog Circuit Testing research growing?

Output in 2018–2022 was 21% lower than in 2013–2017, peaking in 2002.

19801990200020102020
grewheldshrank

The same series as a ribbon — one cell per year, darker for more. The line above answers how much; this answers when.

Which topics inside it are moving

Growth and decline on one axis around a shared zero. Two lists side by side hide the thing that matters: whether the growth dwarfs the decline, or the other way round.