Thomas N. Horsky
Thomas N. Horsky publishes mostly in Electrical and Electronic Engineering, Mechanics of Materials and Atomic and Molecular Physics, and Optics, on topics such as Muon and positron interactions and applications, Semiconductor materials and devices and Ion-surface interactions and analysis.
- World rank
- #5,785,751 of 7,710,434 ranked researchers
- Rank in United States
- #1,430,757 of 1,627,098
- Works
- 53
- Citations
- 369
- Citations per work
- 7.0
What does Thomas N. Horsky research?
Thomas N. Horsky's work is mostly in Engineering (61%), Materials Science (11%), Physics and Astronomy (11%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences4482.7%
- Engineering3260.9%
- Materials Science610.9%
- Physics and Astronomy610.9%
- Everything else917.3%
- 1Electrical and Electronic Engineering41% of their works
- 2Mechanics of Materials13% of their works
- 3Atomic and Molecular Physics, and Optics11% of their works
- 4Computational Mechanics7% of their works
- 5Surfaces, Coatings and Films6% of their works
- 6Materials Chemistry5% of their works
Research topics
- Muon and positron interactions and applications
- Semiconductor materials and devices
- Ion-surface interactions and analysis
- Silicon and Solar Cell Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- Electron and X-Ray Spectroscopy Techniques
- Atomic and Molecular Physics
- Photonic and Optical Devices
Which keywords describe Thomas N. Horsky's research?
The keywords of their largest research topics: Nanostructures, Integrated Circuits, Defect Identification, Positron Annihilation, Atomic Layer Deposition, High-k Dielectrics, Ion Beam and Surface Analysis.
- Silicon Photonics
- X-ray Photoelectron Spectroscopy
- Silicon
- Photon Emission Microscopy
- Failure Analysis
- Surface Analysis
- High-k Dielectrics
- Positron Annihilation
- Integrated Circuits
- Nanostructures
- Defect Identification
- Atomic Layer Deposition
- Ion Beam
- DNA Strand Breaks
- Low-Energy Electrons
- Scanning Electron Microscopy
- Solar Cells
- Optical Modulators
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 18 words, with their numbers
- Nanostructures252 topics
- Integrated Circuits162 topics
- Defect Identification141 topic
- Positron Annihilation141 topic
- Atomic Layer Deposition121 topic
- High-k Dielectrics121 topic
- Ion Beam111 topic
- Surface Analysis111 topic
- DNA Strand Breaks91 topic
- Failure Analysis91 topic
- Low-Energy Electrons91 topic
- Photon Emission Microscopy91 topic
- Scanning Electron Microscopy91 topic
- Silicon91 topic
- Solar Cells91 topic
- X-ray Photoelectron Spectroscopy91 topic
- Optical Modulators71 topic
- Silicon Photonics71 topic
Where does Thomas N. Horsky work?
Thomas N. Horsky's main affiliation in the publication record is Optron Systems (United States), United States.
How many publications and citations does Thomas N. Horsky have?
OpenAlex counts 53 works and 369 citations for Thomas N. Horsky, an h-index of 9, ranking #5,785,751 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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