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Researcher · Nashua Community College · United States

Yair Kipman

Yair Kipman publishes mostly in Industrial and Manufacturing Engineering, Electrical and Electronic Engineering and Computer Vision and Pattern Recognition, on topics such as Industrial Vision Systems and Defect Detection, Surface Roughness and Optical Measurements and Image Processing Techniques and Applications.

OpenAlex
World rank
#6,830,985
of 7,710,434 ranked researchers
Rank in United States
#1,559,699
of 1,627,098
Works
32
Citations
45
Citations per work
1.4
h-index
3
i10-index 1Top 93% in Industrial and Manufacturing Engineering (Engineering)
Yair Kipman

What does Yair Kipman research?

Yair Kipman's work is mostly in Engineering (61%), Computer Science (17%).

Physical Sciences: 25 works · 77.6% of their workEngineering: 19 works · 60.7% of their workIndustrial and Manufacturing Engineering: 9 works · 26.8% of their workElectrical and Electronic Engineering: 5 works · 16.9% of their workComputational Mechanics: 3 works · 8.5% of their workMedia Technology: 3 works · 8.5% of their workComputer Science: 5 works · 16.9% of their workComputer Vision and Pattern Recognition: 4 works · 12.7% of their workHuman-Computer Interaction: 1 works · 4.2% of their workEverything else: 7 works · 22.4% of their workTHEIR WORKYair Kipman32works
Physical Sciences78%

Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.

The fields and subfields, with their numbers
    1. Engineering1960.7%
    2. Computer Science516.9%
  2. Everything else722.4%
  1. 1Industrial and Manufacturing Engineering27% of their works
  2. 2Electrical and Electronic Engineering17% of their works
  3. 3Computer Vision and Pattern Recognition13% of their works
  4. 4Media Technology8% of their works
  5. 5Computational Mechanics8% of their works
  6. 6Human-Computer Interaction4% of their works

Research topics

Which keywords describe Yair Kipman's research?

The keywords of their largest research topics: Machine Vision, Fabric Defect Detection, Texture Analysis, Image Processing, Autofocusing, Depth Estimation, Roughness Measurement and Surface Characterization.

Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.

All 18 words, with their numbers
  1. Machine Vision263 topics
  2. Fabric Defect Detection161 topic
  3. Texture Analysis161 topic
  4. Image Processing102 topics
  5. Autofocusing51 topic
  6. Depth Estimation51 topic
  7. Roughness Measurement51 topic
  8. Surface Characterization51 topic
  9. Electron Beam Lithography41 topic
  10. Nanofabrication41 topic
  11. 3D Printing31 topic
  12. Additive Manufacturing31 topic
  13. Camera Calibration31 topic
  14. Digital Microfluidics31 topic
  15. Interaction Techniques31 topic
  16. Microfluidics31 topic
  17. Structured Light31 topic
  18. Tangible User Interfaces31 topic

Where does Yair Kipman work?

Yair Kipman's main affiliation in the publication record is Nashua Community College, United States.

How many publications and citations does Yair Kipman have?

OpenAlex counts 32 works and 45 citations for Yair Kipman, an h-index of 3, ranking #6,830,985 of 7,710,434 researchers worldwide on the quality score.

Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.

Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.

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