Woong Jae Chung
Woong Jae Chung publishes mostly in Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Mechanical Engineering, on topics such as Advancements in Photolithography Techniques, Industrial Vision Systems and Defect Detection and Advanced Surface Polishing Techniques.
- World rank
- #6,759,039 of 7,710,434 ranked researchers
- Rank in United States
- #1,552,848 of 1,627,098
- Works
- 15
- Citations
- 54
- Citations per work
- 3.6
What does Woong Jae Chung research?
Woong Jae Chung's work is mostly in Engineering (78%), Computer Science (4%), Materials Science (4%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences1386.6%
- Engineering1277.8%
- Computer Science14.4%
- Materials Science14.4%
- Everything else213.4%
- 1Electrical and Electronic Engineering38% of their works
- 2Industrial and Manufacturing Engineering18% of their works
- 3Mechanical Engineering13% of their works
- 4Biomedical Engineering9% of their works
- 5Computer Vision and Pattern Recognition4% of their works
- 6Surfaces, Coatings and Films4% of their works
Research topics
- Advancements in Photolithography Techniques
- Industrial Vision Systems and Defect Detection
- Advanced Surface Polishing Techniques
- Advanced Measurement and Metrology Techniques
- Integrated Circuits and Semiconductor Failure Analysis
- Optical Coatings and Gratings
- Optical measurement and interference techniques
- Image and Object Detection Techniques
Which keywords describe Woong Jae Chung's research?
The keywords of their largest research topics: Nanofabrication, Electron Beam Lithography, Resolution Limits, Fabric Defect Detection, Machine Vision, Chemical Mechanical Planarization, Dimensional Metrology and Error Compensation.
- Line Detection
- Camera Calibration
- Antireflective Coatings
- Failure Analysis
- Error Compensation
- Chemical Mechanical Planarization
- Fabric Defect Detection
- Electron Beam Lithography
- Nanofabrication
- Resolution Limits
- Machine Vision
- Dimensional Metrology
- Material Removal Mechanism
- Integrated Circuits
- Nanostructures
- Hough Transform
- Structured Light
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 17 words, with their numbers
- Nanofabrication152 topics
- Electron Beam Lithography131 topic
- Resolution Limits131 topic
- Fabric Defect Detection71 topic
- Machine Vision71 topic
- Chemical Mechanical Planarization41 topic
- Dimensional Metrology41 topic
- Error Compensation41 topic
- Material Removal Mechanism41 topic
- Failure Analysis31 topic
- Integrated Circuits31 topic
- Antireflective Coatings21 topic
- Nanostructures21 topic
- Camera Calibration11 topic
- Hough Transform11 topic
- Line Detection11 topic
- Structured Light11 topic
Where does Woong Jae Chung work?
Woong Jae Chung's main affiliation in the publication record is GlobalFoundries (United States), United States.
How many publications and citations does Woong Jae Chung have?
OpenAlex counts 15 works and 54 citations for Woong Jae Chung, an h-index of 5, ranking #6,759,039 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
Discussion
Ask a question or share a note about Woong Jae Chung. Posts are plain text and can be reported.