Shigenori Nawata
Shigenori Nawata publishes mostly in Surfaces, Coatings and Films, Structural Biology and Electrical and Electronic Engineering, on topics such as Advanced Electron Microscopy Techniques and Applications, Optical Coatings and Gratings and Electron and X-Ray Spectroscopy Techniques.
- World rank
- #6,844,639 of 7,710,434 ranked researchers
- Rank in Japan
- #292,737 of 383,136
- Works
- 16
- Citations
- 10
- Citations per work
- 0.6
What does Shigenori Nawata research?
Shigenori Nawata's work is mostly in Engineering (26%), Materials Science (18%), Biochemistry, Genetics and Molecular Biology (10%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences953.9%
- Engineering425.7%
- Materials Science317.9%
- Physics and Astronomy210.3%
- Everything else635.8%
- Life Sciences210.3%
- 1Surfaces, Coatings and Films18% of their works
- 2Structural Biology10% of their works
- 3Electrical and Electronic Engineering10% of their works
- 4Atomic and Molecular Physics, and Optics10% of their works
- 5Computational Mechanics8% of their works
- 6Biomedical Engineering8% of their works
Research topics
- Advanced Electron Microscopy Techniques and Applications
- Optical Coatings and Gratings
- Electron and X-Ray Spectroscopy Techniques
- Force Microscopy Techniques and Applications
- Advanced optical system design
- Surface Roughness and Optical Measurements
- Photonic and Optical Devices
- Advanced Measurement and Metrology Techniques
Which keywords describe Shigenori Nawata's research?
The keywords of their largest research topics: Image Processing, Antireflective Coatings, Cryo-Electron Microscopy, Nanostructures, Single-Particle Analysis, Atomic Force Microscopy, Force Spectroscopy and Scanning Electron Microscopy.
- Silicon Photonics
- Optical Modulators
- Error Compensation
- Compound Eyes
- Scanning Electron Microscopy
- Atomic Force Microscopy
- Nanostructures
- Antireflective Coatings
- Image Processing
- Cryo-Electron Microscopy
- Single-Particle Analysis
- Force Spectroscopy
- X-ray Photoelectron Spectroscopy
- Dimensional Metrology
- Freeform Optics
- Roughness Measurement
- Surface Characterization
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Image Processing62 topics
- Antireflective Coatings41 topic
- Cryo-Electron Microscopy41 topic
- Nanostructures41 topic
- Single-Particle Analysis41 topic
- Atomic Force Microscopy31 topic
- Force Spectroscopy31 topic
- Scanning Electron Microscopy31 topic
- X-ray Photoelectron Spectroscopy31 topic
- Compound Eyes21 topic
- Dimensional Metrology21 topic
- Error Compensation21 topic
- Freeform Optics21 topic
- Optical Modulators21 topic
- Roughness Measurement21 topic
- Silicon Photonics21 topic
- Surface Characterization21 topic
Where does Shigenori Nawata work?
Shigenori Nawata's main affiliation in the publication record is Tohoku University, Japan.
How many publications and citations does Shigenori Nawata have?
OpenAlex counts 16 works and 10 citations for Shigenori Nawata, an h-index of 2, ranking #6,844,639 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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