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Topic · Radiation Effects in Electronics

Most cited papers in Radiation Effects in Electronics

Radiation Effects in Electronics

What are the most cited papers in Radiation Effects in Electronics?

The most cited paper in Radiation Effects in Electronics is "Graphene transistors" (Frank Schwierz, 2010), with 5,257 citations. Next come "FastJet user manual" (5,133) and "P4" (2,889).

Showing 50 of 99 papers. Every paper with more than 495 citations is listed.

Most cited papers, sortable by citations and release date
#Paper
1 Graphene transistors Frank Schwierz · Nature Nanotechnology 30 May 2010 5,257
2 FastJet user manual Matteo Cacciari, Gavin P. Salam, Gregory Soyez · The European Physical Journal C Open access Mar 2012 5,133
3 P4 Pat Bosshart, Dan Daly, Glen Gibb et al. · ACM SIGCOMM Computer Communication Review 28 Jul 2014 2,889
4 Symbolic model checking Emma L. Clarke, K. McMillan, Sérgio Campos et al. · Lecture notes in computer science Conference paper 1996 2,856
5 Range and stopping-power tables for heavy ions L. C. Northcliffe, Roland Schilling · Atomic Data and Nuclear Data Tables 1970 2,741
6 Valgrind Nicholas Nethercote, Julian Seward Conference paper 10 Jun 2007 2,261
7 Symbolic Boolean manipulation with ordered binary-decision diagrams Randal E. Bryant · ACM Computing Surveys Sep 1992 2,030
8 System structure for software fault tolerance Brian Randell · ACM SIGPLAN Notices Open access Apr 1975 1,526
9 Radiation-induced soft errors in advanced semiconductor technologies R. Baumann · IEEE Transactions on Device and Materials Reliability Sep 2005 1,466
10 Modeling the effect of technology trends on the soft error rate of combinational logic Premkishore Shivakumar, Michael Kistler, Stephen W. Keckler et al. Conference paper 25 Jun 2003 1,452
11 To Err is Human Aaron B. Brown, David A. Patterson 2001 1,397
12 Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation Shekhar Y. Borkar · IEEE Micro Nov 2005 1,332
13 An investigation of the Therac-25 accidents Nancy G. Leveson, Clark Savage Turner · Computer Open access Jul 1993 1,248
14 Model checking and abstraction Edmund M. Clarke, Orna Grümberg, David E. Long · ACM Transactions on Programming Languages and Systems Open access Sep 1994 1,224
15 Upset hardened memory design for submicron CMOS technology T. Calin, M. Nicolaidis, Raoul Velazco · IEEE Transactions on Nuclear Science Dec 1996 1,169
16 Basic mechanisms and modeling of single-event upset in digital microelectronics P.E. Dodd, Lloyd W. Massengill · IEEE Transactions on Nuclear Science Jun 2003 1,158
17 Selecting Software Test Data Using Data Flow Information S. Rapps, Elaine J. Weyuker · IEEE Transactions on Software Engineering Apr 1985 1,080
18 Razor: a low-power pipeline based on circuit-level timing speculation Dan Ernst, Nam Sung Kim, Shidhartha Das et al. 3 Dec 2003 1,078
19 Graphene segregated on Ni surfaces and transferred to insulators Yu, Qingkai, Lian, Jie, Siriponglert, Sujitra et al. · Purdue e-Pubs (Purdue University System) 2008 1,069
20 A Survey of Techniques for Approximate Computing Sparsh Mittal · ACM Computing Surveys Open access 18 Mar 2016 1,062
21 Measuring the Gap Between FPGAs and ASICs Ian Kuon, Jonathan Rose · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 23 Jan 2007 1,014
22 Counterexample-guided abstraction refinement for symbolic model checking Edmund M. Clarke, Orna Grümberg, Somesh Jha et al. · Journal of the ACM Sep 2003 997
23 Radiation-Induced Soft Errors in Advanced Semiconductor Technologies Robert Baumann · IEEE Transactions on Device and Materials Reliability 2005 975
24 Automated software test data generation Bogdan Korel · IEEE Transactions on Software Engineering Aug 1990 975
25 The future of microprocessors Shekhar Y. Borkar, Andrew A. Chien · Communications of the ACM 26 Apr 2011 975
26 Total ionizing dose effects in MOS oxides and devices Timothy R. Oldham, F. B. McLean · IEEE Transactions on Nuclear Science Open access Jun 2003 969
27 Molecular Electronics with Carbon Nanotubes Phaedon Avouris · Accounts of Chemical Research 31 Jul 2002 969
28 Radiation Effects in MOS Oxides James R. Schwank, Marty R. Shaneyfelt, Daniel M. Fleetwood et al. · IEEE Transactions on Nuclear Science Aug 2008 968
29 Learning from mistakes Shan Lu, Soyeon Park, Eunsoo Seo et al. Conference paper Mar 2008 894
30 Dynamic thermal management for high-performance microprocessors David M. Brooks, Margaret Martonosi Conference paper 13 Nov 2002 894
31 A Defect-Tolerant Computer Architecture: Opportunities for Nanotechnology James R. Heath, Philip J. Kuekes, Gregory S. Snider et al. · Science 12 Jun 1998 894
32 Fault injection techniques and tools Mei-Chen Hsueh, Timothy K. Tsai, Ravishankar K. Iyer · Computer Open access Apr 1997 881
33 Alpha-particle-induced soft errors in dynamic memories T.C. May, Murray H. Woods · IEEE Transactions on Electron Devices 1979 858
34 Razor: a low-power pipeline based on circuit-level timing speculation Daniel J. Ernst, Nam Sung Kim, Shidhartha Das et al. Conference paper 2003 857
35 Soft Errors in Advanced Computer Systems R. Baumann · IEEE Design & Test of Computers May 2005 834
36 A systematic methodology to compute the architectural vulnerability factors for a high performance microprocessor Shubhendu S. Mukherjee, Christopher T. Weaver, Joel Emer et al. 2003 834
37 Toward Clean and Crackless Transfer of Graphene Xuelei Liang, Brent A. Sperling, Irene Calizo et al. · ACS Nano 16 Oct 2011 822
38 Model checking JAVA programs using JAVA PathFinder Klaus Havelund, Thomas Pressburger · International Journal on Software Tools for Technology Transfer Open access Mar 2000 802
39 Dynamic fault-tree models for fault-tolerant computer systems J.B. Dugan, Salvatore J. Bavuso, Mark Alastair Boyd · IEEE Transactions on Reliability 1992 767
40 A Compact SPICE Model for Carbon-Nanotube Field-Effect Transistors Including Nonidealities and Its Application—Part II: Full Device Model and Circuit Performance Benchmarking Jie Deng, H.‐S. Philip Wong · IEEE Transactions on Electron Devices 2007 748
41 Drowsy caches Krisztián Flautner, Nam Sung Kim, Steve J. Martin et al. · ACM SIGARCH Computer Architecture News May 2002 740
42 The Sorcerer's Apprentice Guide to Fault Attacks Hagai Bar-El, Hamid Choukri, David Naccache et al. · Proceedings of the IEEE Feb 2006 734
43 Checking Safety Properties Using Induction and a SAT-Solver Mary Sheeran, Satnam Singh, Gunnar Stålmarck · Lecture notes in computer science Conference paper 2000 724
44 SWIFT: Software Implemented Fault Tolerance George A. Reis, Jonathan Chang, Neil Vachharajani et al. Conference paper 31 Mar 2005 715
45 STIMULATED EMISSION OF RADIATION FROM GaAs p-n JUNCTIONS Marshall I. Nathan, William P. Dumke, Gerald T. Burns et al. · Applied Physics Letters Nov 1962 713
46 Valgrind Nicholas Nethercote, Julian Seward · ACM SIGPLAN Notices 10 Jun 2007 710
47 Total-Ionizing-Dose Effects in Modern CMOS Technologies Hugh Barnaby · IEEE Transactions on Nuclear Science Dec 2006 708
48 Symbolic model checking using SAT procedures instead of BDDs Armin Biere, Alessandro Cimatti, E. M. Clarke et al. Conference paper Jun 1999 701
49 Towards secure and dependable software-defined networks Diego Kreutz, Fernando M. V. Ramos, Paulo Verı́ssimo Conference paperOpen access 16 Aug 2013 698
50 Modern microprocessor built from complementary carbon nanotube transistors Gage Hills, C.L. Lau, Andrew Wright et al. · Nature 28 Aug 2019 695

Citations are OpenAlex's own counts, from its 2026-09-23 snapshot, so the ranking can differ from Google Scholar or Web of Science. A paper is listed for a field when OpenAlex files it under one of the field's topics; retracted papers and papers whose citation count cannot be traced to citing works are left out, and a preprint and the article it became are shown once. Release dates are OpenAlex's: where a source gave only a month or a year, that is what is shown. How the lists are chosen.