VLSI and Analog Circuit Testing

VLSI and Analog Circuit Testing is a research topic within Hardware and Architecture. Science Explorer counts 32k research works in it since 1950. 10.0% of them reached the world's top 10% most cited for their field and year.

This cluster of papers focuses on various aspects of testing Very Large Scale Integration (VLSI) circuits, including techniques such as test data compression, embedded cores testing, scan testing, analog circuit fault diagnosis, BIST schemes, test access architectures, low-power testing, and delay fault testing.

• Test Data Compression
• Embedded Cores
• Scan Testing
• Analog Circuit Fault Diagnosis
• BIST Scheme
• Test Access Architecture
• Low-Power Testing
• Test Vector Compression
• System-on-a-Chip Test
• Delay Fault Testing