M. Haond
M. Haond publishes mostly in Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Hardware and Architecture, on topics such as Semiconductor materials and devices, Advancements in Semiconductor Devices and Circuit Design and Integrated Circuits and Semiconductor Failure Analysis.
- World rank
- #663,751 of 1,633,909 ranked researchers
- Rank in France
- #40,879 of 96,116
- Works
- 45
- Citations
- 116
- Citations per work
- 2.6
What does M. Haond research?
Shares of their own output, by the field each of their topics belongs to. The grey slice is everything not listed.
- 1Electrical and Electronic Engineering90% of their works
- 2Atomic and Molecular Physics, and Optics6% of their works
- 3Hardware and Architecture3% of their works
- 4Automotive Engineering1% of their works
Research topics
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
- Electrostatic Discharge in Electronics
- Silicon and Solar Cell Technologies
- Thin-Film Transistor Technologies
- Semiconductor materials and interfaces
Which keywords describe M. Haond's research?
The keywords of their largest research topics: Atomic Layer Deposition, High-k Dielectrics, Nanowire Transistors, Tunnel Field-Effect Transistors, Failure Analysis, Integrated Circuits, Solar Cells and Reliability.
- Schottky Barrier
- Metal-Semiconductor Contacts
- Efficiency
- CMOS Technology
- Reliability
- Integrated Circuits
- Tunnel Field-Effect Transistors
- High-k Dielectrics
- Atomic Layer Deposition
- Nanowire Transistors
- Failure Analysis
- Solar Cells
- Wide Bandgap Semiconductors
- ESD Protection
- Silicon
- Plasmonics
- Thin-Film Transistors
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Atomic Layer Deposition191 topic
- High-k Dielectrics191 topic
- Nanowire Transistors181 topic
- Tunnel Field-Effect Transistors181 topic
- Failure Analysis81 topic
- Integrated Circuits81 topic
- Solar Cells73 topics
- Reliability41 topic
- Wide Bandgap Semiconductors41 topic
- CMOS Technology31 topic
- ESD Protection31 topic
- Efficiency31 topic
- Silicon31 topic
- Metal-Semiconductor Contacts21 topic
- Plasmonics21 topic
- Schottky Barrier21 topic
- Thin-Film Transistors21 topic
Where does M. Haond work?
M. Haond's main affiliation in the publication record is STMicroelectronics (France), France.
How many publications and citations does M. Haond have?
Science Explorer counts 45 works and 116 citations for M. Haond, ranking #663,751 of 1,633,909 researchers worldwide on the composite score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics are in the interactive view on the map. Is this your page? Request a correction or removal.