Radiation Effects in Electronics

Radiation Effects in Electronics is a research topic within Electrical and Electronic Engineering. Science Explorer counts 24k research works in it since 1950. 9.9% of them reached the world's top 10% most cited for their field and year.

This cluster of papers focuses on the challenges and techniques for fault tolerance in electronic systems, particularly in the context of soft errors, radiation effects, and single event upsets in CMOS technology. It explores various methods for error detection, reliability evaluation, and mitigation of transient faults in nanoelectronics.

• Soft Errors
• Radiation Effects
• Error Detection
• Fault Tolerance
• CMOS Technology
• Single Event Upsets
• Reliability Evaluation
• Nanoelectronics
• Transient Faults
• Dependability