Zhihong Mai
Zhihong Mai publishes mostly in Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics, on topics such as Integrated Circuits and Semiconductor Failure Analysis, Semiconductor materials and devices and Force Microscopy Techniques and Applications.
- World rank
- #5,208,896 of 7,710,434 ranked researchers
- Rank in Singapore
- #20,112 of 23,642
- Works
- 123
- Citations
- 1.1k
- Citations per work
- 8.9
What does Zhihong Mai research?
Zhihong Mai's work is mostly in Engineering (56%), Materials Science (10%), Physics and Astronomy (9%).
Their six largest subfields, inside their fields and domains; the grey slice is everything else they publish. The interactive view splits every one of their works down to single topics.
The fields and subfields, with their numbers
- Physical Sciences9274.9%
- Engineering6956.0%
- Materials Science129.6%
- Physics and Astronomy119.3%
- Everything else3125.1%
- 1Electrical and Electronic Engineering39% of their works
- 2Biomedical Engineering13% of their works
- 3Atomic and Molecular Physics, and Optics9% of their works
- 4Materials Chemistry6% of their works
- 5Surfaces, Coatings and Films4% of their works
- 6Computational Mechanics4% of their works
Research topics
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Force Microscopy Techniques and Applications
- Advanced Surface Polishing Techniques
- Near-Field Optical Microscopy
- Electron and X-Ray Spectroscopy Techniques
- Industrial Vision Systems and Defect Detection
- Ion-surface interactions and analysis
Which keywords describe Zhihong Mai's research?
The keywords of their largest research topics: Failure Analysis, Integrated Circuits, Atomic Layer Deposition, High-k Dielectrics, Atomic Force Microscopy, Force Spectroscopy, Chemical Mechanical Planarization and Material Removal Mechanism.
- Surface Analysis
- Machine Vision
- X-ray Photoelectron Spectroscopy
- Photonic Nanojets
- Material Removal Mechanism
- Force Spectroscopy
- High-k Dielectrics
- Integrated Circuits
- Failure Analysis
- Atomic Layer Deposition
- Atomic Force Microscopy
- Chemical Mechanical Planarization
- Near-Field Optical Microscopy
- Scanning Electron Microscopy
- Fabric Defect Detection
- Ion Beam
Size is their works in the topics tagged with each word, from their 8 largest topics. Each links to the topic it comes from most.
All 16 words, with their numbers
- Failure Analysis601 topic
- Integrated Circuits601 topic
- Atomic Layer Deposition331 topic
- High-k Dielectrics331 topic
- Atomic Force Microscopy171 topic
- Force Spectroscopy171 topic
- Chemical Mechanical Planarization151 topic
- Material Removal Mechanism151 topic
- Near-Field Optical Microscopy151 topic
- Photonic Nanojets151 topic
- Scanning Electron Microscopy141 topic
- X-ray Photoelectron Spectroscopy141 topic
- Fabric Defect Detection131 topic
- Machine Vision131 topic
- Ion Beam101 topic
- Surface Analysis101 topic
Where does Zhihong Mai work?
Zhihong Mai's main affiliation in the publication record is GlobalFoundries (Singapore), Singapore.
How many publications and citations does Zhihong Mai have?
OpenAlex counts 123 works and 1,095 citations for Zhihong Mai, an h-index of 16, ranking #5,208,896 of 7,710,434 researchers worldwide on the quality score.
Ranked on field-normalised excellence (50%), output (30%) and citations (20%). Counts come from OpenAlex author records, which occasionally merge different people who share a name or split one person into several.
Papers, co-authors, who cited this work and researchers on the nearest topics have tabs of their own, above. Is this your page? Claim it with your ORCID iD, or request a correction or removal.
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